Patents by Inventor Kathleen Susan Krisch

Kathleen Susan Krisch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detecting defects in integrated circuits
    Patent number: 6043662
    Abstract: The breakdown of an ultra-thin dielectric layer is detected by applying a test signal to the layer. Measurements are taken of noise signals present in the layer during the application of the test signal. At breakdown, a significant increase occurs in the amplitude of the measured noise signals. Similarly, fluctuations in quiescent current, I.sub.DDQ, (I.sub.DDQ noise signals), rather than the values of I.sub.DDQ, are utilized during testing as the basis for detecting defects in integrated circuits.
    Type: Grant
    Filed: January 2, 1998
    Date of Patent: March 28, 2000
    Inventors: Glenn Baldwin Alers, Kathleen Susan Krisch, Bonnie Elaine Weir
  • Detecting breakdown in dielectric layers
    Patent number: 5804975
    Abstract: The breakdown of an ultra-thin dielectric layer is detected by applying a test signal to the layer. Measurements are taken of noise signals present in the layer during the application of the test signal. At breakdown, a significant increase occurs in the amplitude of the measured noise signals.
    Type: Grant
    Filed: September 18, 1996
    Date of Patent: September 8, 1998
    Assignee: Lucent Technologies Inc.
    Inventors: Glenn Baldwin Alers, Kathleen Susan Krisch, Bonnie Elaine Weir