Patents by Inventor Kathryn A. Engholm
Kathryn A. Engholm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10459008Abstract: A method is disclosed for triggering upon signal events occurring in frequency domain signals. The method includes repeatedly sampling a time-varying signal and generating a plurality of digital frequency domain spectrums based on the samples of the time-varying signal. A frequency domain bitmap for the time-varying signal is repeatedly updated via application of the digital frequency domain spectrums. The method further includes selecting a portion of the frequency domain bitmap, determining a signal occupancy in the selected portion, and triggering a capture of the time-varying signal based on and in response to the occupancy determination for the selected portion of the bitmap.Type: GrantFiled: October 14, 2014Date of Patent: October 29, 2019Assignee: Tektronix, Inc.Inventors: Robert E. Tracy, Kathryn A. Engholm, Alfred K. Hillman, Jr.
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Patent number: 9784765Abstract: A system and method are provided for graphically actuating a trigger in a test and measurement device. The method includes displaying a visual representation of signal properties for one or more time-varying signals. A graphical user input is received, in which a portion of the visual representation is designated. The method further includes configuring a trigger of the test and measurement device in response to the graphical user input, by setting a value for a trigger parameter of the trigger. The set value for the trigger parameters varies with and is dependent upon the particular portion of the visual representation that is designated by the graphical user input. The trigger is then employed in connection with subsequent monitoring of signals within the test and measurement device.Type: GrantFiled: November 3, 2009Date of Patent: October 10, 2017Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Cecilia A. Case
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Patent number: 9164131Abstract: A test and measurement instrument processes digital data that represents an input signal to produce a target image, and then uses a computer vision technique to recognize a signal depicted within the target image. In some embodiments, the location of the signal within the target image is identified on a display device. In other embodiments, the location of the signal within the target image is used to perform a measurement. In other embodiments, when the signal is recognized, a trigger signal is generated that causes digital data that represents the input signal to be stored in a memory.Type: GrantFiled: May 13, 2010Date of Patent: October 20, 2015Assignee: Tektronix, Inc.Inventors: John F. Turpin, Kathryn A. Engholm
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Patent number: 9157943Abstract: A test and measurement instrument including a plurality of input ports; an acquisition system coupled to the input ports and configured to acquire frequency domain data from the input ports; a user interface configured to present frequency domain controls for at least two of the input ports; and a controller configured to adjust frequency domain acquisition parameters of the acquisition system in response to the frequency domain controls such that frequency domain acquisition parameters associated with a first input port can be different from frequency domain acquisition parameters associated with a second input port.Type: GrantFiled: August 13, 2010Date of Patent: October 13, 2015Assignee: Tektronix, Inc.Inventors: Kenneth P. Dobyns, Kathryn A. Engholm, Amy M. Bergsieker, Steven C. Herring, Gary J. Waldo
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Publication number: 20150066410Abstract: A method is disclosed for triggering upon signal events occurring in frequency domain signals. The method includes repeatedly sampling a time-varying signal and generating a plurality of digital frequency domain spectrums based on the samples of the time-varying signal. A frequency domain bitmap for the time-varying signal is repeatedly updated via application of the digital frequency domain spectrums. The method further includes selecting a portion of the frequency domain bitmap, determining a signal occupancy in the selected portion, and triggering a capture of the time-varying signal based on and in response to the occupancy determination for the selected portion of the bitmap.Type: ApplicationFiled: October 14, 2014Publication date: March 5, 2015Inventors: Robert E. Tracy, Kathryn A. Engholm, Alfred K. Hillman, JR.
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Patent number: 8890507Abstract: A method of measuring the phase transient response of a device under test automatically provides a flattened phase transient response without any user intervention. The method comprises the steps of calculating an instantaneous phase waveform based on an instantaneous voltage waveform that represents an output signal of the device under test as it steps from a first frequency to a second frequency, calculating an instantaneous frequency waveform based on the instantaneous phase waveform, automatically estimating the second frequency based on the instantaneous frequency waveform without any user intervention, and flattening the instantaneous phase waveform based on the estimate of the second frequency.Type: GrantFiled: May 19, 2010Date of Patent: November 18, 2014Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Soraya J. Matos, Shigetsune Torin
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Patent number: 8880369Abstract: A method is disclosed for triggering upon signal events occurring in frequency domain signals. The method includes repeatedly sampling a time-varying signal and generating a plurality of digital frequency domain spectrums based on the samples of the time-varying signal. A frequency domain bitmap for the time-varying signal is repeatedly updated via application of the digital frequency domain spectrums. The method further includes selecting a portion of the frequency domain bitmap, determining a signal occupancy in the selected portion, and triggering a capture of the time-varying signal based on and in response to the occupancy determination for the selected portion of the bitmap.Type: GrantFiled: October 2, 2009Date of Patent: November 4, 2014Assignee: Tektronix, Inc.Inventors: Robert E. Tracy, Kathryn A. Engholm, Alfred K. Hillman, Jr.
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Patent number: 8706435Abstract: A test and measurement instrument converts digital data that represents an input signal into a plurality of bitmaps, and then subtracts one of the bitmaps from another one of the bitmaps to produce a difference bitmap. The difference bitmap does not contain density values that are common to the two bitmaps, but instead only contains the density differences between the two, thereby revealing very small density variations in the presence of large density values. In some embodiments, the difference bitmap is displayed on a display device. In other embodiments, the difference bitmap is used to generate a trigger signal.Type: GrantFiled: May 28, 2010Date of Patent: April 22, 2014Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, John F. Turpin
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Patent number: 8705598Abstract: A test and measurement instrument includes an input for receiving an input test signal and a separator that separates a data array of the input test signal into a number of different data bins. Each data bin includes a number of data points. A selector is included that determines whether the data points within a present bin of the total bins represent signal or noise. When the present bin contains noise, a processor generates a first output for the present bin. Instead, when the present bin contains signal, the processor generates a second output for the present bin. The bin outputs can then be combined to make an output array, such as a waveform display, for the instrument.Type: GrantFiled: December 15, 2011Date of Patent: April 22, 2014Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Marcus K. Da Silva
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Patent number: 8649989Abstract: Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement instrument can include input terminals to receive RF signals, an ADC to digitize the RF signals, a digital downconverter to produce I and Q baseband component information, and a power detector to determine a power level using the I and Q information. A comparator compares the power level received from the power detector with a user-definable power threshold, and produces a logic signal for enabling one or more phase or frequency demodulators. The one or more demodulators produce IQ-based time-domain traces derived from the I and Q component information when the power level determined by the power detector exceeds the power threshold. Trigger circuitry is configured to trigger on an event responsive to a delayed trigger enable signal.Type: GrantFiled: August 13, 2010Date of Patent: February 11, 2014Assignee: Tektronix, Inc.Inventors: Alfred K. Hillman, Jr., Marcus K. Da Silva, Kathryn A. Engholm, Kenneth P. Dobyns
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Patent number: 8615382Abstract: A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.Type: GrantFiled: January 27, 2011Date of Patent: December 24, 2013Assignee: Tektronix, Inc.Inventors: Kenneth P. Dobyns, Kathryn A. Engholm, Amy M. Bergsieker, Steven C. Herring, Gary J. Waldo
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Patent number: 8489350Abstract: An RF test and measurement device, including a front end for receiving a time-varying signal and a real-time engine for generating digital frequency domain spectrums based on the time-varying signal. The device also includes a memory subsystem containing a frequency domain bitmap which is updated through sequential receipt and storage of the digital frequency domain spectrums. The real time engine is further configured to monitor the frequency domain bitmap for occurrence of a signal characteristic, and in response to detection of the signal characteristic, cause a capture of the time-varying signal into a storage location of the RF test and measurement device.Type: GrantFiled: September 28, 2009Date of Patent: July 16, 2013Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Edward C. Gee, Alfred K. Hillman, Jr., David Eby
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Publication number: 20130156082Abstract: A test and measurement instrument includes an input for receiving an input test signal and a separator that separates a data array of the input test signal into a number of different data bins. Each data bin includes a number of data points. A selector is included that determines whether the data points within a present bin of the total bins represent signal or noise. When the present bin contains noise, a processor generates a first output for the present bin. Instead, when the present bin contains signal, the processor generates a second output for the present bin. The bin outputs can then be combined to make an output array, such as a waveform display, for the instrument.Type: ApplicationFiled: December 15, 2011Publication date: June 20, 2013Applicant: TEKTRONIX, INC.Inventors: Kathryn A. Engholm, MARCUS K. DA SILVA
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Patent number: 8452559Abstract: A “density trace” according to an embodiment of the present invention is formed by measuring the density of each column of a frequency domain bitmap above a user-specified “amplitude threshold.” The density of each column equals the sum of the densities of all of the pixels in the column that are above the amplitude threshold divided by the sum of the densities of all of the pixels in the column. A density trace provides a convenient way to define and represent the occupancy for a large number of columns, and also allows density data to be quickly transmitted from one instrument or computer to another. In some embodiments, a density trace is incorporated into a trigger detector of a test and measurement instrument and used to generate a trigger signal. The trigger detector compares the density trace to a user-specified “density threshold” and generates the trigger signal when the value of any point of the density trace violates the density threshold.Type: GrantFiled: May 12, 2010Date of Patent: May 28, 2013Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Alfred K. Hillman, Jr., John F. Turpin, David H. Eby
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Patent number: 8249386Abstract: A method and apparatus for improved video bandwidth resolution in DFT-based spectrum analysis is disclosed. A first embodiment comprises an emulation of a continuous range of video bandwidths in DFT-based spectrum analysis using overlapping resolution bandwidth frames. A second embodiment utilizes frame weighting to reduce the standard deviation in the spectrum of noise signal to emulate a corresponding standard deviation of a specified video bandwidth.Type: GrantFiled: March 28, 2008Date of Patent: August 21, 2012Assignee: Tektronix, Inc.Inventors: Yi He, Marcus K. Dasilva, Kathryn A. Engholm
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Publication number: 20120197598Abstract: A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.Type: ApplicationFiled: January 27, 2011Publication date: August 2, 2012Applicant: TEKTRONIX, INC.Inventors: Kenneth P. DOBYNS, Kathryn A. ENGHOLM, Amy M. BERGSIEKER, Steven C. HERRING, Gary J. WALDO
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Patent number: 8184121Abstract: Embodiments of the present invention comprise methods, systems, and apparatus for multi-domain markers.Type: GrantFiled: November 3, 2006Date of Patent: May 22, 2012Assignee: Tektronix, Inc.Inventors: Kathryn A. Engholm, Craig D. Bryant
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Publication number: 20120041701Abstract: Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement instrument can include input terminals to receive RF signals, an ADC to digitize the RF signals, a digital downconverter to produce I and Q baseband component information, and a power detector to determine a power level using the I and Q information. A comparator compares the power level received from the power detector with a user-definable power threshold, and produces a logic signal for enabling one or more phase or frequency demodulators. The one or more demodulators produce IQ-based time-domain traces derived from the I and Q component information when the power level determined by the power detector exceeds the power threshold. Trigger circuitry is configured to trigger on an event responsive to a delayed trigger enable signal.Type: ApplicationFiled: August 13, 2010Publication date: February 16, 2012Applicant: TEKTRONIX, INC.Inventors: Alfred K. HILLMAN, JR., Marcus K. DA SILVA, Kathryn A.. ENGHOLM, Kenneth P. DOBYNS
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Publication number: 20120036947Abstract: A test and measurement instrument including a plurality of input ports; an acquisition system coupled to the input ports and configured to acquire frequency domain data from the input ports; a user interface configured to present frequency domain controls for at least two of the input ports; and a controller configured to adjust frequency domain acquisition parameters of the acquisition system in response to the frequency domain controls such that frequency domain acquisition parameters associated with a first input port can be different from frequency domain acquisition parameters associated with a second input port.Type: ApplicationFiled: August 13, 2010Publication date: February 16, 2012Applicant: Tektronix, Inc.Inventors: Kenneth P. DOBYNS, Kathryn A. ENGHOLM, Amy M. BERGSIEKER, Steven C. HERRING, Gary J. WALDO
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Publication number: 20110285381Abstract: A method of measuring the phase transient response of a device under test automatically provides a flattened phase transient response without any user intervention. The method comprises the steps of calculating an instantaneous phase waveform based on an instantaneous voltage waveform that represents an output signal of the device under test as it steps from a first frequency to a second frequency, calculating an instantaneous frequency waveform based on the instantaneous phase waveform, automatically estimating the second frequency based on the instantaneous frequency waveform without any user intervention, and flattening the instantaneous phase waveform based on the estimate of the second frequency.Type: ApplicationFiled: May 19, 2010Publication date: November 24, 2011Applicant: TEKTRONIX, INCInventors: KATHRYN A. ENGHOLM, SORAYA J. MATOS, SHIGETSUNE TORIN