Patents by Inventor Kathryn Brenda Bean

Kathryn Brenda Bean has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for classifying images of an imprinted film
    Patent number: 11164302
    Abstract: Systems and processes for analyzing an image. Analyzing the image may comprise selecting a computer vision parameter for an image feature identification process. The image feature identification process may identify at least one feature in the image when using the computer vision parameter. Analyzing the image may further comprise segmenting the image into a region of interest T and a background region B. Analyzing the image may further comprise calculating a set of statistical values about the region of interest T of the image. Analyzing the image may further comprise classifying the image based on both the computer vision parameter and the set of statistical values as one of either: a defect containing image or a defect free image.
    Type: Grant
    Filed: August 8, 2019
    Date of Patent: November 2, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Kathryn Brenda Bean, Teresa Perez Estrada, Edward Brian Fletcher, Mehul N. Patel
  • SYSTEMS AND METHODS FOR CLASSIFYING IMAGES OF AN IMPRINTED FILM
    Publication number: 20210042906
    Abstract: Systems and processes for analyzing an image. Analyzing the image may comprise selecting a computer vision parameter for an image feature identification process. The image feature identification process may identify at least one feature in the image when using the computer vision parameter. Analyzing the image may further comprise segmenting the image into a region of interest T and a background region B. Analyzing the image may further comprise calculating a set of statistical values about the region of interest T of the image. Analyzing the image may further comprise classifying the image based on both the computer vision parameter and the set of statistical values as one of either: a defect containing image or a defect free image.
    Type: Application
    Filed: August 8, 2019
    Publication date: February 11, 2021
    Inventors: Kathryn Brenda Bean, Teresa Perez Estrada, Edward Brian Fletcher, Mehul N. Patel
  • Automatic defect analyzer for nanoimprint lithography using image analysis
    Patent number: 10901327
    Abstract: A plurality of images of a plurality of fields is acquired using an image sensor under varying conditions associated with a defect. Defect pixels in a test image in the plurality of images are identified using a standard image to provide a defect tolerance level. The standard image has no defects. Clustering analysis is performed on the identified defect pixels based on the defect tolerance level to obtain defect clusters. A process window is generated based on the defect clusters. An imprint process is created according to the process window.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: January 26, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Kathryn Brenda Bean, Teresa Perez Estrada
  • AUTOMATIC DEFECT ANALYZER FOR NANOIMPRINT LITHOGRAPHY USING IMAGE ANALYSIS
    Publication number: 20200201190
    Abstract: A plurality of images of a plurality of fields is acquired using an image sensor under varying conditions associated with a defect. Defect pixels in a test image in the plurality of images are identified using a standard image to provide a defect tolerance level. The standard image has no defects. Clustering analysis is performed on the identified defect pixels based on the defect tolerance level to obtain defect clusters. A process window is generated based on the defect clusters. An imprint process is created according to the process window.
    Type: Application
    Filed: December 20, 2018
    Publication date: June 25, 2020
    Inventors: Kathryn Brenda Bean, Teresa Perez Estrada