Patents by Inventor Katie LISZEWSKI
Katie LISZEWSKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250124285Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: ApplicationFiled: December 20, 2024Publication date: April 17, 2025Applicant: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
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Publication number: 20250086751Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.Type: ApplicationFiled: November 21, 2024Publication date: March 13, 2025Applicant: Battelle Memorial InstituteInventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
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Patent number: 12217170Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: GrantFiled: March 29, 2021Date of Patent: February 4, 2025Assignee: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
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Patent number: 12154249Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.Type: GrantFiled: August 30, 2023Date of Patent: November 26, 2024Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
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Publication number: 20240062330Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.Type: ApplicationFiled: August 30, 2023Publication date: February 22, 2024Applicant: Battelle Memorial InstituteInventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
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Patent number: 11756157Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.Type: GrantFiled: March 29, 2021Date of Patent: September 12, 2023Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
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Patent number: 11315840Abstract: An assembly for monitoring a semiconductor device under test comprising a mill configured to mill the device, a sensor configured to measure an electrical characteristic of the device, and a computer configured to determine the amount of strain in the device from the electrical characteristic when the mill is milling the device and detect an endpoint of milling at a circuit within the device. In use the endpoints of the milling process of the semiconductor device are detected measuring an electrical characteristic of the device with a sensor during milling determining the amount of strain in the device from the electrical characteristic and detecting an endpoint of the milling process within the device based on the amount of strain.Type: GrantFiled: May 22, 2020Date of Patent: April 26, 2022Assignee: Battelle Memorial InstituteInventors: Jeremiah J. Schley, Thomas Kent, Katie Liszewski, Isaac Goldthwaite
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Publication number: 20220020114Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.Type: ApplicationFiled: March 29, 2021Publication date: January 20, 2022Applicant: Battelle Memorial InstituteInventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
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Publication number: 20210304002Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.Type: ApplicationFiled: March 29, 2021Publication date: September 30, 2021Applicant: Battelle Memorial InstituteInventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
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Publication number: 20200373211Abstract: An assembly for monitoring a semiconductor device under test comprising a mill configured to mill the device, a sensor configured to measure an electrical characteristic of the device, and a computer configured to determine the amount of strain in the device from the electrical characteristic when the mill is milling the device and detect an endpoint of milling at a circuit within the device. In use the endpoints of the milling process of the semiconductor device are detected measuring an electrical characteristic of the device with a sensor during milling determining the amount of strain in the device from the electrical characteristic and detecting an endpoint of the milling process within the device based on the amount of strain.Type: ApplicationFiled: May 22, 2020Publication date: November 26, 2020Inventors: Jeremiah J. SCHLEY, Thomas KENT, Katie LISZEWSKI, Isaac GOLDTHWAITE