Patents by Inventor Katie LISZEWSKI

Katie LISZEWSKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11315840
    Abstract: An assembly for monitoring a semiconductor device under test comprising a mill configured to mill the device, a sensor configured to measure an electrical characteristic of the device, and a computer configured to determine the amount of strain in the device from the electrical characteristic when the mill is milling the device and detect an endpoint of milling at a circuit within the device. In use the endpoints of the milling process of the semiconductor device are detected measuring an electrical characteristic of the device with a sensor during milling determining the amount of strain in the device from the electrical characteristic and detecting an endpoint of the milling process within the device based on the amount of strain.
    Type: Grant
    Filed: May 22, 2020
    Date of Patent: April 26, 2022
    Assignee: Battelle Memorial Institute
    Inventors: Jeremiah J. Schley, Thomas Kent, Katie Liszewski, Isaac Goldthwaite
  • Publication number: 20220020114
    Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.
    Type: Application
    Filed: March 29, 2021
    Publication date: January 20, 2022
    Applicant: Battelle Memorial Institute
    Inventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
  • Publication number: 20210304002
    Abstract: A method implemented by a software for a multimodal evaluation engine stored on a memory is provided herein. The software is executable by a processor coupled to the memory to cause the method. The method includes receiving multimodal signatures of an object of interest from inspection elements and processing the multimodal signatures to transform the multimodal signatures into formats. The method also includes generating data representations of the formats and detecting whether anomalies are present within the object of interest based on the data representations.
    Type: Application
    Filed: March 29, 2021
    Publication date: September 30, 2021
    Applicant: Battelle Memorial Institute
    Inventors: Anthony George, Nicholas Darby, Jeremy Bellay, David Collins, Katie Liszewski, Amir Rahimi
  • Publication number: 20200373211
    Abstract: An assembly for monitoring a semiconductor device under test comprising a mill configured to mill the device, a sensor configured to measure an electrical characteristic of the device, and a computer configured to determine the amount of strain in the device from the electrical characteristic when the mill is milling the device and detect an endpoint of milling at a circuit within the device. In use the endpoints of the milling process of the semiconductor device are detected measuring an electrical characteristic of the device with a sensor during milling determining the amount of strain in the device from the electrical characteristic and detecting an endpoint of the milling process within the device based on the amount of strain.
    Type: Application
    Filed: May 22, 2020
    Publication date: November 26, 2020
    Inventors: Jeremiah J. SCHLEY, Thomas KENT, Katie LISZEWSKI, Isaac GOLDTHWAITE