Patents by Inventor Katsuhide Uchida

Katsuhide Uchida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Oxygen partial pressure control apparatuses and methods of using solid electrolytes for oxygen partial pressure control
    Patent number: 8097138
    Abstract: The present invention provides oxygen partial pressure control apparatuses that can control the partial pressure of oxygen in atmospheric gases in processing apparatuses or the like to within the range of 0.2 to 10?30 atm, while maintaining low material and operational cost conditions.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: January 17, 2012
    Assignee: National Institute of Agrobiological Sciences
    Inventors: Naoki Shirakawa, Shinichi Ikeda, Katsuhide Uchida
  • Oxygen Partial Pressure Control Apparatuses and Methods of Using Solid Electrolytes for Oxygen Partial Pressure Control
    Publication number: 20080217187
    Abstract: The present invention provides oxygen partial pressure control apparatuses that can control the partial pressure of oxygen in atmospheric gases in processing apparatuses or the like to within the range of 0.2 to 10?30 atm, while maintaining low material and operational cost conditions.
    Type: Application
    Filed: May 19, 2005
    Publication date: September 11, 2008
    Applicants: National Institute of Advanced Industrial Science and Technology, STLAB, Incorporated
    Inventors: Naoki Shirakawa, Shinichi Ikeda, Katsuhide Uchida
  • Method of analyzing gas using quartz oscillator and apparatus therefor
    Patent number: 6977506
    Abstract: A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.
    Type: Grant
    Filed: September 9, 2003
    Date of Patent: December 20, 2005
    Assignees: National Institute of Advanced Industrial Science and Technology, Gastec Corporation
    Inventors: Kazutoshi Noda, Ryuichi Naganawa, Kunitoshi Matsunobu, Katsuhide Uchida, Kouta Kobayashi
  • Method of analyzing gas using quartz oscillator and apparatus therefor
    Publication number: 20040051535
    Abstract: A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.
    Type: Application
    Filed: September 9, 2003
    Publication date: March 18, 2004
    Applicants: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, GASTEC CORPORATION
    Inventors: Kazutoshi Noda, Ryuichi Naganawa, Kunitoshi Matsunobu, Katsuhide Uchida, Kouta Kobayashi