Patents by Inventor Katsuhiko KYUHKEN

Katsuhiko KYUHKEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11988634
    Abstract: An ion generation apparatus according to the present invention includes an electron emission device, an opposite electrode, and a controller, the electron emission device includes a lower electrode, a surface electrode, and an intermediate layer provided between the lower electrode and the surface electrode, the opposite electrode is provided to be opposite to the surface electrode, and the controller is provided to apply a voltage to the surface electrode, the lower electrode, or the opposite electrode such that a potential of the surface electrode becomes higher than a potential of the lower electrode and a potential of the opposite electrode in a positive ion mode.
    Type: Grant
    Filed: November 29, 2021
    Date of Patent: May 21, 2024
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Shohei Komaru, Katsuhiko Kyuhken, Kohji Shinkawa, Tadashi Iwamatsu
  • Publication number: 20230273154
    Abstract: The present disclosure provides an IMS analyzer including an analysis chamber, an electron emitter, an ion detector, a first gas injector that injects a sample gas into the analysis chamber, a second gas injector that injects a drift gas into the analysis chamber, a third gas injector that injects a primary ion generating gas into the analysis chamber, and an outlet port, in which the first gas injector, the second gas injector, the third gas injector, and the outlet port are arranged such that the sample gas merges with the drift gas and the primary ion generating gas in a reaction area and is discharged through the outlet port, the ion detector is located on an upperstream side of the drift gas stream relative to the reaction area, and the electron emitter is located on an upperstream side of the primary ion generating gas stream relative to the reaction area.
    Type: Application
    Filed: February 20, 2023
    Publication date: August 31, 2023
    Inventors: Shohei KOMARU, Tadashi IWAMATSU, Masamitsu MORITANI, Katsuhiko KYUHKEN, Shunsuke MATSUO
  • Patent number: 11587777
    Abstract: An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.
    Type: Grant
    Filed: April 8, 2021
    Date of Patent: February 21, 2023
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Masamitsu Moritani, Katsuhiko Kyuhken, Shohei Komaru, Tadashi Iwamatsu, Satoshi Morimoto
  • Publication number: 20220178876
    Abstract: An ion generation apparatus according to the present invention includes an electron emission device, an opposite electrode, and a controller, the electron emission device includes a lower electrode, a surface electrode, and an intermediate layer provided between the lower electrode and the surface electrode, the opposite electrode is provided to be opposite to the surface electrode, and the controller is provided to apply a voltage to the surface electrode, the lower electrode, or the opposite electrode such that a potential of the surface electrode becomes higher than a potential of the lower electrode and a potential of the opposite electrode in a positive ion mode.
    Type: Application
    Filed: November 29, 2021
    Publication date: June 9, 2022
    Inventors: SHOHEI KOMARU, Katsuhiko KYUHKEN, KOHJI SHINKAWA, TADASHI IWAMATSU
  • Publication number: 20210335590
    Abstract: An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.
    Type: Application
    Filed: April 8, 2021
    Publication date: October 28, 2021
    Inventors: Masamitsu MORITANI, Katsuhiko KYUHKEN, SHOHEI KOMARU, TADASHI IWAMATSU, Satoshi MORIMOTO