Patents by Inventor Katsuhiro Ochiai

Katsuhiro Ochiai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11455203
    Abstract: A system analysis support device includes a data acquisition part that obtains time series data (items) measured in a system that is to be analyzed, an overall abnormality degree calculation part that calculates transition of abnormality degree representing overall abnormality degree of the system that is to be analyzed, using a predictive model generated so that, with 2 or more time series data (items) as input, values representing a relationship between the 2 or more time series data (items) are outputted, and the time series data (items), and a representative index selection part that selects and presents time series data (items) indicating change similar to transition of the overall abnormality degree of the system that is to be analyzed, from among the time series data (items).
    Type: Grant
    Filed: September 13, 2017
    Date of Patent: September 27, 2022
    Assignee: NEC CORPORATION
    Inventor: Katsuhiro Ochiai
  • Patent number: 11237148
    Abstract: Moisture content information in soil at a specified site is acquired. Moisture content information a ground surface within a given range that includes the specified site is acquired. An amount of runoff or storage volume of water on the ground surface or in a ground at a freely-selected site in the given range is calculated based on the moisture content information in soil and the moisture content information at the ground. A degree of risk of flood disaster at the freely-selected site within the given range is calculated based on the amount of runoff or storage volume of water on the ground surface. A point where there is the risk of flood disaster within the given range is determined and highlighted based on the degree of risk of flood disaster.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: February 1, 2022
    Assignee: NEC CORPORATION
    Inventors: Ryota Mase, Katsuhiro Ochiai
  • Patent number: 11150380
    Abstract: A rainfall amount prediction device includes: a first prediction unit creating a first prediction pattern, and calculating a first total rainfall amount that is the total rainfall amount in the first period according to the first prediction pattern; a second prediction unit determining a second total rainfall amount that is the total rainfall amount in a second period by subtracting the first total rainfall amount from the entire total rainfall amount, and creating, under the limitations of the second total rainfall amount, and a pattern creation unit creating a plurality of rainfall prediction patterns for the entirety of the prediction period by combining, on a time axis, the first prediction pattern and the plurality of second prediction patterns.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: October 19, 2021
    Assignee: NEC CORPORATION
    Inventors: Yuya Yamakawa, Katsuhiro Ochiai
  • Patent number: 11127211
    Abstract: This invention is directed to a plant management system that presents a position to be measured by a sensor that performs measurement for inspection of a plant or the like when the measurement is executed, thereby preventing a measurement error. The plant management system includes a measurement position instructor that, when performing the measurement by the sensor on a work site, instructs the position to be measured by the sensor on a measurement target, and a presenter that, when the measurement is executed, performs presentation of an image representing the position to be measured by the sensor on the work site by superimposing the image on an image of the measurement target or projecting the image onto the measurement target.
    Type: Grant
    Filed: February 20, 2017
    Date of Patent: September 21, 2021
    Assignee: NEC CORPORATION
    Inventor: Katsuhiro Ochiai
  • Publication number: 20200333315
    Abstract: Moisture content information in soil at a specified site is acquired. Moisture content information a ground surface within a given range that includes the specified site is acquired. An amount of runoff or storage volume of water on the ground surface or in a ground at a freely-selected site in the given range is calculated based on the moisture content information in soil and the moisture content information at the ground. A degree of risk of flood disaster at the freely-selected site within the given range is calculated based on the amount of runoff or storage volume of water on the ground surface. A point where there is the risk of flood disaster within the given range is determined and highlighted based on the degree of risk of flood disaster.
    Type: Application
    Filed: July 2, 2020
    Publication date: October 22, 2020
    Applicant: NEC Corporation
    Inventors: Ryota MASE, Katsuhiro Ochiai
  • Patent number: 10788817
    Abstract: Provided is a manufacturing process analysis device (30), comprising: a computation unit (31) which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values (360) and quality values (361) which are measured in time series; a shift time specification unit (32) which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit (33) which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.
    Type: Grant
    Filed: August 2, 2016
    Date of Patent: September 29, 2020
    Assignee: NEC CORPORATION
    Inventors: Takazumi Kawai, Katsuhiro Ochiai
  • Patent number: 10761076
    Abstract: Moisture content information in soil at a specified site, and moisture content information at a ground surface within a given range that includes the specified site, are acquired. A point where there is a risk of natural disaster within the given range is determined and highlighted, based on the moisture content information in soil at the specified site and the moisture content information at the ground surface within the given range.
    Type: Grant
    Filed: May 21, 2019
    Date of Patent: September 1, 2020
    Assignee: NEC CORPORATION
    Inventors: Ryota Mase, Katsuhiro Ochiai
  • Patent number: 10719778
    Abstract: A model learning unit of an anomaly detection device learns a relational expression between vibration strengths at frequencies based on a time series of frequency characteristics of a vibration strength detected during a learning period by a vibration sensor placed on a monitoring target. The anomaly detection unit learns a relational expression between vibration strengths at frequencies based on a time series of frequency characteristics of a vibration strength detected during a new period by the vibration sensor. Then, the anomaly detection unit determines whether or not there is an anomaly in the monitoring target based on a relational expression related to a new frequency, which is different from the relational expression learned during the learning period.
    Type: Grant
    Filed: May 11, 2015
    Date of Patent: July 21, 2020
    Assignee: NEC CORPORATION
    Inventor: Katsuhiro Ochiai
  • Patent number: 10697861
    Abstract: A structure abnormality detection device that detects an abnormality of a structure includes means for storing a model that predicts, from a first inspection value acquired at a first inspection position, a second inspection value acquired at a second inspection position that is a position where a vibration intensity in vibration of a predetermined vibration mode at a natural frequency of the structure is substantially the same as at the first inspection position; and means for detecting an abnormality of the structure by evaluating fidelity of the first inspection value and the second inspection value acquired at a particular time to the model.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: June 30, 2020
    Assignee: NEC CORPORATION
    Inventors: Ryota Mase, Shinji Kasahara, Katsuhiro Ochiai
  • Patent number: 10641681
    Abstract: A structure abnormality detection system that detects an abnormality of at least one of structures classified into a plurality of groups in which a plurality of factors that may affect behavior of structures are substantially the same includes: means for storing a model that predicts, from a first inspection value acquired at a first inspection position, a second inspection value acquired at a second inspection position that is a position where a vibration intensity in vibration of a predetermined vibration mode at a natural frequency of the structure is substantially the same as at the first inspection position; and means for detecting an abnormality of the structure by evaluating fidelity of the first inspection value and the second inspection value acquired at a particular time to the model.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: May 5, 2020
    Assignee: NEC CORPORATION
    Inventors: Ryota Mase, Katsuhiro Ochiai
  • Publication number: 20200050718
    Abstract: A simulation apparatus, a simulation method, and a storage medium that can implement a water flow simulation with higher accuracy compared to the conventional water flow simulator are provided. The simulation apparatus has an estimated value acquisition unit that calculates an estimated value of soil water content in a target region, a determination unit that determines a parameter in consideration of an error between the estimated value of the soil water content in the target region and an actual measurement value of the soil water content in the target region, and a simulator unit that performs a simulation of a water flow in the target region by using the parameter.
    Type: Application
    Filed: October 31, 2016
    Publication date: February 13, 2020
    Applicant: NEC Corporation
    Inventors: Yuya YAMAKAWA, Katsuhiro OCHIAI
  • Publication number: 20190271680
    Abstract: Moisture content information in soil at a specified site, and moisture content information at a ground surface within a given range that includes the specified site, are acquired. A point where there is a risk of natural disaster within the given range is determined and highlighted, based on the moisture content information in soil at the specified site and the moisture content information at the ground surface within the given range.
    Type: Application
    Filed: May 21, 2019
    Publication date: September 5, 2019
    Applicant: NEC Corporation
    Inventors: Ryota MASE, Katsuhiro OCHIAI
  • Publication number: 20190266039
    Abstract: A system analysis support device includes a data acquisition part that obtains time series data (items) measured in a system that is to be analyzed, an overall abnormality degree calculation part that calculates transition of abnormality degree representing overall abnormality degree of the system that is to be analyzed, using a predictive model generated so that, with 2 or more time series data (items) as input, values representing a relationship between the 2 or more time series data (items) are outputted, and the time series data (items), and a representative index selection part that selects and presents time series data (items) indicating change similar to transition of the overall abnormality degree of the system that is to be analyzed, from among the time series data (items).
    Type: Application
    Filed: September 13, 2017
    Publication date: August 29, 2019
    Applicant: NEC CORPORATION
    Inventor: Katsuhiro OCHIAI
  • Patent number: 10330661
    Abstract: In order to achieve highly accurate prediction across a wide area for disasters caused by rainfall, this disaster prediction system includes: soil moisture acquisition means that acquires amount of moisture in soil at a specified site, ground surface moisture acquisition means that acquires amount of moisture at a ground surface within a given range that includes the specified site, and estimation means estimates amount of moisture in soil at a freely-selected site in the given range or a parameter that indicates a property of soil at the freely-selected site in the given range, based on the amount of moisture in the soil at the specified site and the amount of moisture at the ground surface within the given range.
    Type: Grant
    Filed: September 12, 2016
    Date of Patent: June 25, 2019
    Assignee: NEC CORPORATION
    Inventors: Ryota Mase, Katsuhiro Ochiai
  • Publication number: 20190170903
    Abstract: A rainfall amount prediction device includes: a first prediction unit creating a first prediction pattern, and calculating a first total rainfall amount that is the total rainfall amount in the first period according to the first prediction pattern; a second prediction unit determining a second total rainfall amount that is the total rainfall amount in a second period by subtracting the first total rainfall amount from the entire total rainfall amount, and creating, under the limitations of the second total rainfall amount, and a pattern creation unit creating a plurality of rainfall prediction patterns for the entirety of the prediction period by combining, on a time axis, the first prediction pattern and the plurality of second prediction patterns.
    Type: Application
    Filed: August 23, 2017
    Publication date: June 6, 2019
    Applicant: NEC Corporation
    Inventors: Yuya YAMAKAWA, Katsuhiro OCHIAI
  • Publication number: 20190129675
    Abstract: This invention is directed to a plant management system that efficiently supports the on-site work of an operator who checks or maintains a structure such as a plant. The plant management system comprises a position acquirer that acquires a position of a terminal, a sensor specifier that specifies a sensor in accordance with the position of the terminal, and a sensor information acquirer that acquires sensor information concerning the specified sensor; and a presenter that presents the sensor information to an operator by superimposing or projecting the sensor information in association with a target to be measured by the specified sensor. Here, the presenter includes a superimposing display unit or a projection device.
    Type: Application
    Filed: February 20, 2017
    Publication date: May 2, 2019
    Applicant: NEC CORPORATION
    Inventor: Katsuhiro OCHIAI
  • Publication number: 20190086903
    Abstract: The present invention is directed to a plant management system that actively incorporates the sense or experience of an operator who observes or inspects a plant on work site in plant management processing. The plant management system includes an acquirer that acquires at least a position in which an abnormality suspicious event suspected to be abnormal by an operator on work site has occurred, a sensor specifier that specifies a sensor associated with the abnormality suspicious event based on the at least a position in which the abnormality suspicious event has occurred, and a setter that sets an information collection method in accordance with the specified sensor. In addition, at least one of a type of the abnormality suspicious event and an occurrence time of the abnormality suspicious event may be taken into consideration to specify the sensor.
    Type: Application
    Filed: February 20, 2017
    Publication date: March 21, 2019
    Applicant: NEC CORPORATION
    Inventor: Katsuhiro OCHIAI
  • Publication number: 20190088022
    Abstract: This invention is directed to a plant management system that presents a position to be measured by a sensor that performs measurement for inspection of a plant or the like when the measurement is executed, thereby preventing a measurement error. The plant management system includes a measurement position instructor that, when performing the measurement by the sensor on a work site, instructs the position to be measured by the sensor on a measurement target, and a presenter that, when the measurement is executed, performs presentation of an image representing the position to be measured by the sensor on the work site by superimposing the image on an image of the measurement target or projecting the image onto the measurement target.
    Type: Application
    Filed: February 20, 2017
    Publication date: March 21, 2019
    Applicant: NEC CORPORATION
    Inventor: Katsuhiro OCHIAI
  • Patent number: 10228994
    Abstract: An information processing system, an information processing method, and a program capable of satisfactory data analysis are provided. The information processing system includes a frequency conversion unit 205 which converts a plurality of pieces of time-series data obtained through detection carried out by a plurality of sensing units 201 into pieces of frequency data 208, respectively, a model construction unit 211 which generates a correlation model 213 using pieces of the frequency data 208 for at least two sensing units 201 from among the plurality of sensing units 201 and calculates a correlation strength 214 of the correlation model 213, and an error detection unit which determines whether an error has occurred based on the correlation strength 214.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: March 12, 2019
    Assignee: NEC Corporation
    Inventors: Shinji Kasahara, Katsuhiro Ochiai
  • Publication number: 20180306677
    Abstract: A structure abnormality detection device that detects an abnormality of a structure includes means for storing a model that predicts, from a first inspection value acquired at a first inspection position, a second inspection value acquired at a second inspection position that is a position where a vibration intensity in vibration of a predetermined vibration mode at a natural frequency of the structure is substantially the same as at the first inspection position; and means for detecting an abnormality of the structure by evaluating fidelity of the first inspection value and the second inspection value acquired at a particular time to the model.
    Type: Application
    Filed: October 7, 2016
    Publication date: October 25, 2018
    Applicant: NEC CORPORATION
    Inventors: Ryota MASE, Shinji KASAHARA, Katsuhiro OCHIAI