Patents by Inventor Katsuji Kawaguchi

Katsuji Kawaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030061083
    Abstract: An evaluation method that enables quantitative evaluation of qualitative index to engineer's productivity without influenced by a subjective judgments. A theme that is set as an engineer's productivity index that is qualitative, a target-converted amount of money or a target-converted numerical value that is set for the theme, a result of evaluation in predetermined evaluation levels that is performed regularly for the theme, and coefficients that are set for the respective evaluation levels are employed as data. A determined evaluation level is input to a computer at the time of evaluation for the theme and the computer calculates the product of a coefficient corresponding to the input evaluation level and the target-converted amount of money or numerical value and stores the calculated product.
    Type: Application
    Filed: March 13, 2002
    Publication date: March 27, 2003
    Applicant: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yasumasa Nishimura, Katsuji Kawaguchi, Mamoru Miyamoto
  • Patent number: 4904934
    Abstract: A testing apparatus includes a turntable, a driving device for rotating the turntable by a predetermined angle, and a plurality of pallets symmetrically fixed on the turntable around a center of rotation of the turntable. Each pallet holds a plurality of semiconductor devices and has electrode patterns for connection to leads of the semiconductor devices. A tester for testing the semiconductor devices is electrically connected with the electrode patterns of one of the pallets located at a first position in the rotation of the turntable by a connecting device. An exchanging device exchanges the semiconductor devices for new ones on one of the pallets located at a second position in the rotation of the turntable. A cover covers the turntable except around the second position. A heating device heats the inside of the cover to maintain the semiconductor devices held on the pallets in the cover at a high temperature.
    Type: Grant
    Filed: October 19, 1988
    Date of Patent: February 27, 1990
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Ryouji Nishihashi, Kiyoji Imanaka, Katsuji Kawaguchi, Hidekazu Iwasaki
  • Patent number: 4714501
    Abstract: An alloy for heat transfer pipes excellent in an alkali stress corrosion cracking resistance which is obtained by heating and retaining said alloy at a temperature within the range of a temperature (T.degree.C.), at which a carbide in said alloy is thoroughly solubilized, to T+100.degree. C. for 1 minute or more; cooling it once to a level of 200.degree. C. or less; and carrying out a thermal treatment under conditions within a hatched range Z in FIG. 2, said alloy comprising: in terms of % by weight, 0.15% or less of C; 1.0% or less of Si; 1.0% or less of Mn; 25 to 35% of Cr; 40 to 70% of Ni; 0.5% or less of Al; 0.01 to 1.0% of Ti; 0.5 to 5.0%, in all, of one or more of Mo, W and V; 0.30% or less of P; 0.020% or less of S; and the residue of Fe and impurities.
    Type: Grant
    Filed: November 15, 1985
    Date of Patent: December 22, 1987
    Assignees: Mitsubishi Jukogyo Kabushiki Kaisha, Sumitomo Metal Industries, Ltd.
    Inventors: Kazuo Yamanaka, Hiroo Nagano, Takao Minami, Yaautaka Okada, Mamoru Inoue, Hiroshi Susukida, Kichiro Onimura, Toshio Yonezawa, Nobuya Sasaguri, Katsuji Kawaguchi, Takaya Kusakabe
  • Patent number: 4710237
    Abstract: A method for a thermal treatment of a nickel based alloy, characterized in that said nickel based alloy for a material which will be subjected to a high-temperature and high-pressure water or vapor comprises, in terms of % by weight, 58% or more of Ni, 25 to 35% of Cr, 0.003% or less of B, 0.012 to 0.035% of C, 1% or less of Mn, 0.5% or less of Si, 0.015% or less of P, 0.015% or less of S, and the residue of Fe and usual impurities; in a first thermal treatment process, said nickel based alloy is heated and retained at a temperature of T.degree. C. to (T+100).degree.C. and is cooled at a cooling rate of a furnace cooling rate or more; and in a second thermal treatment process, said nickel based alloy is then retained at a temperature of 600.degree. to 750.degree. C. and at a temperature within a sensitization recovery range for a period of 0.1 to 100 hours and is cooled at a cooling rate of said furnace cooling rate or more.
    Type: Grant
    Filed: January 2, 1986
    Date of Patent: December 1, 1987
    Assignees: Mitsubishi Jukogyo Kabushiki Kaisha, Sumitomo Metal Industries, Ltd.
    Inventors: Toshio Yonezawa, Nobuya Sasaguri, Kichiro Onimura, Hiroshi Susukida, Katsuji Kawaguchi, Hiroo Nagano, Takao Minami, Kazuo Yamanaka, Yasutaka Okada, Mamoru Inoue