Abstract: The present apparatus includes an attracting transport arm for attracting an attraction object via a nozzle hole by vacuum and transporting the attraction object in a horizontal or vertical direction. An upwardly directed light emitting sensor is disposed on the rear side of a portion of a stage at which the attraction object is to be placed. At the location at which the attraction object is to be placed, a through-hole which is intended to prevent interception upward rays of light of the light emitting element is perforated. Meanwhile, a downwardly directed light receiving element for receiving rays of light from the light emitting element is disposed in the interior of the nozzle hole of the attracting transport arm.

Abstract: Two contact heads are used to convey IC devices between an IC device testing part E and a contact arm operating stage ST3 and a buffer stage ST4 is interposed between the contact arm operating stage ST3, a loader arm operating stage ST1 and an unloader arm operating stage ST2 and is movable in X-direction. On the buffer stage ST2 are disposed a loader buffer carrier and an unloader buffer carrier, the former transfers untested IC devices from the loader arm operating stage ST1 to the contact arm operating stage ST3 and the latter transfers tested IC devices from the contact arm operating stage ST3 to the unloader arm operating stage ST3.