Abstract: An event information memory stores an occurrence time of an event so as to cause the occurrence time of the event to correspond to each of monitoring targets in which the events occurred (or are scheduled to occur) among a plurality of the monitoring targets. Based on position information for displaying each of a plurality of monitoring targets on a general view, a controller instructs control to draw an event display image on the general view so as to cause the event display image to correspond to the monitoring target in which the event occurred (or scheduled to occur), the monitoring target being stored in the event information memory. The event display image includes: a circular portion indicating a predetermined time in a circumferential direction, an indicator indicating a current hour or minute, and an event occurrence time display portion caused to correspond to the occurrence time of the event.

Abstract: An event information memory stores an occurrence time of an event so as to cause the occurrence time of the event to correspond to each of monitoring targets in which the events occurred (or are scheduled to occur) among a plurality of the monitoring targets. Based on position information for displaying each of a plurality of monitoring targets on a general view, a controller instructs control to draw an event display image on the general view so as to cause the event display image to correspond to the monitoring target in which the event occurred (or scheduled to occur), the monitoring target being stored in the event information memory. The event display image includes: a circular portion indicating a predetermined time in a circumferential direction, an indicator indicating a current hour or minute, and an event occurrence time display portion caused to correspond to the occurrence time of the event.

Abstract: A sample atomic configuration creation part in a control section creates the atomic arrangement data of a sample, and a sample surface height calculation part calculates a sample surface height for every mesh. A probe profile creation part creates the atomic arrangement data of a probe, and a probe surface height calculation part calculates the height of the probe surface for every mesh. A probe scanning part supplies the coordinate of a scanning start position in the scanning range to a collision height specification part. The collision height specification part calculates the distance between the sample surface and the probe in each mesh. Calculation of this distance is repeated for all meshes of the probe at the coordinate of this measuring position.

Abstract: A sample atomic configuration creation means (211) in a control section (21) creates the atomic arrangement data of a sample, and a sample surface height calculation means (212) calculates a sample surface height for every mesh. A probe profile creation means (213) creates the atomic arrangement data of a probe, and a probe surface height calculation means (214) calculates the height of the probe surface for every mesh. A probe scanning means (216) supplies the coordinate of a scanning start position in the scanning range to a collision height specification means (215). The collision height specification means (215) calculates the distance between the sample surface and the probe in each mesh. Calculation of this distance is repeated for all meshes of the probe at the coordinate of this measuring position.