Abstract: According to one embodiment, a disk medium rotates in a first rotation state when access is given, and rotates in a second rotation state lower in rotation number than the first rotation state when access is not given. A controller receives, from a host device, a read command for reading first data stored in a first buffer, when the disk medium is in the second rotation state. The controller transmits the first data from the first buffer to the host device, without causing a shift into the first rotation state, and then shifts the disk medium into the first rotation state after completion of execution of the read command.

Abstract: According to one embodiment, a disk medium rotates in a first rotation state when access is given, and rotates in a second rotation state lower in rotation number than the first rotation state when access is not given. A controller receives, from a host device, a read command for reading first data stored in a first buffer, when the disk medium is in the second rotation state. The controller transmits the first data from the first buffer to the host device, without causing a shift into the first rotation state, and then shifts the disk medium into the first rotation state after completion of execution of the read command.

Abstract: According to one embodiment, there is provided a disk apparatus including a disk medium, a nonvolatile memory, and a controller. In the nonvolatile memory, data to be recorded to the disk medium is written. The controller is configured to perform, according to amount of free space of the nonvolatile memory, write process of the data in the nonvolatile memory collectively, or in multiple times with dividing the write process.

Abstract: A disk device includes a recording medium having a plurality of recording surfaces, where each of the recording surfaces includes a system region for recording system data related to an operation of the disk device, and a controller configured to control recording of the system data in the system region. The controller is further configured to divide the system data to be recorded into a plurality of portions of divided data of the same size. The controller is further configured, after recording of a first portion of divided data in a first system region disposed on a first recording surface, to start recording a second portion of divided data in a second system region disposed on a second recording surface. The recording of the second portion of divided data is started after a switching time, during which switching from the first recording surface to the second recording surface transpires.

Abstract: A disk device includes a recording medium having a plurality of recording surfaces, where each of the recording surfaces includes a system region for recording system data related to an operation of the disk device, and a controller configured to control recording of the system data in the system region. The controller is further configured to divide the system data to be recorded into a plurality of portions of divided data of the same size. The controller is further configured, after recording of a first portion of divided data in a first system region disposed on a first recording surface, to start recording a second portion of divided data in a second system region disposed on a second recording surface. The recording of the second portion of divided data is started after a switching time, during which switching from the first recording surface to the second recording surface transpires.

Abstract: Firmware FW1 and FW2 is separately stored in a non-volatile memory, in which a boot code for start-up and a restoration code are stored, and a first magnetic disk. A copy of the firmware FW1 stored in the non-volatile memory is stored in the first magnetic disk, and a copy of the entire firmware FW1 and FW2 stored in the first disk medium is stored in the second magnetic disk. When an error occurs during firmware update, upon next power-on, whether the volatile memory, the first magnetic disk, and the second magnetic disk are normal or abnormal is determined, and valid firmware is read and allocated to the volatile memory so as to perform start-up by a start-up mode corresponding to the determination contents.

Abstract: According to one embodiment, a storage apparatus configured to connect to other apparatus through a communication interface, includes: a memory device; an analysis object data writing module configured to write, when a predetermined event occurs, analysis object data corresponding to the event in the memory device; a response data generator configured to generate response data corresponding to a request input through the communication interface; and a data output module configured to output the response data through the communication interface when the response data exist, and output the analysis object data stored in the memory device through the communication interface by using a non-transmission time interval of the response data.

Abstract: Firmware FW1 and FW2 is separately stored in a non-volatile memory, in which a boot code for start-up and a restoration code are stored, and a first magnetic disk. A copy of the firmware FW1 stored in the non-volatile memory is stored in the first magnetic disk, and a copy of the entire firmware FW1 and FW2 stored in the first disk medium is stored in the second magnetic disk. When an error occurs during firmware update, upon next power-on, whether the volatile memory, the first magnetic disk, and the second magnetic disk are normal or abnormal is determined, and valid firmware is read and allocated to the volatile memory so as to perform start-up by a start-up mode corresponding to the determination contents.

Abstract: Firmware FW1 and FW2 is separately stored in a non-volatile memory, in which a boot code for start-up and a restoration code are stored, and a first magnetic disk. A copy of the firmware FW1 stored in the non-volatile memory is stored in the first magnetic disk, and a copy of the entire firmware FW1 and FW2 stored in the first disk medium is stored in the second magnetic disk. When an error occurs during firmware update, upon next power-on, whether the volatile memory, the first magnetic disk, and the second magnetic disk are normal or abnormal is determined, and valid firmware is read and allocated to the volatile memory so as to perform start-up by a start-up mode corresponding to the determination contents.

Abstract: A nonvolatile memory, storing a plurality of access programs for accessing a storage device by the storage device connectable depending on an adopted interface, is comprised in an information processor, when power is applied to the information processor, the types of the adopted interface and connected storage devices are determined, and access programs, except for an access program corresponding to the type specified by the determination, are cleared from the nonvolatile memory. Consequently, the nonvolatile memory can prepare the appropriate access program only.

Abstract: A light receiving module and a light receiving method to reduce polarization dependence, used in evaluation of polarization characteristics of various optical parts. The light receiving module has an optical mechanism including a first light transmission plate and a second light transmission plate between a first lens and a second lens, and a light receiving element of the outside of the optical mechanism. The first light transmission plate is inclined at such an angle as to have the same value as polarization dependence due to the inclination of the light receiving surface of the light receiving element, and subsequently the first light transmission plate is rotated by 90° in relation to the optical axis.

Abstract: The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.

Abstract: An electro-optic sampling probe is disclosed, by which both faces of an IC wafer can be measured without moving the IC wafer. In the probe, an excitation optical system is provided at the back face side of a back-face excitation type IC wafer. The back face of the IC wafer is irradiated by light output from the excitation optical system, and simultaneously, the electric signal transmitted through wiring on the IC wafer is measured by using light output from an electro-optic sampling optical system provided at the front face side of the IC wafer. If the excitation optical system is substituted with an electro-optic sampling optical system, an IC wafer having wiring in both faces can also be measured.

Abstract: An electro-optic sampling probe includes an electro-optic element which is to be positioned to contact wiring on an IC wafer surface which is a measurement target and whose optical characteristics are changed depending on an electric field applied via the wiring and an electro-optic sampling optical system module having a polarized beam splitter, a wave plate, and a photo diode. The module separates light, which is transmitted through the electro-optic element and is reflected by a surface of the electro-optic element from laser light emitted from the outside and converts the separated light into an electric signal, and includes an optical axis adjuster attached to a detachable portion of an optical fiber that emits the laser light for adjusting the optical axis of the laser light and a light receiving surface adjuster attached to the detachable portion of the photo diode for adjusting the position of a light receiving surface of the photo diode.

Abstract: In order to maintain accuracy of measurement, a temperature-insensitive electro-optic probe has a laser diode provided to emit a laser beam based on a control signal of an oscilloscope body, a collimator lens provided to convert the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with the optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side, an isolator provided between the collimator lens and the electro-optic element, and adapted to transmit the laser beam emitted from the laser diode, in order to separate a light reflected by the reflective coating from the laser beam, a photodiode provided to convert the reflected light separated by the isolator into an electrical signal, a temperature detection section arranged to be in contact with optical components consisting the isolator, and to detect the temperature of the optical components and output the res

Abstract: The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.

Abstract: An electro-optic probe is provided which is able to prevent unnecessary reflected light from optical components in the electro-optic probe from entering photodiodes. The optical components which constitutes an isolator 13 are disposed inclining from an optical path of a parallel light emitted from a collimating lens 8, such that the unnecessary reflected light beams from these optical component surfaces are not incident to the photodiodes 10 and 11. The inclination angle of these optical components are set within a range from an angle formed by an optical path from said optical component to a light receiving element in said photodiode, and the diameter of said light receiving element to an angle allowable for the optical component to maintain the transmittance thereof.

Abstract: A probe for an electro-optic sampling oscilloscope is provided, capable of obtaining an improved accuracy in measurement of the test measuring signals by controlling a temperature of an electro-optic element so as to be maintained at a constant such that the refractive index of the electro-optic element does not change due to the temperature change. The probe for the electro-optic sampling oscilloscope comprises a reflecting film at one end and a metal pin provided on the surface of the reflecting film such that the optical property of the electro-optic film changes according to an electric field applied through the metal pin.

Abstract: An electro-optic sampling probe for preventing noise from being transmitted to photodiodes and improving the measurement accuracy is disclosed. In the probe, the optical system module comprises wavelength plates and polarized beam splitters arranged along an optical path of the relevant laser beam, and photodiodes facing the polarized beam splitters, wherein each photodiode is fixed via an insulating material to the main frame of the optical system module.

Abstract: An electro-optic sampling prober is used to measure a waveform of a measured signal applied to wiring of an IC wafer. Herein, a laser radiates laser beams, which are supplied to an optical module containing an optical isolator and photodiodes by way of an optical fiber. Then, the laser beams pass through an optical wavelength filter to propagate through a prober unit. The laser beams are incident on an electro-optical element, which is changed in polarization state in response to an electric field being caused by the measured signal. The laser beams are reflected by a surface mirror of the electro-optical element, so that reflected beams propagate back through the prober unit and are returned to the optical module by way of the optical wavelength filter. During the measurement, a human operator watches an image of a selected portion of the IC wafer presently placed beneath the prober unit to adjust a positional relationship between the prober unit and IC wafer.