Patents by Inventor Katsuya Hirano

Katsuya Hirano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120019210
    Abstract: Suppliable power per unit time from a secondary battery (4) to a DC communication device load (3) during an output suppression time zone (TS) is stored in a memory (2B) as a threshold (W1). A current power consumption (W2) of the DC communication device load (3) is measured. An output control unit (2D) is provided with a function of, during the output suppression time zone (TS), comparing the current power consumption (W2) of the DC communication device load (3) with the threshold (W1) in the memory (2B), if W2?W1, stopping power supply from a rectifying unit (2-1) to the DC communication device load (3) and covering the power consumption (W2) only by power accumulated in the secondary battery (4), and if W2>W1, covering the power consumption up to the threshold (W1) by the power accumulated in the secondary battery (4) and covering the power consumption more than the threshold (W1) by power from the rectifying unit (2-1).
    Type: Application
    Filed: April 14, 2010
    Publication date: January 26, 2012
    Inventors: Akira Wakamatsu, Katsuya Hirano
  • Publication number: 20110240327
    Abstract: The present invention has an object of providing an electronic apparatus storing container capable of facilitating mounting of an electronic apparatus and having improved productivity. The electronic apparatus storing container according to the present invention includes: a base including an electronic apparatus mounting area of a planar shape in which an electronic apparatus is mountable, and a packing groove formed in an outer peripheral portion of the electronic apparatus mounting area; a waterproof packing fit in a corresponding manner in the packing groove; and a case joined with the base with the waterproof packing sandwiched therebetween, the case storing the electronic apparatus mounted in the electronic apparatus mounting area. This improves the productivity of the electronic apparatus storing container.
    Type: Application
    Filed: October 15, 2009
    Publication date: October 6, 2011
    Applicant: NEC CORPORATION
    Inventors: Masahi Hasegawa, Naoto Ozaki, Katsuya Hirano
  • Patent number: 7888265
    Abstract: This method for assaying copper in silicon wafers includes the steps of: forming a polysilicon layer on the surface of a p-type silicon wafer having the same characteristics as the silicon wafers being assayed; heat treating the p-type silicon wafer after it has been polished; dissolving the polysilicon layer on the heat-treated p-type silicon wafer with a mixed acid composed of at least hydrofluoric acid and nitric acid; and quantitatively determining the copper components within the mixed acid following dissolution of the polysilicon layer.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: February 15, 2011
    Assignee: Sumco Corporation
    Inventors: Katsuya Hirano, Mohammad B. Shabani
  • Patent number: 7686973
    Abstract: A wafer etching and impurity analysis method is presented in which a wafer is held in a vessel having gas introduction and exhaust ports, a solution including a mixture of hydrofluoric acid and nitric acid alone or together with sulfuric acid is bubbled with a carrier gas without being heated, which generates a gas containing vaporized hydrofluoric acid and nitric acid, and the inside of the vessel is purged so that the amount of gas supplied is kept constant at all times. All or a specific portion of the wafer is cooled to a specific temperature. Consequently, the gas is condensed on the surface of the wafer, which allows the required portion of the wafer to be etched. The method reduces the amount of liquid needed for residue recovery, the amount of admixed silicon during impurity analysis, and the concentration time.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: March 30, 2010
    Assignee: Sumitomo Mitsubishi Silicon Corporation
    Inventors: Katsuya Hirano, Hiroshi Horie
  • Publication number: 20100063048
    Abstract: A therapeutic agent for subarachnoid hemorrhage or a drug for improving prognosis of subarachnoid hemorrhage, comprising a compound having a PAR1 inhibitory effect, its pharmaceutically acceptable salt or a hydrate thereof
    Type: Application
    Filed: June 17, 2009
    Publication date: March 11, 2010
    Applicants: Eisai R&D Mangement Co., Ltd., Kyushu University, National University Corporation
    Inventors: Katsuya Hirano, Yoshihisa Maeda, Tomio Sasaki, Hideo Kanaide, Yasutoshi Kai
  • Patent number: 7419534
    Abstract: A cooling apparatus is disclosed for cooling and dehumidifying the inside of a device such as an electronic device installed outdoors The cooling apparatus of the invention comprises a set of dehumidifying parts, each arranged at an open air intake side and an air exhaust side of a housing of the device respectively, and having filtering members for removing humidity from the open air. When air in the housing is saturated with humidity by air blowing from a fan, the rotational direction of the fan is reversed to thereby change the air flowing direction towards the dehumidification part. A dehumidification material thus receives heated and dried exhaust-air from a heating material and discharges moisture accumulated within the material to the outside, thereby recovering moisture absorption capability of the dehumidification material.
    Type: Grant
    Filed: March 4, 2004
    Date of Patent: September 2, 2008
    Assignee: NEC Corporation
    Inventor: Katsuya Hirano
  • Publication number: 20080194559
    Abstract: A therapeutic agent for subarachnoid hemorrhage or a drug for improving prognosis of subarachnoid hemorrhage, comprising a compound having a PAR1 inhibitory effect, its pharmaceutically acceptable salt or a hydrate thereof.
    Type: Application
    Filed: September 2, 2005
    Publication date: August 14, 2008
    Applicants: Eisai R.& D Managment Co., Ltd., Kyushu University National University Corporation
    Inventors: Katsuya Hirano, Yoshihisa Maeda, Tomio Sasaki, Hideo Kanaide, Yasutoshi Kai
  • Publication number: 20080047934
    Abstract: A wafer etching and impurity analysis method is presented in which a wafer is held in a vessel having gas introduction and exhaust ports, a solution including a mixture of hydrofluoric acid and nitric acid alone or together with sulfuric acid is bubbled with a carrier gas without being heated, which generates a gas containing vaporized hydrofluoric acid and nitric acid, and the inside of the vessel is purged so that the amount of gas supplied is kept constant at all times. All or a specific portion of the wafer is cooled to a specific temperature. Consequently, the gas is condensed on the surface of the wafer, which allows the required portion of the wafer to be etched. The method reduces the amount of liquid needed for residue recovery, the amount of admixed silicon during impurity analysis, and the concentration time.
    Type: Application
    Filed: April 24, 2007
    Publication date: February 28, 2008
    Applicant: Sumitomo Mitsubishi Silicon Corporation
    Inventors: Katsuya Hirano, Hiroshi Horie
  • Publication number: 20070207616
    Abstract: This method for assaying copper in silicon wafers includes the steps of: forming a polysilicon layer on the surface of a p-type silicon wafer having the same characteristics as the silicon wafers being assayed; heat treating the p-type silicon wafer after it has been polished; dissolving the polysilicon layer on the heat-treated p-type silicon wafer with a mixed acid composed of at least hydrofluoric acid and nitric acid; and quantitatively determining the copper components within the mixed acid following dissolution of the polysilicon layer.
    Type: Application
    Filed: February 20, 2007
    Publication date: September 6, 2007
    Inventors: Katsuya Hirano, Mohammad Shabani
  • Publication number: 20060185515
    Abstract: A cooling apparatus is disclosed for cooling and dehumidifying the inside of a device such as an electronic device installed outdoors The cooling apparatus of the invention comprises a set of dehumidifying parts, each arranged at an open air intake side and an air exhaust side of a housing of the device respectively, and having filtering members for removing humidity from the open air. When air in the housing is saturated with humidity by air blowing from a fan, the rotational direction of the fan is reversed to thereby change the air flowing direction towards the dehumidification part. A dehumidification material thus receives heated and dried exhaust-air from a heating material and discharges moisture accumulated within the material to the outside, thereby recovering moisture absorption capability of the dehumidification material.
    Type: Application
    Filed: March 4, 2004
    Publication date: August 24, 2006
    Inventor: Katsuya Hirano
  • Publication number: 20060190349
    Abstract: At access from the orderer terminal, an order support server sends to the orderer terminal an order input form to order a concealing item to conceal a radio base station of cellulars. Upon receipt of order information from the orderer terminal, the information including the order input form containing at least orderer information, environmental conditions regarding a radio base station of cellular phones and an item name of the radio base station, and image data being attached thereto and showing an installation state of the radio base station, the order support server selects a designing maker according to the item name of the radio base station in the order information. The order support server then transmits the order information to the order receiver terminal of the designing maker thus selected. Therefore, the business area manager can easily order a concealing item of a radio base station of cellular phones.
    Type: Application
    Filed: February 16, 2006
    Publication date: August 24, 2006
    Inventors: Tadashi Matsuzawa, Katsuya Hirano
  • Publication number: 20040232111
    Abstract: A wafer etching and impurity analysis method is presented where a wafer is held in a vessel having gas introduction and exhaust ports, a solution including a mixture of hydrofluoric acid and nitric acid alone or together with sulfuric acid is bubbled with a carrier gas without being heated, which generates a gas containing vaporized hydrofluoric acid and nitric acid, and the inside of the vessel is purged so that the amount of gas supplied is kept constant at all times. The molar ratio of the hydrofluoric acid and nitric acid (and sulfuric acid if used) in the solution is set to a specific value. The amount of gas introduced is specified. All or a specific portion of the wafer is cooled to a specific temperature between 0 and 20° C. Consequently, the gas is condensed on the surface of the wafer, which allows the required portion of the wafer to be etched and the amount of required in-plane etching to be uniform.
    Type: Application
    Filed: March 11, 2004
    Publication date: November 25, 2004
    Inventors: Katsuya Hirano, Hiroshi Horie
  • Patent number: 6384322
    Abstract: A hermetic enclosure having an air pressure adjustable function, which can adjust inside air pressure of the hermetic enclosure, is provided. In order to prevent devices in the hermetic enclosure from corroding, the hermetic enclosure having an air pressure adjustable function provides a main body having a clearance part and a packing fixing groove, a door, and packing that is fixed to the packing fixing groove of the main body. And the door is jointed with the main body by placing the packing between the door and the main body in a state that the door is able to slide on the packing. And when inside and outside air pressure of the hermetic enclosure becomes different, the door moves on the packing and the clearance part of the main body is changed, and the inside and outside air pressure is adjusted to be almost equal.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: May 7, 2002
    Assignee: NEC Corporation
    Inventor: Katsuya Hirano
  • Publication number: 20010017212
    Abstract: A hermetic enclosure having an air pressure adjustable function, which can adjust inside air pressure of the hermetic enclosure, is provided. In order to prevent devices in the hermetic enclosure from corroding, the hermetic enclosure having an air pressure adjustable function provides a main body having a clearance part and a packing fixing groove, a door, and packing that is fixed to the packing fixing groove of the main body. And the door is jointed with the main body by placing the packing between the door and the main body in a state that the door is able to slide on the packing. And when inside and outside air pressure of the hermetic enclosure becomes different, the door moves on the packing and the clearance part of the main body is changed, and the inside and outside air pressure is adjusted to be almost equal.
    Type: Application
    Filed: February 27, 2001
    Publication date: August 30, 2001
    Inventor: Katsuya Hirano
  • Patent number: D595279
    Type: Grant
    Filed: May 23, 2007
    Date of Patent: June 30, 2009
    Assignee: NEC Corporation
    Inventors: Kazuhiro Chiba, Katsuya Hirano, Kouichi Takita, Takeshi Nakatani
  • Patent number: D595280
    Type: Grant
    Filed: May 23, 2007
    Date of Patent: June 30, 2009
    Assignee: NEC Corporation
    Inventors: Kazuhiro Chiba, Katsuya Hirano, Kouichi Takita, Takeshi Nakatani
  • Patent number: D595281
    Type: Grant
    Filed: May 23, 2007
    Date of Patent: June 30, 2009
    Assignee: NEC Corporation
    Inventors: Kazuhiro Chiba, Katsuya Hirano, Kouichi Takita, Takeshi Nakatani
  • Patent number: D598906
    Type: Grant
    Filed: May 23, 2007
    Date of Patent: August 25, 2009
    Assignee: NEC Corporation
    Inventors: Kazuhiro Chiba, Katsuya Hirano, Kouichi Takita, Takeshi Nakatani