Patents by Inventor Katsuyuki Nishifuji

Katsuyuki Nishifuji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5309765
    Abstract: An apparatus for performing ultrasonic flaw detection, wherein an ultrasonic transmitter transmits a pulse signal having a designated carrier frequency and a designated cycle count to an ultrasonic probe. An ultrasonic receiver receives the echo signal output from the ultrasonic probe. The peak frequency and the frequency bandwidth of the echo signal received by the ultrasonic receiving unit are detected by a signal analysis unit. A transmission control unit designates the carrier frequency and the cycle count of the pulse signal output from the ultrasonic transmission unit so that the detected peak frequency and the detected frequency bandwidth become a flaw detection condition peak frequency and a flaw detection condition frequency bandwidth, respectively.
    Type: Grant
    Filed: November 12, 1991
    Date of Patent: May 10, 1994
    Assignee: NKK Corporation
    Inventors: Hidekazu Horigome, Hideya Tanabe, Katsuyuki Nishifuji
  • Patent number: 5132608
    Abstract: A current measuring method in which a magnetic sensor is a torodial core having a conductor for carrying a current to be measured passing through the hollow portion of the toroid. A coil on the core is excited with an AC voltage such that the positive and negative voltages induced in the coil are equal in amplitude when the conductor is not carrying current. Current in the conductor generates a change in magnetic flux which change is measured by detecting the algebraic sum of the amplitudes of the positive and negative voltages. Simultaneously, the amplifier output is applied to the input side of the AC voltage or a second coil disposed in the magnetic sensor so as to establish a magnetic equilibrium. Current measuring apparatus according to this invention include two types of apparatus composed of hardware to which the above-mentioned current measuring method is applied.
    Type: Grant
    Filed: October 15, 1990
    Date of Patent: July 21, 1992
    Assignees: Katsuyuki Nishifuji, Seigo Ando
    Inventors: Katsuyuki Nishifuji, Seigo Ando
  • Patent number: 5081658
    Abstract: The plating amount and composition of a plated steel plate are measured by determining a theoretical relation for an intensity at two different light-receiving angles of K-series fluorescent X-rays of analysis target elements reflected by the plate when monochromatized X-rays are radiated onto the plate at two incident angles, measuring a fluorescent X-ray intensity by using standard samples having known plating amounts and compositions, under the same conditions as for obtaining the theoretical relation, and calculating a conversion coefficient for converting the measured value into a theoretical value by the theoretical relation, measuring a fluorescent X-ray intensity obtained from a plated steel plate to be measured having unknown plating amount and composition under the same conditions for obtaining the theoretical relation, and converting the measured fluorescent X-ray intensity into a theoretical intensity by using the conversion coefficient, and calculating a plating amount and composition as paramete
    Type: Grant
    Filed: February 7, 1990
    Date of Patent: January 14, 1992
    Assignee: NKK Corporation
    Inventors: Kiyotaka Imai, Hiroharu Kato, Tadaaki Hattori, Katsuyuki Nishifuji