Patents by Inventor Kaveh Bakhtari

Kaveh Bakhtari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220017716
    Abstract: This disclosure provides electron beam irradiated products and methods thereof. In particular, the invention is directed to a products and methods that comprise an electron beam irradiated component and a second component. The electron beam irradiated component may be plastic. The second component may be a building material or construction material. The invention is also directed to methods of manufacturing a modified polymer material with an electron-beam. Methods comprise irradiating the polymer particles of the material by dosing with electron beam radiation to produce a modified polymer material comprising irradiated polymer particles.
    Type: Application
    Filed: November 14, 2019
    Publication date: January 20, 2022
    Inventors: Kaveh Bakhtari, Oral Buyukozturk, Michael Philip Short
  • Patent number: 9576765
    Abstract: An electron beam emitter comprises an electron emission source capable of emitting electrons; a vacuum chamber containing the electron emission source; and a transmission window that keeps airtightness of the vacuum chamber and is capable of transmitting the electrons from the electron emission source. The transmission window includes a foil that transmits the electrons and a grid that does not transmit the electrons. The electron emission source includes an emission portion that emits the electrons and a non-emission portion that does not emit the electrons. The emission portion has a lower work function than the non-emission portion. The non-emission portion is prepared so as to prevent the electrons from reaching the grid.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: February 21, 2017
    Assignee: Hitachi Zosen Corporation
    Inventor: Kaveh Bakhtari
  • Publication number: 20160079028
    Abstract: An electron beam emitter comprises an electron emission source capable of emitting electrons; a vacuum chamber containing the electron emission source; and a transmission window that keeps airtightness of the vacuum chamber and is capable of transmitting the electrons from the electron emission source. The transmission window includes a foil that transmits the electrons and a grid that does not transmit the electrons. The electron emission source includes an emission portion that emits the electrons and a non-emission portion that does not emit the electrons. The emission portion has a lower work function than the non-emission portion. The non-emission portion is prepared so as to prevent the electrons from reaching the grid.
    Type: Application
    Filed: September 17, 2014
    Publication date: March 17, 2016
    Applicant: HITACHI ZOSEN CORPORATION
    Inventor: Kaveh Bakhtari
  • Publication number: 20130284587
    Abstract: This invention proposes, among other things, systems and methods for providing ozone generators or plasma generators that generate an electric field in an electron generation chamber that is separate from a reaction chamber. An electron beam emitter in an electron generation chamber is configured to emit a beam of electrons and is separated from the reaction chamber by an electron permeable barrier that provides a window through which the beam of electrons passes. The electrons are accelerated to the required energy in the electron generation chamber and transmitted through the barrier to the reaction chamber, where an input gas source introduces an input gas into the reaction chamber. The input gas may react with the beam of electrons inside the reaction chamber to form an output gas comprising a plasma or a concentration of ozone, and the output gas passes from the reaction chamber to a wafer processing chamber.
    Type: Application
    Filed: December 16, 2011
    Publication date: October 31, 2013
    Applicant: HITACHI ZOSEN CORPORATION
    Inventor: Kaveh Bakhtari
  • Publication number: 20080302652
    Abstract: A system for producing excited gases for introduction to a semiconductor processing chamber. The system includes a plasma source for generating a plasma. The plasma source includes a plasma chamber and a gas inlet for receiving process gases from a gas source. A gas flow rate controller is coupled to the gas inlet for controlling an inlet flow rate of the process gases from the gas source to the plasma chamber via the gas inlet. The system includes a control loop for detecting a transition from a first process gas to a second process gas and for adjusting the inlet flow rate of the second process gas from about 0 sccm to about 10,000 sccm over a period of time greater than about 300 milliseconds to maintain transient heat flux loads applied by the plasma to an inner surface of the plasma chamber below a vaporization temperature of the plasma chamber.
    Type: Application
    Filed: June 3, 2008
    Publication date: December 11, 2008
    Applicant: MKS Instruments, Inc.
    Inventors: William Robert Entley, Xing Chen, Ali Shajii, Kaveh Bakhtari, Andrew Cowe