Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: A memory structure including three-dimensional NOR memory strings and method of fabrication is disclosed. In some embodiments, a memory structure includes randomly accessible ferroelectric storage transistors organized as horizontal NOR memory strings. The NOR memory strings are formed over a semiconductor substrate in multiple scalable memory stacks of thin-film storage transistors. The three-dimensional memory stacks are manufactured in a process that includes forming operational trenches for vertical local word lines and forming auxiliary trenches to facilitate back-alley metal replacement and channel separation by a backside selective etch process. In some embodiments, the ferroelectric storage transistors are junctionless field-effect transistors (FeFETs) having a ferroelectric polarization layer as the gate dielectric layer formed adjacent a semiconductor oxide layer as the channel region. In some embodiments, ferroelectric storage transistors in the memory stacks are isolated by air gap cavities.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: The present disclosure relates to inferring a time zone of a node profile using electronic activities. A method can include accessing a plurality of electronic activities transmitted or received via a plurality of electronic accounts. The method can include identifying, for a node profile, a set of electronic activities sent from or received by an electronic account of the plurality of electronic accounts linked to the node profile within a time period. The method can include identifying, for each electronic activity of the set of electronic activities, a timestamp at which the electronic activity was sent or received. The method can include generating, for each of a plurality of time intervals within the time period, a temporal distribution of electronic activity based on respective timestamps of each electronic activity. The method can include determining a time zone of the node profile based on the temporal distribution.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: This disclosure relates to methods, systems, and storage media for generating a performance profile of a node profile. First electronic activities linked to a first node profile can be accessed. For each first electronic activity, a type of the first electronic activity can be determined. A feature extraction policy can be selected to generate a first feature array for the first electronic activity. The first feature array for the first electronic activity can be generated based on the type of the first electronic activity. A first performance profile of the first node profile can be generated for the time period by providing the generated first feature array for each first electronic activity to one or more models trained using second feature arrays corresponding to second electronic activities of second node profiles. An association between the first node profile and the first performance profile can be stored.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: Methods, systems, and storage media for managing electronic activity driven targets are disclosed. Example implementations may: maintain a plurality of node profiles; select, for a first node profile, using one or more field-value pairs of the first node profile, an endpoint profile generated using electronic activities of second node profiles including one or more field-value pairs that match the one or more field-value pairs of the first node profile, the endpoint profile specifying electronic activity driven targets that can be tracked by parsing electronic activities corresponding to the first node profile; store in one or more data structures, an association between the first node profile and the endpoint profile specifying the electronic activity driven targets; parse a plurality of electronic activities corresponding to the first node profile; and update a metric relating to the electronic activity driven targets responsive to parsing the second plurality of electronic activities.

Abstract: Methods, systems, and storage media for managing electronic activity driven targets are disclosed. Example implementations may: maintain a plurality of node profiles; select, for a first node profile, using one or more field-value pairs of the first node profile, an endpoint profile generated using electronic activities of second node profiles including one or more field-value pairs that match the one or more field-value pairs of the first node profile, the endpoint profile specifying electronic activity driven targets that can be tracked by parsing electronic activities corresponding to the first node profile; store in one or more data structures, an association between the first node profile and the endpoint profile specifying the electronic activity driven targets; parse a plurality of electronic activities corresponding to the first node profile; and update a metric relating to the electronic activity driven targets responsive to parsing the second plurality of electronic activities.

Abstract: This disclosure relates to methods, systems, and storage media for generating a performance profile of a node profile. First electronic activities linked to a first node profile can be accessed. For each first electronic activity, a type of the first electronic activity can be determined. A feature extraction policy can be selected to generate a first feature array for the first electronic activity. The first feature array for the first electronic activity can be generated based on the type of the first electronic activity. A first performance profile of the first node profile can be generated for the time period by providing the generated first feature array for each first electronic activity to one or more models trained using second feature arrays corresponding to second electronic activities of second node profiles. An association between the first node profile and the first performance profile can be stored.

Abstract: The present disclosure relates to restricting generation and delivery of insights to data source providers. Electronic activities and record objects may be accessed. Each record object may correspond to a record object type and have one or more object field-value pairs. Node profiles may be maintained. Updates to a node graph or corresponding to a record object may be detected. A number of data source providers having respective electronic activities or record objects from which the update to the node graph or corresponding to the record object can be determined. Provisioning of a content item to a second data source provider may be restricted.

Abstract: The present disclosure relates to inferring a time zone of a node profile using electronic activities. A method can include accessing a plurality of electronic activities transmitted or received via a plurality of electronic accounts. The method can include identifying, for a node profile, a set of electronic activities sent from or received by an electronic account of the plurality of electronic accounts linked to the node profile within a time period. The method can include identifying, for each electronic activity of the set of electronic activities, a timestamp at which the electronic activity was sent or received. The method can include generating, for each of a plurality of time intervals within the time period, a temporal distribution of electronic activity based on respective timestamps of each electronic activity. The method can include determining a time zone of the node profile based on the temporal distribution.

Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.