Patents by Inventor Kavitha Chaturvedula

Kavitha Chaturvedula has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170212579
    Abstract: An apparatus for throttling traffic on a bus includes an electronic client device, a host device, and a bus protocol circuit connected between the electronic client device and the host device. Data transfers between the electronic client device and the host device are controlled by the bus protocol circuit by tracking credits. The bus protocol circuit is configured to throttle traffic between the electronic client device and the host device when signaled by a throttle signal from the electronic client device.
    Type: Application
    Filed: January 25, 2016
    Publication date: July 27, 2017
    Inventors: Anup S. Tirumala, John Jansen, Kavitha Chaturvedula, Suresh Babu Mv
  • Publication number: 20160216758
    Abstract: A storage device includes a storage medium, a transmit circuit, a receive circuit, power management means for turning off power to at least a portion of the transmit circuit when all host commands received by the receive circuit have been processed to retrieve data from the storage medium, and monitor means for monitoring host commands, and wherein the power management means does not turn off power to the monitor means when turning off power to other portions of the storage device.
    Type: Application
    Filed: January 27, 2015
    Publication date: July 28, 2016
    Inventors: Ramdas Prabhakar Kachare, Timothy Canepa, Anup S. Tirumala, Kavitha Chaturvedula
  • Patent number: 8001497
    Abstract: Disclosed is a method of replicating control signal sources, comprising: receiving a description of a functional block that comprises at least one of, a plurality of multiplexer structures, a plurality of memory blocks, and a combination of at least one multiplexer structure and at least one memory block; identifying a control signal that controls said at least one of, said plurality of multiplexer structures, said plurality of memory blocks, and said combination of at least one multiplexer structure and at least one memory block; and, determining a first replica control signal and a second replica control signal, said first replica control signal and said second replica control signal collectively functioning as said control signal to control said at least one of, said plurality of multiplexer structures, said plurality of memory blocks, and said combination of at least one multiplexer structure and at least one memory block.
    Type: Grant
    Filed: October 1, 2008
    Date of Patent: August 16, 2011
    Assignee: LSI Corporation
    Inventors: Randall P. Fry, Balamurugan Balasubramanian, Kavitha Chaturvedula
  • Patent number: 7895546
    Abstract: A method of statistical design closure is disclosed. The method generally includes the steps of (A) reading statistical data from a database, the statistical data defining a plurality of chip yield improvements, one of the chip yield improvements in each one of a plurality of design closure categories respectively, the chip yield improvements capturing historically trends based on a plurality of previous projects, (B) calculating a plurality of targets of a current design closure project based on the statistical data, one of the targets in each one of the design closure categories respectively and (C) generating a resource report to a user that indicates a plurality of resources expected to be used the current design closure project.
    Type: Grant
    Filed: September 4, 2007
    Date of Patent: February 22, 2011
    Assignee: LSI Corporation
    Inventors: Juergen K. Lahner, Balamurugan Balasubramanian, Kavitha Chaturvedula
  • Patent number: 7844929
    Abstract: A method of optimizing test code generation is disclosed. The method generally includes the steps of (A) reading from a database (i) a plurality of assertions, (ii) a testbench and (iii) a target code coverage all of a design under test, (B) generating together (i) a plurality of first test vectors to test the assertions and (ii) a plurality of second test vectors applicable to the testbench, (C) identifying one or more redundant test vector sets between the first test vectors and the second test vectors and (D) generating the test code to test the design under test on the testbench using a subset of the first test vectors and the second test vectors, the subset comprising single instances of the redundant test vector sets.
    Type: Grant
    Filed: May 8, 2008
    Date of Patent: November 30, 2010
    Assignee: LSI Corporation
    Inventors: Kavitha Chaturvedula, Juergen K. Lahner, Balamurugan Balasubramanian
  • Publication number: 20100217564
    Abstract: A method of physical simulation of an integrated circuit design comprising the steps of (A) reading design information for an integrated circuit from a computer readable storage medium, (B) reading library information and physical design information from the computer readable storage medium, (C) simulating the integrated circuit design based upon the library information and the physical design information using a computer, where the simulation of the integrated circuit design provides signoff accurate results and (D) determining whether the integrated circuit design meets one or more performance goals based upon results of the simulation of the integrated circuit design.
    Type: Application
    Filed: February 26, 2009
    Publication date: August 26, 2010
    Inventors: Juergen K. Lahner, Balamurugan Balasubramanian, Kavitha Chaturvedula
  • Publication number: 20100083195
    Abstract: Disclosed is a method of replicating control signal sources, comprising: receiving a description of a functional block that comprises at least one of, a plurality of multiplexer structures, a plurality of memory blocks, and a combination of at least one multiplexer structure and at least one memory block; identifying a control signal that controls said at least one of, said plurality of multiplexer structures, said plurality of memory blocks, and said combination of at least one multiplexer structure and at least one memory block; and, determining a first replica control signal and a second replica control signal, said first replica control signal and said second replica control signal collectively functioning as said control signal to control said at least one of, said plurality of multiplexer structures, said plurality of memory blocks, and said combination of at least one multiplexer structure and at least one memory block.
    Type: Application
    Filed: October 1, 2008
    Publication date: April 1, 2010
    Applicant: LSI CORPORATION
    Inventors: Randall P. Fry, Balamurugan Balasubramanian, Kavitha Chaturvedula
  • Publication number: 20090282307
    Abstract: A method of optimizing test code generation is disclosed. The method generally includes the steps of (A) reading from a database (i) a plurality of assertions, (ii) a testbench and (iii) a target code coverage all of a design under test, (B) generating together (i) a plurality of first test vectors to test the assertions and (ii) a plurality of second test vectors applicable to the testbench, (C) identifying one or more redundant test vector sets between the first test vectors and the second test vectors and (D) generating the test code to test the design under test on the testbench using a subset of the first test vectors and the second test vectors, the subset comprising single instances of the redundant test vector sets.
    Type: Application
    Filed: May 8, 2008
    Publication date: November 12, 2009
    Inventors: Kavitha Chaturvedula, Juergen K. Lahner, Balamurugan Balasubramanian
  • Patent number: 7594201
    Abstract: A method and computer program are disclosed for optimizing RTL code for an integrated circuit design that include steps of method of optimizing register transfer level code for an integrated circuit design comprising steps of receiving as input a first register transfer level code for the integrated circuit design and receiving as input criteria defining a critical multiplex structure. The first register transfer level code is analyzed to identify multiplex structures in the first register transfer level code. Each of the multiplex structures identified in the first register transfer level code is compared to the criteria defining a critical multiplex structure. Each of the multiplex structures identified in the first register transfer level code that satisfy the criteria defining a critical multiplex structure is entered in a list of critical multiplex structures. The list of critical multiplex structures is generated as output.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: September 22, 2009
    Assignee: LSI Corporation
    Inventors: Juergen Lahner, Kiran Atmakuri, Kavitha Chaturvedula
  • Publication number: 20090063564
    Abstract: A method of statistical design closure is disclosed. The method generally includes the steps of (A) reading statistical data from a database, the statistical data defining a plurality of chip yield improvements, one of the chip yield improvements in each one of a plurality of design closure categories respectively, the chip yield improvements capturing historically trends based on a plurality of previous projects, (B) calculating a plurality of targets of a current design closure project based on the statistical data, one of the targets in each one of the design closure categories respectively and (C) generating a resource report to a user that indicates a plurality of resources expected to be used the current design closure project.
    Type: Application
    Filed: September 4, 2007
    Publication date: March 5, 2009
    Inventors: Juergen K. Lahner, Balamurugan Balasubramanian, Kavitha Chaturvedula
  • Publication number: 20070079266
    Abstract: A method and computer program product analyzes an integrated circuit design to identify and resolve a problematic structure characterized by multiple rule violations uses a Design Closure Knowledge Base to generate a corrective action strategy in a Design Closure Guidance Report. In one embodiment, a method includes steps of receiving as input an integrated circuit design and a set of design rules, analyzing the integrated circuit design to identify design rule violations, and generating as output a compilation of each of the design rule violations and a corresponding list of primary and secondary objects in the integrated circuit design for each of the design rule violations.
    Type: Application
    Filed: September 30, 2005
    Publication date: April 5, 2007
    Inventors: Krishna Devineni, Juergen Lahner, Gregory Pierce, Balamurugan Balasubramanian, Srinivas Adusumalli, Kiran Atmakuri, Kavitha Chaturvedula, Randall Fry
  • Publication number: 20060282801
    Abstract: A method and computer program are disclosed for optimizing RTL code for an integrated circuit design that include steps of method of optimizing register transfer level code for an integrated circuit design comprising steps of receiving as input a first register transfer level code for the integrated circuit design and receiving as input criteria defining a critical multiplex structure. The first register transfer level code is analyzed to identify multiplex structures in the first register transfer level code. Each of the multiplex structures identified in the first register transfer level code is compared to the criteria defining a critical multiplex structure. Each of the multiplex structures identified in the first register transfer level code that satisfy the criteria defining a critical multiplex structure is entered in a list of critical multiplex structures. The list of critical multiplex structures is generated as output.
    Type: Application
    Filed: July 28, 2006
    Publication date: December 14, 2006
    Inventors: Juergen Lahner, Kiran Atmakuri, Kavitha Chaturvedula
  • Patent number: 7086015
    Abstract: A method and computer program are disclosed for optimizing RTL code for an integrated circuit design that include steps of: (a) receiving as input a first register transfer level code for an integrated circuit design; (b) receiving as input a user defined optimum multiplex structure; (c) analyzing the first register transfer level code to identify a critical multiplex structure; (d) partitioning the global multiplex structure into local multiplex structures each identical to the user defined optimum multiplex structure; and (e) generating as output a second register transfer level code for the integrated circuit design that replaces the global multiplex structure with the local multiplex structures.
    Type: Grant
    Filed: May 12, 2004
    Date of Patent: August 1, 2006
    Assignee: LSI Logic Corporation
    Inventors: Juergen Lahner, Kiran Atkmakuri, Kavitha Chaturvedula
  • Patent number: 7082584
    Abstract: A method of automatically analyzing RTL code includes receiving as input RTL code for an integrated circuit design. An RTL platform is selected that incorporates design rules for a vendor of the integrated circuit design. The design rules are displayed from the RTL platform on a graphic user interface. A number of the design rules are selected from the graphic user interface. An analysis is performed in the RTL platform of the RTL code for each of the selected design rules. A result of the analysis is generated as output for each of the selected design rules.
    Type: Grant
    Filed: April 30, 2003
    Date of Patent: July 25, 2006
    Assignee: LSI Logic Corporation
    Inventors: Juergen Lahner, Kiran Atmakuri, Kavitha Chaturvedula, Balamurugan Balasubramanian, Krishna Devineni, Srinivas Adusumalli, Randall P. Fry, Gregory A. Pierce
  • Publication number: 20050257180
    Abstract: A method and computer program are disclosed for optimizing RTL code for an integrated circuit design that include steps of: (a) receiving as input a first register transfer level code for an integrated circuit design; (b) receiving as input a user defined optimum multiplex structure; (c) analyzing the first register transfer level code to identify a critical multiplex structure; (d) partitioning the global multiplex structure into local multiplex structures each identical to the user defined optimum multiplex structure; and (e) generating as output a second register transfer level code for the integrated circuit design that replaces the global multiplex structure with the local multiplex structures.
    Type: Application
    Filed: May 12, 2004
    Publication date: November 17, 2005
    Inventors: Juergen Lahner, Kiran Atmakuri, Kavitha Chaturvedula
  • Publication number: 20040221249
    Abstract: A method of automatically analyzing RTL code includes steps for receiving as input RTL code for an integrated circuit design, selecting an RTL platform incorporating circuit design rules for a vendor of the integrated circuit design, displaying the design rules from the RTL platform on a graphic user interface, selecting a number of the design rules from the graphic user interface, performing an analysis in the RTL platform of the RTL code for each of the selected design rules, and generating as output a result of the analysis for each of the selected design rules.
    Type: Application
    Filed: April 30, 2003
    Publication date: November 4, 2004
    Inventors: Juergen Lahner, Kiran Atmakuri, Kavitha Chaturvedula, Balamurugan Balasubramanian, Krishna Devineni, Srinivas Adusumalli, Randall P. Fry, Gregory A. Pierce