Patents by Inventor Kaviyesh Doshi

Kaviyesh Doshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Time domain network analyzer
    Patent number: 9366743
    Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: June 14, 2016
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka
  • Method and apparatus for correction of time interleaved ADCs
    Patent number: 9231608
    Abstract: A method and apparatus is provided for on-the-fly calibration of and correction for time interleave error, including generation of correction data associated with an interleave corrector employed by a system for converting a time-domain input stream, corresponding to samples acquired from an interleaved system of digitizers having impairment due to interleave mismatch, to a time-domain output stream.
    Type: Grant
    Filed: July 16, 2015
    Date of Patent: January 5, 2016
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J Pupalaikis, Kaviyesh Doshi
  • Wavelet denoising for time-domain network analysis
    Patent number: 8843335
    Abstract: A method and apparatus are provided for the removal of significant broad-band noise from waveforms acquired for time domain network analysis. The method may include the steps of providing the noisy waveform as an input waveform, determining a frequency domain noise shape associated with the input waveform, calculating a wavelet domain noise shape from the frequency domain noise shape, calculating a discrete wavelet transform of the input waveform to form a wavelet domain waveform, and estimating the noise statistics from the wavelet domain waveform. A threshold may be calculated from the estimated noise statistics and the wavelet domain noise shape, and the threshold may be applied to the wavelet domain waveform to form a denoised wavelet domain waveform. Finally, an inverse discrete wavelet transform of the denoised wavelet domain waveform may be calculated to form a denoised waveform.
    Type: Grant
    Filed: September 27, 2010
    Date of Patent: September 23, 2014
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J. Pupalaikis, Anirudh Sureka, Kaviyesh Doshi
  • Time Domain Network Analyzer
    Publication number: 20140176156
    Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.
    Type: Application
    Filed: March 5, 2014
    Publication date: June 26, 2014
    Applicant: Teledyne LeCroy, Inc.
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka
  • Time domain network analyzer
    Patent number: 8706438
    Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: April 22, 2014
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka
  • Time domain reflectometry step to S-parameter conversion
    Patent number: 8706433
    Abstract: A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.
    Type: Grant
    Filed: January 31, 2011
    Date of Patent: April 22, 2014
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J Pupalaikis, Kaviyesh Doshi, Anirudh Sureka
  • Time Domain Reflectometry Step to S-Parameter Conversion
    Publication number: 20140098848
    Abstract: A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.
    Type: Application
    Filed: December 16, 2013
    Publication date: April 10, 2014
    Applicant: Teledyne LeCroy, Inc.
    Inventors: Peter Pupalaikis, Kaviyesh Doshi, Anirudh Sureka
  • Method for printed circuit board trace characterization
    Patent number: 8659315
    Abstract: A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.
    Type: Grant
    Filed: April 4, 2012
    Date of Patent: February 25, 2014
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J Pupalaikis, Kaviyesh Doshi
  • Method for de-embedding device measurements
    Patent number: 8566058
    Abstract: A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.
    Type: Grant
    Filed: April 6, 2009
    Date of Patent: October 22, 2013
    Assignee: Teledyne LeCroy, Inc.
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi
  • METHOD FOR PRINTED CIRCUIT BOARD TRACE CHARACTERIZATION
    Publication number: 20130265079
    Abstract: A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.
    Type: Application
    Filed: April 4, 2012
    Publication date: October 10, 2013
    Applicant: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi
  • TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION
    Publication number: 20110191046
    Abstract: A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.
    Type: Application
    Filed: January 31, 2011
    Publication date: August 4, 2011
    Applicant: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi, Anirudh Sureka
  • Wavelet Denoising for Time-Domain Network Analysis
    Publication number: 20110191047
    Abstract: A method and apparatus are provided for the removal of significant broadband noise from waveforms acquired for time domain network analysis.
    Type: Application
    Filed: September 27, 2010
    Publication date: August 4, 2011
    Applicant: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Anirudh Sureka, Kaviyesh Doshi
  • TIME DOMAIN NETWORK ANALYZER
    Publication number: 20110191054
    Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.
    Type: Application
    Filed: January 31, 2011
    Publication date: August 4, 2011
    Applicant: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka
  • Method for De-embedding Device Measurements
    Publication number: 20100256955
    Abstract: A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.
    Type: Application
    Filed: April 6, 2009
    Publication date: October 7, 2010
    Applicant: LeCroy Corporation
    Inventors: Peter J. Pupalaikis, Kaviyesh Doshi