Abstract: A wavelength division image measuring device that can divide a wideband incident light from a measurement object into a plurality of wavelengths with high selectivity to thereby measure these images simultaneously and collectively. Micro periodic irregular lattices are formed on a substrate 302. At this time, a plurality of microscopic element areas 101 with different lattice shapes and lattice periods are repeatedly arranged within a plane of the substrate 302. Next, a high refractive index material and a low refractive index material are alternately laid thereon so as to form a multilayer using a bias spatter method to thereby form a wavelength filter 301 with a photonic crystal structure. Thus, an array of the photonic crystal wavelength filters 031 with a sharp selectivity and different wavelength transmission characteristics can be obtained.