Abstract: A system and a method for determining sample preparation parameters for use in the preparation of metallographic samples with suitable sample preparation equipment; the system comprises first input means (4a) for inputting input values for a set of preparation criteria; first storage means (2, 6) adapted to store a plurality of preparation criteria and a plurality of sample preparation method parameters; processing means (3) adapted to calculate a set of sample preparation method parameters based on the input values and the stored sample preparation method parameters; output means (4a) for the output of the calculated set of sample preparation method parameters; second input means (4b) for receiving adapted sample preparation method parameters; and second storage means (2) adapted to store the adapted sample preparation method parameters for subsequent retrieval by the processing means in connection with a subsequent determination of sample preparation method parameters requested by an authorised operator.