Abstract: An apparatus and method is provided to accurately align a cap wafer relative to a microelectromechanical systems (MEMS) wafer during a bonding process. Other materials may be accurately aligned as well. A trench is established in the MEMS wafer, and a printed substance, secured to the cap wafer, flows into the trench when a pressure is applied to the cap wafer at bond temperature. Natural forces aid in shifting the materials into a lowest energy state and self-aligns the materials into a desired position. The trench also serves as a collection trench for the flowing substance by helping to shape the substance. The trench dimensions may be used to aid in creating a hermetic seal. The alignment tolerances required conventionally during the device design stage are decreased, since the present invention provides a repeatable and accurate alignment bonding process. Chip multiple is increased and therefore chip costs are decreased.

Abstract: A lidstock for a open sample container having a plurality of slits to form segment intersections that facilitate penetration by an aspiration probe, the segment intersections displaced from the location for penetration by the probe.