Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.

Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.