Patents by Inventor Kazuaki Uehara

Kazuaki Uehara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120223461
    Abstract: The present invention provides an imprinting device and an imprinting method which can uniformly apply pressure between a mold and a molding object and which can increase and decrease a temperature at a fast speed. An imprinting device is for transferring a pattern on a mold to a film molding object, and comprises a stage for holding the mold, a pressurizing-chamber casing which configures a pressurizing-chamber together with the molding object, sealing means which airtightly seals a space between the pressurizing-chamber casing and the molding object, opening and closing means which opens and closes the space between the pressurizing-chamber casing and the molding object, pressurizing means which adjusts atmospheric pressure in the pressurizing-chamber, heating means which heats either one of or both of the mold and the molding object, and degassing means which eliminates any gas present between the mold and the molding object.
    Type: Application
    Filed: May 15, 2012
    Publication date: September 6, 2012
    Applicant: SCIVAX CORPORATION
    Inventors: Yoshiaki Takaya, Yuji Hashima, Yoshihisa Hayashida, Hirosuke Kawaguchi, Satoru Tanaka, Akihiko Kanai, Kazuaki Uehara
  • Patent number: 8215944
    Abstract: The present invention provides an imprinting device and an imprinting method which can uniformly apply pressure between a mold and a molding object and which can increase and decrease a temperature at a fast speed. An imprinting device is for transferring a pattern on a mold to a film molding object and comprises a stage for holding the mold, a pressurizing-chamber casing which configures a pressurizing-chamber together with the molding object, sealing means which airtightly seals a space between the pressurizing-chamber casing and the molding object, opening and closing means which opens and closes the space between the pressurizing-chamber casing and the molding object, pressurizing means which adjusts atmospheric pressure in the pressurizing-chamber, heating means which heats either one of or both of the mold and the molding object, and degassing means which eliminates any gas present between the mold and the molding object.
    Type: Grant
    Filed: December 25, 2008
    Date of Patent: July 10, 2012
    Assignee: Scivax Corporation
    Inventors: Yoshiaki Takaya, Yuji Hashima, Yoshihisa Hayashida, Hirosuke Kawaguchi, Satoru Tanaka, Akihiko Kanai, Kazuaki Uehara
  • Publication number: 20110024948
    Abstract: The present invention provides an imprinting device and an imprinting method which can uniformly apply pressure between a mold and a molding object and which can increase and decrease a temperature at a fast speed. An imprinting device is for transferring a pattern on a mold to a film molding object, and comprises a stage for holding the mold, a pressurizing-chamber casing which configures a pressurizing-chamber together with the molding object, sealing means which airtightly seals a space between the pressurizing-chamber casing and the molding object, opening and closing means which opens and closes the space between the pressurizing-chamber casing and the molding object, pressurizing means which adjusts atmospheric pressure in the pressurizing-chamber, heating means which heats either one of or both of the mold and the molding object, and degassing means which eliminates any gas present between the mold and the molding object.
    Type: Application
    Filed: December 25, 2008
    Publication date: February 3, 2011
    Applicant: SCIVAX CORPORATION
    Inventors: Yoshiaki Takaya, Yuji Hashima, Yoshihisa Hayashida, Hirosuke Kawaguchi, Satoru Tanaka, Akihiko Kanai, Kazuaki Uehara
  • Patent number: 6989587
    Abstract: There is provided a semiconductor device with enhanced reliability having a heat sink mounting a plurality of semiconductor chips, a plurality of inner leads connected electrically to the semiconductor chips, a molding body for resin molding the plurality of semiconductor chips and the plurality of inner leads, a plurality of wires for providing electrical connections between the respective electrodes of the semiconductor chips and the inner leads corresponding thereto, and wide outer leads connecting to the inner leads and exposed outside the molding body. A plurality of slits are formed in the respective portions of the outer leads located outside the molding body to extend lengthwise in directions in which the outer leads are extracted. This achieves a reduction in lead stress which is placed on the outer leads by thermal stress or the like after the mounting of a MOSFET and thereby enhances the reliability of the MOSFET.
    Type: Grant
    Filed: December 9, 2003
    Date of Patent: January 24, 2006
    Assignees: Renesas Technology Corp., Renesas Esatern Japan Semiconductor, Inc.
    Inventors: Mamoru Ito, Akira Muto, Tomio Yamada, Tsuneo Endoh, Satoru Konishi, Kazuaki Uehara, Tsutomu Ida, Koji Odaira, Hirokazu Nakajima
  • Publication number: 20040113248
    Abstract: There is provided a semiconductor device with enhanced reliability having a heat sink mounting a plurality of semiconductor chips, a plurality of inner leads connected electrically to the semiconductor chips, a molding body for resin molding the plurality of semiconductor chips and the plurality of inner leads, a plurality of wires for providing electrical connections between the respective electrodes of the semiconductor chips and the inner leads corresponding thereto, and wide outer leads connecting to the inner leads and exposed outside the molding body. A plurality of slits are formed in the respective portions of the outer leads located outside the molding body to extend lengthwise in directions in which the outer leads are extracted. This achieves a reduction in lead stress which is placed on the outer leads by thermal stress or the like after the mounting of a MOSFET and thereby enhances the reliability of the MOSFET.
    Type: Application
    Filed: December 9, 2003
    Publication date: June 17, 2004
    Inventors: Mamoru Ito, Akira Muto, Tomio Yamada, Tsuneo Endoh, Satoru Konishi, Kazuaki Uehara, Tsutomu Ida, Koji Odaira, Hirokazu Nakajima