Abstract: According to one embodiment, a solid-state imaging device includes a pixel array and AD converting unit. In the AD converting unit, a plurality of AD converts are arranged in a horizontal direction. The pixel is configured by a small pixel group. The small pixel group is formed of a plurality of small pixels. The plurality of small pixels read out the signal charges. The small pixel group includes two or more small pixels having different optical sensitivities. The solid-state imaging device includes N AD converting units. N is the number of small pixel groups which are arranged in a vertical direction at every small pixel. N is an integer of 2 or higher.

Abstract: An imaging sensor comprises a pixel array having an active imaging portion and a shielded portion. The active imaging portion provides an image signal corresponding to light incident on the pixel array. The shielded portion is shielded from the light incident on the pixel array and therefore provides a dark current signal. The imaging sensor includes a black-level adjustment circuit which adjusts the imaging signal to compensate for variations in the imaging signal black-level values. The black-level adjustment circuit includes an average value calculator to calculate an average signal value for each of a plurality of shielded regions in the shielded portion of the pixel array. A region selector is configured to select average signal values that are within a predetermined range. A black-level adjustment value calculator uses the selected values to calculate an adjustment value for the black-level of the image signal.

Abstract: An imaging sensor comprises a pixel array having an active imaging portion and a shielded portion. The active imaging portion provides an image signal corresponding to light incident on the pixel array. The shielded portion is shielded from the light incident on the pixel array and therefore provides a dark current signal. The imaging sensor includes a black-level adjustment circuit which adjusts the imaging signal to compensate for variations in the imaging signal black-level values. The black-level adjustment circuit includes an average value calculator to calculate an average signal value for each of a plurality of shielded regions in the shielded portion of the pixel array. A region selector is configured to select average signal values that are within a predetermined range. A black-level adjustment value calculator uses the selected values to calculate an adjustment value for the black-level of the image signal.

Abstract: According to one embodiment, a solid-state imaging device includes an effective pixel portion in which effective pixels are provided, a light-shielded pixel portion in which light-shielded pixels are provided, an ADC circuit that performs an AD conversion operation for signal components read from the effective pixel and the light-shielded pixel, on the basis of a result of a comparison with a reference voltage on which a clamping voltage is superimposed, and an AD clamping circuit that calculates a clamping voltage for a target value of a black level read from the light-shielded pixel by extrapolating a relation between the clamping voltage and an AD-converted value of the black level read from the light-shielded pixel at the time when the clamping voltage is applied.

Abstract: According to one embodiment, there is provided an analog gain range determining unit that determines a range to which an analog gain setting an amplification factor of a pixel signal read from a pixel belongs, a clamp parameter control condition setting unit that sets a control condition of a clamp parameter setting the black level based on a result of the determination by the analog gain range determining unit, and a clamp parameter control unit that controls the clamp parameter based on the control condition set by the clamp parameter control condition setting unit.

Abstract: According to one embodiment, a solid-state imaging device includes a VOB region, an effective pixel region, a comparator, a holder, and a drive controller. The effective pixel region outputs the reset signal, and an image signal to the vertical signal line. The comparator compares the reset signal transferred from the VOB region through the vertical signal line with a reference signal, and determining whether the reset signal is within a digital level range. The holder is capable of holding either a value representing a first result or a value representing a second result, according to a determination result of the comparator. The drive controller varies a pulse timing period according to the value held by the holder, and automatically sets the period when the reset signal is read from the effective pixel region to the vertical signal line. A voltage of the vertical signal line is clamped in the period.

Abstract: According to one embodiment, a solid-state imaging device includes a pixel array and AD converting unit. In the AD converting unit, a plurality of AD converts are arranged in a horizontal direction. The pixel is configured by a small pixel group. The small pixel group is formed of a plurality of small pixels. The plurality of small pixels read out the signal charges. The small pixel group includes two or more small pixels having different optical sensitivities. The solid-state imaging device includes N AD converting units. N is the number of small pixel groups which are arranged in a vertical direction at every small pixel. N is an integer of 2 or higher.

Abstract: According to one embodiment, there is provided an analog gain range determining unit that determines a range to which an analog gain setting an amplification factor of a pixel signal read from a pixel belongs, a clamp parameter control condition setting unit that sets a control condition of a clamp parameter setting the black level based on a result of the determination by the analog gain range determining unit, and a clamp parameter control unit that controls the clamp parameter based on the control condition set by the clamp parameter control condition setting unit.

Abstract: According to one embodiment, a solid-state imaging device includes an effective pixel portion in which effective pixels are provided, a light-shielded pixel portion in which light-shielded pixels are provided, an ADC circuit that performs an AD conversion operation for signal components read from the effective pixel and the light-shielded pixel, on the basis of a result of a comparison with a reference voltage on which a clamping voltage is superimposed, and an AD clamping circuit that calculates a clamping voltage for a target value of a black level read from the light-shielded pixel by extrapolating a relation between the clamping voltage and an AD-converted value of the black level read from the light-shielded pixel at the time when the clamping voltage is applied.

Abstract: According to one embodiment, a solid-state imaging device includes a VOB region, an effective pixel region, a comparator, a holder, and a drive controller. The effective pixel region outputs the reset signal, and an image signal to the vertical signal line. The comparator compares the reset signal transferred from the VOB region through the vertical signal line with a reference signal, and determining whether the reset signal is within a digital level range. The holder is capable of holding either a value representing a first result or a value representing a second result, according to a determination result of the comparator. The drive controller varies a pulse timing period according to the value held by the holder, and automatically sets the period when the reset signal is read from the effective pixel region to the vertical signal line. A voltage of the vertical signal line is clamped in the period.