Abstract: A semiconductor device test circuit includes a data producing unit to produce first test data to be fed into a semiconductor device, and expected value data; a first data retaining unit to retain the first test data, and feed the first test data into the semiconductor device; a second data retaining unit to retain the expected value data; a comparison unit to compare output data outputted through the first data retaining unit and the expected value data outputted from the second data retaining unit to supply data indicating comparison result between the output data and the expected value data; and a switching unit to switch the data fed into the second data retaining unit between the expected value data and the output data, wherein the first data retaining unit and the second data retaining unit form parts of a scan chain into which second test data may externally be fed.

Abstract: A semiconductor device test circuit includes a data producing unit to produce first test data to be fed into a semiconductor device, and expected value data; a first data retaining unit to retain the first test data, and feed the first test data into the semiconductor device; a second data retaining unit to retain the expected value data; a comparison unit to compare output data outputted through the first data retaining unit and the expected value data outputted from the second data retaining unit to supply data indicating comparison result between the output data and the expected value data; and a switching unit to switch the data fed into the second data retaining unit between the expected value data and the output data, wherein the first data retaining unit and the second data retaining unit form parts of a scan chain into which second test data may externally be fed.

Abstract: A data processing device includes a cache memory, a load buffer primary (LBP) for storing 1-line instruction data including an instruction requested to be transmitted by an instruction processing unit and transmitted from a main storage or a secondary cache memory, and a load buffer secondary (LBS) for storing 1-line instruction data preceded by the above described 1-line data. With this configuration, the device may determine the validity of prefetched data in the LBP using lower order bits of the addresses of the data. If the data are determined to be valid, the data stored in the LBS are stored in the cache memory. A cache storage device, hierarchically provided between a central processing unit a n d a main storage device, includes a cache memory, a storage buffer, a write-in buffer and a cache storage control unit. The cache storage device fast writes storage data into a write-in buffer instead of directly into cache memory.