Patents by Inventor Kazuhiko Miura

Kazuhiko Miura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5710584
    Abstract: An ink jet recording head formed by laminating and fixing: a flow path forming plate having through holes for defining pressure producing chambers, ink supply inlets, and a common ink chamber, a nozzle plate having nozzle openings communicating with the pressure producing chambers, and a vibration plate having diaphragm portions that are resiliently deformed in response to displacement of piezoelectric vibration elements one upon another with an adhesive so as to be watertight. The vibration plate has frame-like thick wall portions that extend as far as to the ink supply inlet side of the pressure producing chamber as well as to the inner side of the nozzle opening, and portions closer to a piezoelectric vibration element than to both ends of the pressure producing chamber are made to be supported by a base. As a result of this construction, a nonsupported region of the pressure producing chamber can be shortened, which in turn improves the rigidity of a substrate unit as a whole.
    Type: Grant
    Filed: November 29, 1994
    Date of Patent: January 20, 1998
    Assignee: Seiko Epson Corporation
    Inventors: Kazunaga Suzuki, Minoru Usui, Noriaki Okazawa, Kazuhiko Miura, Takahiro Naka
  • Patent number: 5604522
    Abstract: An ink jet head for forcibly discharging ink droplets 6a through nozzle openings 13a in a manner that a pressure of ink 6 within an ink chamber 22 is increased by displacing a vibrating plate 20 constituting a part of the ink chamber 22 by a piezoelectric transducer 1, in which said vibrating plate 20 is formed of a high polymeric resin thin film 20a and rigid protrusions 20b directly fastened to said high polymeric resin thin film 20b.
    Type: Grant
    Filed: April 14, 1994
    Date of Patent: February 18, 1997
    Assignee: Seiko Epson Corporation
    Inventors: Kazuhiko Miura, Toshio Narita
  • Patent number: 4912975
    Abstract: In a direct-heated flow measuring apparatus including a substrate having a film resistance pattern and a supporting member for supporting the substrate, the supporting member has good heat dissipation characteristics. Provided between the substrate and the supporting member is a heat transfer throttling portion.
    Type: Grant
    Filed: January 25, 1989
    Date of Patent: April 3, 1990
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
  • Patent number: 4870860
    Abstract: In a direct-heated flow measuring apparatus including a substrate having a film resistance pattern and a supporting member for supporting the substrate, the supporting member has good heat dissipation characteristics. Provided between the substrate and the supporting member is a heat transfer throttling portion.
    Type: Grant
    Filed: February 25, 1988
    Date of Patent: October 3, 1989
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
  • Patent number: 4843882
    Abstract: In a direct-heated flow measuring apparatus including a film resistor having a substrate supported by a supporting member in a passage, at least one face of the substrate on the upstream side thereof is sloped with respect to a fluid stream within the passage.
    Type: Grant
    Filed: July 25, 1988
    Date of Patent: July 4, 1989
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Michitoshi Onoda, Kazuhiko Miura, Seizi Huzino, Tadashi Hattori, Kenji Kanehara, Masanori Fukutani
  • Patent number: 4833912
    Abstract: A flow measuring apparatus includes a resistance layer for detecting a flow rate within a passage and an additional resistance layer for burning off deposits formed by suspended particles the like, and both of the resistance layers are formed on only one substrate. When suspended particles are deposited on the substrate to form deposits thereon, the deposits are burned off and removed from the substrate by supplying power to the additional resistance layer.
    Type: Grant
    Filed: January 19, 1988
    Date of Patent: May 30, 1989
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Michitoshi Onoda, Kazuhiko Miura, Tadashi Hattori
  • Patent number: 4785662
    Abstract: A direct-heated gas-flow measuring apparatus including a measuring tube disposed in the gas stream, a film resistor for generating heat and detecting the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Provided at least at the upstream side of the film resistor near thereto is a shield for reducing the accumulation of deposits on the film resistor. The shield and the film resistor have substantially the same thickness to satisfy the condition:l/t.ltoreq.50where l is a distance therebetween and t is a thickness thereof.
    Type: Grant
    Filed: November 12, 1986
    Date of Patent: November 22, 1988
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
  • Patent number: 4783996
    Abstract: A direct-heated flow measuring apparatus including a substrate, a film resistor for generating heat and sensing its temperature, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Also, provided in the substrate is an aperture or the like for throttling the heat transfer of the film resistor. Further, a reinforced structure is formed on the part of substrate where the aperture or the like is formed.
    Type: Grant
    Filed: January 30, 1986
    Date of Patent: November 15, 1988
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Michitoshi Onoda, Yukio Iwasaki, Tadashi Hattori
  • Patent number: 4761995
    Abstract: In a direct-heated flow measuring apparatus including a thin-plate sensing element supported by a supporting member in a passage, a sensing portion for generating heat and detecting the temperature thereof is positioned on the downstream side of the sensing element with respect to a fluid stream.
    Type: Grant
    Filed: May 5, 1987
    Date of Patent: August 9, 1988
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Michitoshi Onoda, Tadashi Hattori
  • Patent number: 4756190
    Abstract: In a direct-heated flow measuring apparatus including a film resistor having a substrate and a resistance layer thereon, the substrate is supported by a supporting member in a passage. Provided between the substrate and the supporting member is an adiabatic member for enhancing the adiabatic effect of the resistance layer. The substrate is adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member, and the supporting member is also adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member.
    Type: Grant
    Filed: August 8, 1986
    Date of Patent: July 12, 1988
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Michitoshi Onoda, Kazuhiko Miura, Seizi Huzino, Tadashi Hattori
  • Patent number: 4735099
    Abstract: A direct-heated gas-flow measuring apparatus including a measuring tube disposed in the gas stream, a film resistor for generating heat and detecting the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Provided in a supporting portion of the film resistor for supporting it to the measuring tube is an aperture for throttling the heat transfer thereof.
    Type: Grant
    Filed: November 24, 1986
    Date of Patent: April 5, 1988
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
  • Patent number: 4705713
    Abstract: A film resistor for a flow measuring apparatus including: a substrate; a first insulating layer on the substrate; a platinum (Pt) pattern on the first insulating layer; and a second insulating layer on the platinum pattern. A titanium dioxide (TiO.sub.2) layer is provided between each of the first and second insulating layers and the platinum pattern.
    Type: Grant
    Filed: February 11, 1986
    Date of Patent: November 10, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Michitoshi Onoda, Yukio Iwasaki, Tadashi Hattori
  • Patent number: 4693116
    Abstract: A gas-flow measuring apparatus including a semiconductor chip and a sensing circuit. The semiconductor chip includes an electric heater and two temperature-detecting elements. One of the temperature-detecting elements is located closer to the heater than the other. The sensing circuit generates voltage in response to the flow rate of gas flowing through a gas passage.
    Type: Grant
    Filed: November 27, 1985
    Date of Patent: September 15, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Kazuhiko Miura, Tadashi Hattori, Yukio Iwasaki, Tokio Kohama, Kenji Kanehara
  • Patent number: 4688425
    Abstract: In a direct-heated flow measuring apparatus including an electric heater of a film resistor type and a temperature-detecting resistor for detecting the temperature within a passage, the flow rate thereof is measured by a sensing circuit. The temperatures of the electric heater and the temperature of the temperature-detecting resistor are compared. The measuring operation of the sensing circuit is stopped when the temperature within the passage is abnormal as indicated by this comparison.
    Type: Grant
    Filed: February 19, 1986
    Date of Patent: August 25, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Kenji Kanehara, Seizi Huzino, Kazuhiko Miura, Minoru Ohta
  • Patent number: 4682496
    Abstract: A semiconductor type flow rate detecting apparatus having first and second control units arranged at upstream and downstream positions respectively in a flow stream to be measured and an operation circuit. The first control unit includes a first temperature detecting element and a first temperature control heater. The second control unit includes a second temperature detecting element, a second temperature control heater and a preliminary heater. The operation circuit controls the second and preliminary heaters and generates a signal indicative of flow rate. The operation circuit has a constant power consumption circuit to control heat from the preliminary heater to a constant level.
    Type: Grant
    Filed: January 10, 1985
    Date of Patent: July 28, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Kazuhiko Miura, Tadashi Hattori, Yukio Iwasaki, Tokio Kohama, Kenji Kanehara
  • Patent number: 4677850
    Abstract: In a semiconductor-type flow rate detecting apparatus, a casing arranged in the fluid path includes first and second semiconductor chips. The first semiconductor chip has a first temperature detector. The second semiconductor chip arranged in proximity to the first semiconductor chip has a heater and a second temperature detector.
    Type: Grant
    Filed: March 21, 1986
    Date of Patent: July 7, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Kazuhiko Miura, Tadashi Hattori, Yukio Iwasaki, Tokio Kohama, Kenji Kanehara
  • Patent number: 4673416
    Abstract: An air cleaning apparatus having an electrical dust collecting section has discharge electrodes, electrical field forming electrodes arranged parallel to the flow of charged particles, and dust collecting electrodes each of which is arranged between corresponding two adjacent electrical field forming electrodes to be parallel thereto. One high voltage power source is arranged to generate a potential difference between the discharge electrodes and the dust collecting electrodes. Another high voltage power source is arranged to generate a potential difference between the electrical field forming electrodes and the dust collecting electrodes. Negative electrodes consisting of either the electrical field forming electrodes or the dust collecting electrodes are covered by insulator members.
    Type: Grant
    Filed: June 12, 1986
    Date of Patent: June 16, 1987
    Assignees: Nippondenso Co., Ltd., Nippon Soken, Inc.
    Inventors: Nobuyoshi Sakakibara, Tadashi Hattori, Kazuhiko Miura, Hiroki Noguchi, Akira Fukami, Teiichi Nabeta
  • Patent number: 4643745
    Abstract: An air cleaner has a discharge electrode member, an intermediate electrode member, and a counter electrode member disposed opposed and spaced apart from each other. A voltage source is connected between the discharge member and the intermediate member for generating ionic wind. A further voltage source is connected between the intermediate member and the counter member for accelerating the ionic wind such that the gradient direction of the electric field between the discharge member and the intermediate member is identical to that between the intermediate member and the counter member.
    Type: Grant
    Filed: December 17, 1984
    Date of Patent: February 17, 1987
    Assignee: Nippon Soken, Inc.
    Inventors: Nobuyoshi Sakakibara, Tadashi Hattori, Kazuhiko Miura, Hiroki Noguchi, Akira Fukami, Teiichi Nabeta
  • Patent number: 4627279
    Abstract: A direct-heated gas-flow measuring apparatus for a passage including a plurality of film resistors, disposed within the passage, for generating heat and measuring the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistors so that the temperature of each of the film resistors is a predetermined value. The feedback control circuit generates a plurality of output signals corresponding to voltages applied to the film resistors. A mean value for the plurality of output signals is calculated as the amount of gas-flow rate.
    Type: Grant
    Filed: May 2, 1985
    Date of Patent: December 9, 1986
    Assignee: Nippon Soken, Inc.
    Inventors: Minoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
  • Patent number: 4616502
    Abstract: In a knocking detection system for an internal combustion engine, a knocking is detected by a vibration sensor the output level of which is changed by controlling the sensor excitation current. The excitation current is controlled in dependence upon the output of the sensor, engine speed or load conditions or the like so that the output noise level of the sensor is maintained substantially constant regardless of engine operating conditions.
    Type: Grant
    Filed: September 20, 1983
    Date of Patent: October 14, 1986
    Assignee: Nippon Soken, Inc.
    Inventors: Yoshinori Ootsuka, Tadashi Hattori, Tadashi Ozaki, Kazuhiko Miura