Patents by Inventor Kazuhiro Koizumi

Kazuhiro Koizumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11073815
    Abstract: To provide a collection device, a collection method, and a collection program capable of making detailed data in the past available for viewing according to demand while reducing the volume of communication data in a usual state. A collection device comprises: an acquisition unit that acquires state data about a machine in a predetermined cycle; a first transmission unit that transmits partial data belonging to the state data and matching a first condition set in advance to a management server; a storage unit that stores state data not having been transmitted from the first transmission unit to the management server; and a second transmission unit that, in response to a first command including designation of a time in the past, transmits state data from the designated time onward stored in the storage unit to the management server.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: July 27, 2021
    Assignee: FANUC CORPORATION
    Inventor: Kazuhiro Koizumi
  • Patent number: 11022534
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: June 1, 2021
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Bo Li, Yoshiki Hasegawa, Kazuhiro Koizumi, Yu Kawamura
  • Patent number: 10747199
    Abstract: An operation management device includes: a machining program information acquisition unit acquiring information related to machining program executed in the machine tool; a signaling information acquisition unit acquiring signaling information related to signals detected during execution of the machining programs in the machine tool; and an associated-information creation unit associating the information related to the machining program with the signaling information; and a search/display unit displaying the information related to the machining program and the signaling information, which are associated by the associated-information creation unit.
    Type: Grant
    Filed: September 27, 2018
    Date of Patent: August 18, 2020
    Assignee: FANUC CORPORATION
    Inventors: Yasumasa Okamura, Kazuhiro Koizumi
  • Publication number: 20200185893
    Abstract: A panelboard device according to an embodiment includes a housing and multiple devices stored in the housing. At least one of the multiple devices includes a device main unit; a state detecting unit configured to detect a state of the device main unit; a light emitting unit; and a light emission control unit configured to acquire information indicating the state of the device main unit from the state detecting unit, and to cause the light emitting unit to transmit an optical signal including information indicating the state.
    Type: Application
    Filed: November 27, 2019
    Publication date: June 11, 2020
    Inventors: Satoshi YAMAZAKI, Satoshi MACHIDA, Kazuhiro KOIZUMI, Nobuya SUZUKI
  • Patent number: 10677719
    Abstract: In gas analyzing apparatuses, interference noises should be reduced. A gas analyzing apparatus for analyzing component included in measuring object gas, including: a light emitting unit to irradiate laser light to the measuring object gas; a light receiving unit to receive the laser light having passed through the measuring object gas; an actuating unit to change an optical path length of the laser light by moving at least one optical element that is arranged in a light path where the laser light is passing; and a calculating unit to calculate concentration of the measuring object gas, based on signals detected by the light receiving unit in two states where the optical element is at different positions by n/2 times the wavelength of the laser light (where, n is integer) is provided.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: June 9, 2020
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yu Taniguchi, Kazuhiro Koizumi, Hojun Yamauchi
  • Publication number: 20190294143
    Abstract: To provide a collection device, a collection method, and a collection program capable of making detailed data in the past available for viewing according to demand while reducing the volume of communication data in a usual state. A collection device comprises: an acquisition unit that acquires state data about a machine in a predetermined cycle; a first transmission unit that transmits partial data belonging to the state data and matching a first condition set in advance to a management server; a storage unit that stores state data not having been transmitted from the first transmission unit to the management server; and a second transmission unit that, in response to a first command including designation of a time in the past, transmits state data from the designated time onward stored in the storage unit to the management server.
    Type: Application
    Filed: February 21, 2019
    Publication date: September 26, 2019
    Inventor: Kazuhiro KOIZUMI
  • Patent number: 10378416
    Abstract: It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: August 13, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Ryoichi Higashi, Masaya Tabaru, Kazuhiro Koizumi, Michiyasu Okada, Kozo Akao
  • Publication number: 20190195784
    Abstract: In gas analyzing apparatuses, interference noises should be reduced. A gas analyzing apparatus for analyzing component included in measuring object gas, including: a light emitting unit to irradiate laser light to the measuring object gas; a light receiving unit to receive the laser light having passed through the measuring object gas; an actuating unit to change an optical path length of the laser light by moving at least one optical element that is arranged in a light path where the laser light is passing; and a calculating unit to calculate concentration of the measuring object gas, based on signals detected by the light receiving unit in two states where the optical element is at different positions by n/2 times the wavelength of the laser light (where, n is integer) is provided.
    Type: Application
    Filed: October 23, 2018
    Publication date: June 27, 2019
    Inventors: Yu TANIGUCHI, Kazuhiro KOIZUMI, Hojun YAMAUCHI
  • Patent number: 10302610
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: May 28, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Yoshiki Hasegawa, Kazuhiro Koizumi, Bo Li
  • Patent number: 10302564
    Abstract: A water quality analyzer for analyzing sample water. The water quality analyzer includes an excitation light irradiating optical system configured to irradiate the sample water with first light, a component in the sample water being excited by the first light to emit fluorescence, a scattered light irradiating optical system configured to irradiate the sample water with second light, the second light being scattered by microparticles in the sample water to form the scattered light, a fluorescence detecting optical system configured to detect a portion of the second light that has passed through the sample water, and to detect the emitted fluorescence, and a scattered light detecting optical system configured to detect a portion of the first light that has passed through the sample water, and to detect the scattered light.
    Type: Grant
    Filed: May 1, 2018
    Date of Patent: May 28, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi
  • Patent number: 10283337
    Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: May 7, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
  • Publication number: 20190094835
    Abstract: An operation management device includes: a machining program information acquisition unit acquiring information related to machining program executed in the machine tool; a signaling information acquisition unit acquiring signaling information related to signals detected during execution of the machining programs in the machine tool; and an associated-information creation unit associating the information related to the machining program with the signaling information; and a search/display unit displaying the information related to the machining program and the signaling information, which are associated by the associated-information creation unit.
    Type: Application
    Filed: September 27, 2018
    Publication date: March 28, 2019
    Inventors: Yasumasa OKAMURA, Kazuhiro KOIZUMI
  • Publication number: 20180292302
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Application
    Filed: February 22, 2018
    Publication date: October 11, 2018
    Inventors: Naoki TAKEDA, Bo LI, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Yu KAWAMURA
  • Publication number: 20180246035
    Abstract: A water quality analyzer for analyzing sample water. The water quality analyzer includes an excitation light irradiating optical system configured to irradiate the sample water with first light, a component in the sample water being excited by the first light to emit fluorescence, a scattered light irradiating optical system configured to irradiate the sample water with second light, the second light being scattered by microparticles in the sample water to form the scattered light, a fluorescence detecting optical system configured to detect a portion of the second light that has passed through the sample water, and to detect the emitted fluorescence, and a scattered light detecting optical system configured to detect a portion of the first light that has passed through the sample water, and to detect the scattered light.
    Type: Application
    Filed: May 1, 2018
    Publication date: August 30, 2018
    Applicant: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi
  • Patent number: 10061034
    Abstract: A signal processing device (1) includes a noise generator (11) configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder (12) configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit (13) configured to perform threshold processing on the noise-added signal; an evaluating circuit (20) configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit (31) configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: August 28, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yasuyuki Masunaga, Takamasa Asano, Kazuhiro Koizumi
  • Patent number: 10012628
    Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: July 3, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi, Takamasa Asano, Naoki Takeda
  • Patent number: 9983317
    Abstract: A signal processing device for detecting a weak signal in an input signal. The device includes first and second pulse detectors and a determining circuit. The first pulse detector adds noise to the input signal, and processes the noise-added signal using a first threshold, to thereby output a first signal having a first pulse waveform component, which corresponds to an interval in which a level of the noise-added input signal exceeds the first threshold. The second pulse detector receives the input signal in parallel with the first pulse detector, and processes the input signal using a second threshold, to thereby output a second signal having a second pulse waveform component, which corresponds to an interval in which a level of the input signal exceeds the second threshold. The determining circuit determines whether each of the first and second pulse waveform components conforms to the weak signal.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: May 29, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yasuyuki Masunaga, Takamasa Asano, Kazuhiro Koizumi
  • Patent number: 9857282
    Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 2, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano
  • Patent number: 9851292
    Abstract: A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.
    Type: Grant
    Filed: June 9, 2016
    Date of Patent: December 26, 2017
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Masaya Tabaru, Naoki Takeda, Kazuhiro Koizumi, Noritomo Hirayama
  • Publication number: 20170315105
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Application
    Filed: April 24, 2017
    Publication date: November 2, 2017
    Inventors: Naoki TAKEDA, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Bo LI