Patents by Inventor Kazuhisa Machida

Kazuhisa Machida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7433506
    Abstract: A display method for a magnetic field measuring apparatus which includes detecting a magnetic field generated from a biotest sample by a plurality of magnetic sensors and displaying measurement data obtained on the basis of the detected magnetic field in any display mode, which further comprises displaying an operating information display screen, the operating information display screen having a processing function display section selecting an operation menu including a biotest sample list, data measurement or data analysis; a biotest information display section; and a data display area.
    Type: Grant
    Filed: March 14, 2007
    Date of Patent: October 7, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Publication number: 20070154077
    Abstract: A display method for a magnetic field measuring apparatus which includes detecting a magnetic field generated from a biotest sample by a plurality of magnetic sensors and displaying measurement data obtained on the basis of the detected magnetic field in any display mode, which further comprises displaying an operating information display screen, the operating information display screen having a processing function display section selecting an operation menu including a biotest sample list, data measurement or data analysis; a biotest information display section; and a data display area.
    Type: Application
    Filed: March 14, 2007
    Publication date: July 5, 2007
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Patent number: 7194121
    Abstract: A biomagnetic field map display apparatus for measuring a biomagnetic field generated by a biotest sample at positions arranged in rows and columns and displaying a magnetic field map obtained by processing the measured biomagnetic field. An analysis data display area waveform-displays the measured biomagnetic field at channels in a row or a column of channels which are arranged in rows and columns so as to respectively correspond to the positions. A particular channel is designated as a reference channel for an averaging process out of the plurality of channels or different channels therefrom at which different biosignals from those of the biomagnetic field are acquired from the biotest sample. Means for averaging-processing the measured biomagnetic field using the designated particular channel as the reference channel displays in the analysis data display area a map on the averaging-processed biomagnetic field.
    Type: Grant
    Filed: February 4, 2004
    Date of Patent: March 20, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Patent number: 6968079
    Abstract: The present invention relates to an inspection device and inspection method of a specimen, particularly to the inspection device and inspection method of defects of semiconductor wafers, and the object is to cope with the increase of inspection images and provide an inspection device and inspection method which is capable of classification by sub class, meeting the user needs, in addition to the automatic classification by an inspection device.
    Type: Grant
    Filed: June 25, 2001
    Date of Patent: November 22, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Akira Yoshikawa, Kazuhisa Machida, Hitoshi Komuro, Takehiro Hirai, Katsuhiro Kitahashi
  • Patent number: 6961605
    Abstract: A method for processing biomagnetic fields generated by biocurrents resulting from activities of human brain or myocardia and its mapping apparatus are provided, which features biomagnetic measurement and its analysis, magnetic field mapping and its imaging and their waveform generation by a simple operation. Biomagnetic fields emitted from the patient are measured at a plurality of measurement positions, and a contour map of magnetic field obtained as a result of processing of these measured biomagnetic fields is imaged in the magnetic contour map display apparatus, which display apparatus comprises: the process function display area indicating process function items including measurement; and the analysis data display area which displays the waveform together with a designated measurement time, the waveform being generated during measurement at least based on the measured biomagnetic fields and during the designated measurement period of time.
    Type: Grant
    Filed: October 30, 2001
    Date of Patent: November 1, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Hiroyuki Suzuki, Keiji Tsukada, Kazuhisa Machida, Takafumi Kawasaki
  • Patent number: 6919564
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: July 19, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi, Kohichi Hayakawa, Maki Ito
  • Patent number: 6903821
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: June 7, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi, Kohichi Hayakawa, Maki Ito
  • Patent number: 6868308
    Abstract: An operation guidance method of clinical system which enables a doctor or nurse unskilled in testing to operate the clinical system without operation error by providing operation guidance. In the system, an initial screen shows numerals 1 to 5 indicating the order of procedure of sample test and character information indicating the contents of works (1 confirmation of sample, 2 confirmation of request, 3 feeding samples, 4 confirmation of result and 5 finish) as contents displayed in an operation menu. When an operator selects a “start” button, display images showing as guidance on the respective works are sequentially displayed. Further, a display image as guidance on arbitrary one of the works may be displayed by selection of one of the works in the operation menu.
    Type: Grant
    Filed: August 24, 2001
    Date of Patent: March 15, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Eitaro Ito, Kazuhisa Machida, Susumu Kai, Yoshimitsu Takagi, Yasuhiro Higuchi
  • Publication number: 20040158168
    Abstract: A biomagnetic field map display apparatus for measuring a biomagnetic field generated by a biotest sample at positions arranged in rows and columns and displaying a magnetic field map obtained by processing the measured biomagnetic field. An analysis data display area waveform-displays the measured biomagnetic field at channels in a row or a column of channels which are arranged in rows and columns so as to respectively correspond to the positions. A particular channel is designated as a reference channel for an averaging process out of the plurality of channels or different channels therefrom at which different biosignals from those of the biomagnetic field are acquired from the biotest sample. Means for averaging-processing the measured biomagnetic field using the designated particular channel as the reference channel displays in the analysis data display area a map on the averaging-processed biomagnetic field.
    Type: Application
    Filed: February 4, 2004
    Publication date: August 12, 2004
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Patent number: 6759655
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: April 11, 2001
    Date of Patent: July 6, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi, Kohichi Hayakawa
  • Patent number: 6711281
    Abstract: A biomagnetic field map display apparatus for measuring a biomagnetic field generated by a biotest sample at positions arranged in rows and columns and displaying a magnetic field map obtained by processing the measured biomagnetic field. An analysis data display area waveform-displays the measured biomagnetic field at channels in a row or a column of channels which are arranged in rows and columns so as to respectively correspond to the positions. A particular channel is designated as a reference channel for an averaging process out of the plurality of channels or different channels therefrom at which different biosignals from those of the biomagnetic field are acquired from the biotest sample. Means for averaging-processing the measured biomagnetic field using the designated particular channel as the reference channel displays in the analysis data display area a map on the averaging-processed biomagnetic field.
    Type: Grant
    Filed: October 29, 2002
    Date of Patent: March 23, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Patent number: 6650600
    Abstract: A digital audio disc recorder improves the ability to carry out an editing operation easily and efficiently. A group of keys used for recording and reproduction operations, ten keys and a track selecting key group are arranged on the side of a panel face of a remote commander. Further, audio signals recorded in the editing operation are displayed as a plurality of materials, a jog dial for moving forwardly and rearwardly the plural materials of the displayed audio signals in a time axis direction is arranged on the side of a panel face of the remote commander, a group of keys for selecting the materials are arranged on the depth side, and a group of keys for instructing a method of processing the selected materials are arranged on the depth side.
    Type: Grant
    Filed: November 15, 2000
    Date of Patent: November 18, 2003
    Assignee: Denon, Ltd.
    Inventors: Kazuhisa Machida, Atsushi Ishibashi, Tsugio Endou, Tadahiko Sakamoto, Hideki Ikeda, Atsushi Oonishi
  • Patent number: 6609019
    Abstract: The present invention, in the physiological magnetic field measuring instrument, recognizes characteristic waveforms (for example, heart beats) repeatedly appearing by physiological activity from measured signal waveforms, registers one of measured heart beats as a reference waveform, evaluates the difference degree of each measured heart beat data from the reference waveform, and executes the averaging process using only waveforms whose difference degrees are less than the allowable value. The present invention registers waveforms whose difference degrees are more than the allowable value as abnormal data and puts them into the display enabled state. Discrimination information is as signed to measurement conditions necessary for measuring the physiological magnetic field and data analysis conditions and when the discrimination information is designated for measurement, the measurement conditions and analysis conditions can be read.
    Type: Grant
    Filed: January 28, 2000
    Date of Patent: August 19, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Kenji Teshigawara, Hiroyuki Suzuki, Keiji Tsukada, Kazuhisa Machida, Akihiko Kandori, Tsuyoshi Miyashita, Hitoshi Sasabuchi
  • Patent number: 6600700
    Abstract: Disclosed is a digital audio disk recorder with improved ease of use, which can easily and efficiently superimpose a take of a short sound during broadcasting. In order to output takes of a plurality of short sounds, buttons “Key Name” corresponding to the takes of the sounds are displayed on a display screen for monitoring a state of broadcasting. By operating any of the buttons during broadcasting of a program for broadcasting displayed as a play list, the take of the short sound assigned to the button can be superimposed on a signal being broadcasted.
    Type: Grant
    Filed: November 16, 2000
    Date of Patent: July 29, 2003
    Assignee: Denon, Ltd.
    Inventors: Kazuhisa Machida, Atsushi Ishibashi, Tsugio Endou, Tadahiko Sakamoto, Hideki Ikeda, Atsushi Oonishi
  • Publication number: 20030063088
    Abstract: A biomagnetic field map display apparatus for measuring a biomagnetic field generated by a biotest sample at positions arranged in rows and columns and displaying a magnetic field map obtained by processing the measured biomagnetic field. An analysis data display area waveform-displays the measured biomagnetic field at channels in a row or a column of channels which are arranged in rows and columns so as to respectively correspond to the positions. A particular channel is designated as a reference channel for an averaging process out of the plurality of channels or different channels therefrom at which different biosignals from those of the biomagnetic field are acquired from the biotest sample. Means for averaging-processing the measured biomagnetic field using the designated particular channel as the reference channel displays in the analysis data display area a map on the averaging-processed biomagnetic field.
    Type: Application
    Filed: October 29, 2002
    Publication date: April 3, 2003
    Inventors: Kazuhisa Machida, Takafumi Kawasaki, Hiroyuki Suzuki, Keiji Tsukada
  • Publication number: 20030058444
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Application
    Filed: November 5, 2002
    Publication date: March 27, 2003
    Applicant: HITACHI, LTD.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Kohichi Hayakawa, Maki Ito
  • Patent number: 6504609
    Abstract: Inspection method, apparatus, and system for a circuit pattern in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: April 4, 2002
    Date of Patent: January 7, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi
  • Patent number: 6493082
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: December 10, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi, Kohichi Hayakawa, Maki Ito
  • Patent number: 6480279
    Abstract: Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by irradiating white light, a laser beam, or a charged particle beam are set, its operating efficiency can be improved. An inspection target region of an inspection-subject substrate is displayed, and a designated map picture plane and an image of an optical microscope or an electron beam microscope of a designated region are displayed in parallel, thereby enabling a defect distribution and a defect image to be simultaneously seen. Item names of inspecting conditions and a picture plane to display, input, or instruct the contents of the inspecting conditions are integrated, those contents are overlapped to the picture plane and layer-displayed, and all of the item names are displayed in parallel in a tab format in the upper portion of the picture plane of the contents.
    Type: Grant
    Filed: April 11, 2001
    Date of Patent: November 12, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Yasuhiko Nara, Kazuhisa Machida, Mari Nozoe, Hiroshi Morioka, Yasutsugu Usami, Takashi Hiroi
  • Patent number: D549721
    Type: Grant
    Filed: November 17, 2006
    Date of Patent: August 28, 2007
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Eitaro Ito, Kazuhisa Machida, Kenichi Sagiya, Yoshinori Furuno, Koji Fujita, Yasuomi Hashimoto