Abstract: A storage system includes processing circuitry configured to detect a file operation in a folder of a first storage, sequentially register information of files having undergone a change as a file replication processing target in a database, execute file replication processing to sequentially replicate each individual file of the files registered as the file replication processing target to a second storage, execute folder replication processing to replicate the folder to the second storage, in the folder replication processing, exclude a file belonging to the folder for the folder replication processing from the file replication processing target, and execute the file replication processing in parallel with the folder replication processing when the information of the file having undergone a change has been registered as the file replication processing target in the database during the folder replication processing.

Abstract: Provided is a display device for a vehicle that can rapidly execute preparation completion for display of vehicle information. The display device for a vehicle is provided with a processing unit, a display, and a rotational drive unit that can rotate a reflector on a prescribed axis. The processing unit includes an estimating unit that estimates planned start of the vehicle by a crew, and when the vehicle is planned to be started, the angle of rotation of the rotational drive unit moves from an initial angle corresponding to an initial position (position of point of origin) of the reflector to a first intermediate angle (first stopping position) between the initial angle and a final angle corresponding to the normal operating position of the reflector. After the vehicle has been actually started, the angle of rotation of the rotational drive unit moves to a final angle from the first intermediate angle.

Abstract: Provided is a display device capable of reliably moving a micromirror to a parking position when operation is stopped. A head-up display device drives a DMD element on the basis of electric power from a battery power supply. The head-up display device is provided with: a DMD controller for performing control of the DMD element on the basis of the electric power from the battery power supply; a voltage monitoring circuit for monitoring the voltage of the battery power supply; and a backup power supply for supplying power to the DMD controller as a backup of the battery power supply. When the voltage of the battery power supply which has been monitored by the voltage monitoring circuit falls to or below a threshold value, the DMD controller moves the DMD element to the parking position on the basis of the electric power from the backup power supply.

Abstract: Provided is a display device for a vehicle that can rapidly execute preparation completion for display of vehicle information. The display device for a vehicle is provided with a processing unit, a display, and a rotational drive unit that can rotate a reflector on a prescribed axis. The processing unit includes an estimating unit that estimates planned start of the vehicle by a crew, and when the vehicle is planned to be started, the angle of rotation of the rotational drive unit moves from an initial angle corresponding to an initial position (position of point of origin) of the reflector to a first intermediate angle (first stopping position) between the initial angle and a final angle corresponding to the normal operating position of the reflector. After the vehicle has been actually started, the angle of rotation of the rotational drive unit moves to a final angle from the first intermediate angle.

Abstract: Provided is a display device capable of reliably moving a micromirror to a parking position when operation is stopped. A head-up display device drives a DMD element on the basis of electric power from a battery power supply. The head-up display device is provided with: a DMD controller for performing control of the DMD element on the basis of the electric power from the battery power supply; a voltage monitoring circuit for monitoring the voltage of the battery power supply; and a backup power supply for supplying power to the DMD controller as a backup of the battery power supply. When the voltage of the battery power supply which has been monitored by the voltage monitoring circuit falls to or below a threshold value, the DMD controller moves the DMD element to the parking position on the basis of the electric power from the backup power supply.

Abstract: A storage system includes processing circuitry configured to detect a file operation in a folder of a first storage, sequentially register information of files having undergone a change as a file replication processing target in a database, execute file replication processing to sequentially replicate each individual file of the files registered as the file replication processing target to a second storage, execute folder replication processing to replicate the folder to the second storage, in the folder replication processing, exclude a file belonging to the folder for the folder replication processing from the file replication processing target, and execute the file replication processing in parallel with the folder replication processing when the information of the file having undergone a change has been registered as the file replication processing target in the database during the folder replication processing.

Abstract: Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management.

Abstract: Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management.

Abstract: Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management.

Abstract: A semiconductor device includes a first semiconductor chip having a non-volatile memory array which has a first memory area for storing input information of usual operation, and a second memory area for storing historical information of an electrical characteristic test of the first memory area. The device further includes a second semiconductor chip having a volatile memory array with a third memory area for storing input information of usual operation. Historical information of an electrical characteristic test of the third memory area of the second semiconductor chip is stored into the second memory area of the first semiconductor chip.

Abstract: The semiconductor memory device of the present invention is provided with a switching element comprised of a single channel MOS transistor at a halfway of a path used to transmit a high voltage supplied to the memory array via the external terminal at the time of a test performance, so that the switching element is turned off when a word line is changed to another, thereby resetting of the supply voltage having been required conventionally for each test performance is omitted.

Abstract: There is provided an electrical characteristic test technique for a semiconductor device that can shorten the time required for a next probe test after a wafer level burn-in test, prevent leak of defective product to an assembling process and moreover easily realizes the analysis of cause for generation of a fault after delivery of products to customers.

Abstract: The semiconductor memory device of the present invention is provided with a switching element comprised of a single channel MOS transistor at a halfway of a path used to transmit a high voltage supplied to the memory array via the external terminal at the time of a test performance, so that the switching element is turned off when a word line is changed to another, thereby resetting of the supply voltage having been required conventionally for each test performance is omitted.

Abstract: Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management.

Abstract: There is provided an electrical characteristic test technique for a semiconductor device that can shorten the time required for a next probe test after a wafer level burn-in test, prevent leak of defective product to an assembling process and moreover easily realizes the analysis of cause for generation of a fault after delivery of products to customers.