Abstract: A fermentation state monitoring apparatus includes: a terahertz wave generation element that outputs inspection light using a terahertz wave to a fermented food under fermentation in a sealed product container; a terahertz wave detection element that detects return light of the inspection light reflected by the fermented food in the product container; and a determination unit that determines a fermentation progress of the fermented food based on an index value including a reflectance of the return light with respect to the inspection light or an absorption coefficient of the return light with respect to the inspection light.

Abstract: A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

Abstract: An optical measurement device includes a light source configured to output a terahertz wave and coaxial light having a wavelength different from the wavelength of the terahertz wave, coaxially with the terahertz wave; an intensity modulation unit configured to perform intensity modulation of at least the terahertz wave of the terahertz wave and the coaxial light in a predetermined modulation frequency; and a light detection unit configured to synchronously detects each of the terahertz wave and the coaxial light which have acted on a measurement subject via the intensity modulation unit based on the modulation frequency.

Abstract: A terahertz wave spectroscopic measurement device includes a light source that emits a terahertz wave and probe light having a wavelength different from that of the terahertz wave, an internal total reflection prism including an incidence surface of the terahertz wave, a placement surface on which a measurement target is placed, and an emission surface of the terahertz wave, the internal total reflection prism internally totally reflecting the terahertz wave incident from the incidence surface by means of the placement surface and emitting the terahertz wave from the emission surface, and a terahertz wave detection unit that indirectly detects the terahertz wave emitted from the emission surface using the probe light. The internal total reflection prism includes an avoidance portion on which incidence of the probe light on the measurement target on the placement surface is avoided.

Abstract: A fermentation state monitoring apparatus includes: a terahertz wave generation element that outputs inspection light using a terahertz wave to a fermented food under fermentation in a sealed product container; a terahertz wave detection element that detects return light of the inspection light reflected by the fermented food in the product container; and a determination unit that determines a fermentation progress of the fermented food based on an index value including a reflectance of the return light with respect to the inspection light or an absorption coefficient of the return light with respect to the inspection light.

Abstract: An optical measurement device includes a light source configured to output a terahertz wave and coaxial light having a wavelength different from the wavelength of the terahertz wave, coaxially with the terahertz wave; an intensity modulation unit configured to perform intensity modulation of at least the terahertz wave of the terahertz wave and the coaxial light in a predetermined modulation frequency; and a light detection unit configured to synchronously detects each of the terahertz wave and the coaxial light which have acted on a measurement subject via the intensity modulation unit based on the modulation frequency.

Abstract: A terahertz wave spectroscopic measurement device includes a light source that emits a terahertz wave and probe light having a wavelength different from that of the terahertz wave, an internal total reflection prism including an incidence surface of the terahertz wave, a placement surface on which a measurement target is placed, and an emission surface of the terahertz wave, the internal total reflection prism internally totally reflecting the terahertz wave incident from the incidence surface by means of the placement surface and emitting the terahertz wave from the emission surface, and a terahertz wave detection unit that indirectly detects the terahertz wave emitted from the emission surface using the probe light. The internal total reflection prism includes an avoidance portion on which incidence of the probe light on the measurement target on the placement surface is avoided.

Abstract: A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

Abstract: A terahertz wave temporal waveform acquisition apparatus includes a light source, a branch part, a terahertz wave generation element, a terahertz wave detection element, a delay providing medium, a temperature adjustment unit, and an analysis unit. The delay providing medium is disposed on an optical path of a terahertz wave from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave.

Abstract: A terahertz wave temporal waveform acquisition apparatus includes a light source, a branch part, a terahertz wave generation element, a terahertz wave detection element, a delay providing medium, a temperature adjustment unit, and an analysis unit. The delay providing medium is disposed on an optical path of a terahertz wave from the terahertz wave generation element to the terahertz wave detection element, is formed of a material of which a refractive index for the terahertz wave depends on the temperature, and provides a delay according to the temperature to the terahertz wave.

Abstract: In a heat-treatment apparatus for heat-treating a V-type cylinder block (W) by induction heating, the block (W) is fixedly mounted on a work table (11) and set at a reference position thereon. A plurality of induction heating coils (23) are disposed in each of opposite sides of a base frame (10) of the work table (11) through Z tables (21), Y tables (18) and X tables (13). These tables (13, 18, 21) enable the heating coils (23) to enter and exit from the corresponding cylinder bores (Wn) of the block (W) in a direction in parallel with a longitudinal direction of the cylinder bores (Wn). The Z table (21) moves back and forth in parallel with the longitudinal direction of the cylinder bores (wn). The Y table moves back and forth in a direction perpendicular to the rows of the cylinder bores (Wn). The X table (13) moves back and forth in parallel with the rows of cylinder bores (Wn).

Abstract: In a heat-treatment apparatus for heat-treating a V-type cylinder block (W) by induction heating, the block (W) is fixedly mounted on a work table (11) and set at a reference position thereon. A plurality of induction heating coils (23) are disposed in each of opposite sides of a base frame (10) of the work table (11) through Z tables (21), Y tables (18) and X tables (13). These tables (13, 18, 21) enable the heating coils (23) to enter and exit from the corresponding cylinder bores (Wn) of the block (W) in a direction in parallel with a longitudinal direction of the cylinder bores (Wn). The Z table (21) moves back and forth in parallel with the longitudinal direction of the cylinder bores (wn). The Y table moves back and forth in a direction perpendicular to the rows of the cylinder bores (Wn). The X table (13) moves back and forth in parallel with the rows of cylinder bores (Wn).