Abstract: An organic electroluminescence device includes an emitting region between a cathode and an anode, a first anode side organic layer, and a second anode side organic layer. The emitting region includes at least a first emitting layer, the first anode side organic layer is in direct contact with the second anode side organic layer, the first anode side organic layer contains first and second organic materials, a content of the first organic material in the first anode side organic layer is less than 50 mass %, the second anode side organic layer contains a second hole transporting zone material, the first emitting layer is an emitting layer that emits fluorescence, and a refractive index NM1 of the constituent materials contained in the first anode side organic layer and a refractive index NM2 of the constituent material contained in the second anode side organic layer satisfy a relationship of NM1>NM2.

Abstract: When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.

Abstract: A prepreg including a thermosetting resin composition and a self-assembled carbon fiber bundle impregnated with the thermosetting resin composition.

Abstract: A measurement device that comprises a photoelectric conversion element and a signal processing part that receives, from the photoelectric conversion element, detected pulses that include dark pulses and signal pulses that are outputted in accordance with inputted photons. The signal processing part performs amplitude discrimination on the detected pulses on the basis of a pre-acquired dark pulse amplitude distribution for the photoelectric conversion element.

Abstract: A road manager system and method to identify a road surface property in a convenient and stable manner, including a vehicle positional information sensor and road surface condition sensor; a server computer that manages a road surface property; and a client computer that accesses the server computer. The server computer carries out processing of receiving, from the vehicle, permission information regarding provision of road surface condition information; receiving the road surface condition information transmitted from the vehicle, in which output information from the positional information sensor and output information from the road surface condition sensor are associated with each other; identifying, using output information from the road surface condition sensor, the road surface property of the road identified by the output information from the positional information sensor; and displaying the road surface property on the client computer in response to a request from the client computer.

Abstract: A method of setting a parameter of a charged particle beam device, for shortening the time required to adjust an ABCC parameter. An inverse conversion processing unit generates a simulator input signal corresponding to an electron emitted from a sample. A simulation detector uses an arithmetic model that simulates a detector and executes arithmetic processing on the simulator input signal in a state in which characteristic information is reflected in an arithmetic parameter. A simulated image conversion unit executes arithmetic processing corresponding to an image conversion unit and converts a signal from the simulation detector into a simulated image. An ABCC search unit searches for an ABCC parameter with respect to the simulation detector so that an evaluation value obtained from the simulated image becomes a specified reference value, and outputs the ABCC parameter as a search result to an ABCC control unit of the actual machine.

Abstract: This high-level synthesis device, which has a processor and a memory, and generates a hardware description code that describes the configuration of an integrated circuit connected to an external memory, comprises a high-level synthesis code adjustment unit which receives a high-level synthesis code that describes a process to be executed by the integrated circuit and an external memory access variable for exchanging data with the external memory, analyzes the high-level synthesis code, and reconstructs the high-level synthesis code on the basis of the analysis result, wherein the high-level synthesis code adjustment unit includes: a burst access determination unit that analyzes the external memory access variable in the high-level synthesis code, and determines whether burst access to the external memory is possible; and a code reconstructing unit that adds a code for executing burst access to the high-level synthesis code, for the external memory access variable capable of being burst accessed.

Abstract: A multi-beam scanning electron microscope (charged particle beam device) 100 includes an electron gun (charged particle irradiation source) 101 configured to irradiate a sample 104 with an electron beam (charged particle beam) 103, a detector 106 having a detection region corresponding to the charged particle beam 103 and configured to output an electrical signal 107 corresponding to a reaching position when secondary particles 105 generated from the sample 104 by irradiating the sample 104 with the charged particle beam 103 reach the detection region, and a signal processing block 115 configured to perform measurement of a charge amount of the sample 104 by the charged particle beam 103 and generation of an inspection image of the sample 104 in parallel based on the electrical signal 107 output from the detector 106.

Abstract: A flux used for soldering with a tin-silver-copper alloy comprises an imidazole compound and/or an imidazoline compound; a dicarboxylic acid having 3 or more and 36 or less carbons; and a quaternary ammonium iodine salt. Relative to the total amount of the flux, the dicarboxylic acid content is 6 mass % or more and 25 mass % or less, and the iodine content is 200 ppm or more and 3600 ppm or less.

Abstract: When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.

Abstract: A measurement device that comprises a photoelectric conversion element and a signal processing part that receives, from the photoelectric conversion element, detected pulses that include dark pulses and signal pulses that are outputted in accordance with inputted photons. The signal processing part performs amplitude discrimination on the detected pulses on the basis of a pre-acquired dark pulse amplitude distribution for the photoelectric conversion element.

Abstract: Provided is a technique for specifying a medium more simply. A medium sensor device includes an antenna, a storage unit that stores a medium identification table in which a medium corresponding to an antenna impedance has been determined beforehand, and a medium specification unit that specifies the impedance of the antenna and specifies a medium in the vicinity of the antenna by referring to the medium identification table.

Abstract: Components are assembled in an industrial machine together with a controller. The components each include a unique identification information memory portion and a component-side configuration history memory portion. The unique identification information memory portion stores, as unique identification information, identification information of the component itself, which is providable to the controller. The component-side configuration history memory portion stores configuration histories that each summarize, in terms of an acquisition timing from the controller, the unique identification information of the component itself, controller identification information of the controller that was used to configure the industrial machine together with the component itself, and unique identification information of other ones, than the controller, of the components, which were also used to configure the industrial machine together with the component itself.

Abstract: Provided is a technique for specifying a medium more simply. A medium sensor device includes an antenna, a storage unit that stores a medium identification table in which a medium corresponding to an antenna impedance has been determined beforehand, and a medium specification unit that specifies the impedance of the antenna and specifies a medium in the vicinity of the antenna by referring to the medium identification table.

Abstract: A charged-particle beam system comprises: a charged-particle beam device containing a detection unit for detecting electrons generated by irradiating a sample with a charged-particle beam released from a charged particle source; and a signal detection unit in which a detection signal from the detection unit is input through a wiring. The signal detection unit comprises: a separation unit for separating into a rising signal and a falling signal the detection signal from the detection unit; a falling signal processing unit for at least eliminating ringing in the falling signal; and a combination unit generating and delivering a combined signal produced by combining the rising signal, which has been separated by the separation unit, with the falling signal wherefrom the ringing has been eliminated by the falling signal processing unit.

Abstract: A charged particle beam device includes a deflection unit that deflects a charged particle beam released from a charged particle source to irradiate a sample, a reflection plate that reflects secondary electrons generated from the sample, and a control unit that controls the deflection unit based on an image generated by detecting the secondary electrons reflected from the reflection plate. The deflection unit includes an electromagnetic deflection unit that electromagnetically scans with the charged particle beam by a magnetic field and an electrostatic deflection unit that electrostatically scans with the charged particle beam by an electric field. The control unit controls the electromagnetic deflection unit and the electrostatic deflection unit, superimposes an electromagnetic deflection vector generated by the electromagnetic scanning and an electrostatic deflection vector generated by the electrostatic scanning, and controls at least a trajectory of the charged particle beam.

Abstract: An image forming apparatus includes a photoconductor, a light emitting substrate, and imaging optical systems, wherein an optical axis of the imaging optical systems are parallel, imaging magnifications of the imaging optical systems are substantially equal for the light emitting point groups, the imaging optical systems includes a first lens array, a second lens array, and apertures, central points of the light emitting point group exist in a first plane, central points of the imaging lenses exist in a second plane, central points of the apertures exist in a third plane, central points of the imaging lenses exist in a fourth plane, the first plane forms a non-zero predetermined angle with respect to a plane perpendicular to an optical axis direction, and the angle formed with respect to the plane perpendicular to the optical axis direction is greater in the order of the first, second, third, and the fourth plane.

Abstract: An image forming apparatus includes: a light-emitting element that includes light-emitting point groups; and an optical system that includes imaging systems focusing light from light-emitting points of the light-emitting point groups, wherein the light-emitting point groups and the imaging systems are combined into sets, the light-receiving surface has a cylindrical shape, each imaging system has a negative imaging magnification, light-emitting point groups are arranged at different positions, the imaging systems adjacent to each other have optical axes non-parallel to each other, each optical axis has an angle being not zero relative to the central normal, and a plane including the optical axis and the central normal is perpendicular to a rotational symmetry axis, and an angle between the optical axis and a line normal to the light-receiving surface is smaller than an angle between the central normal and a line normal to the light-receiving surface.

Abstract: A structural color changeable material includes a strain body and surface plasmon generating particles. In the strain body, a strain is produced by an external pressure or an internal change. The surface plasmon generating particles generate surface plasmon and are contained in the strain body. The surface plasmon is generated by an incident light with a wavelength of 2400 nm or less. A mean particle size of the surface plasmon generating particles is equal to or less than the wavelength of the incident light. The surface plasmon generating particles are periodically arranged parallel to an in-plane direction of a reflection surface of the incident light.

Abstract: An image forming apparatus includes: a light-emitting element that includes light-emitting point groups; and an optical system that includes imaging systems focusing light from light-emitting points of the light-emitting point groups, wherein the light-emitting point groups and the imaging systems are combined into sets, the light-receiving surface has a cylindrical shape, each imaging system has a negative imaging magnification, light-emitting point groups are arranged at different positions, the imaging systems adjacent to each other have optical axes non-parallel to each other, each optical axis has an angle being not zero relative to the central normal, and a plane including the optical axis and the central normal is perpendicular to a rotational symmetry axis, and an angle between the optical axis and a line normal to the light-receiving surface is smaller than an angle between the central normal and a line normal to the light-receiving surface.