Patents by Inventor Kazuma Miura
Kazuma Miura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230079097Abstract: A drying device includes a recessed portion into which a suction nozzle is inserted, an air jetting port that is formed on a bottom surface of the recessed portion, and a control device that jets air from the jetting port toward a suction nozzle inserted into the recessed portion.Type: ApplicationFiled: April 1, 2020Publication date: March 16, 2023Applicant: FUJI CORPORATIONInventors: Kazuma MIURA, Kenji SHIMOSAKA
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Publication number: 20220282917Abstract: A drying device includes multiple partitioned spaces, and a jetting device configured to jet air to a component holder in each of the multiple spaces.Type: ApplicationFiled: September 24, 2019Publication date: September 8, 2022Applicant: FUJI CORPORATIONInventors: Kazuma MIURA, Kenji SHIMOSAKA, Daisuke SUZUKI
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Patent number: 8022551Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu, or other materials and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: GrantFiled: April 7, 2006Date of Patent: September 20, 2011Assignee: Renesas Electronics CorporationInventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Patent number: 7875128Abstract: A Ni-free stainless steel product excellent in workability and corrosion resistance and a method for manufacturing such stainless steel product. A ferritic stainless steel product containing 18 to 24% by mass of Cr and 0 to 4% by mass of Mo is brought into contact with an inert gas containing a nitrogen gas at 800 degrees C. or above to subject it to nitrogen absorption treatment so that the product is austenitized partially or wholly to obtain such nickel-free product.Type: GrantFiled: April 20, 2007Date of Patent: January 25, 2011Assignees: National Institute for Materials Science, Myodo Metal Co., Ltd.Inventors: Daisuke Kuroda, Shinichi Yanadori, Mitsuo Watanabe, Kazuma Miura
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Patent number: 7722962Abstract: A solder foil formed from a material comprising particles of Cu, etc. as metal particles and Sn particles as solder particles by rolling is suitable for solder bonding at a high temperature side in temperature-hierarchical bonding, and semiconductor devices and electronic devices produced by use of such solder bonding have distinguished reliability of mechanical characteristics, etc.Type: GrantFiled: December 19, 2001Date of Patent: May 25, 2010Assignee: Renesas Technology Corp.Inventors: Tasao Soga, Hanae Hata, Toshiharu Ishida, Kanko Ishida, legal representative, Tetsuya Nakatsuka, Masahide Okamoto, Kazuma Miura
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Patent number: 7259465Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu, etc., and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: GrantFiled: March 22, 2002Date of Patent: August 21, 2007Assignee: Hitachi, Ltd.Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Publication number: 20070186999Abstract: A Ni-free stainless steel product excellent in workability and corrosion resistance and a method for manufacturing such stainless steel product. A ferritic stainless steel product containing 18 to 24% by mass of Cr and 0 to 4% by mass of Mo is brought into contact with an inert gas containing a nitrogen gas at 800 degrees C. or above to subject it to nitrogen absorption treatment so that the product is austenitized partially or wholly to obtain such nickel-free product.Type: ApplicationFiled: April 20, 2007Publication date: August 16, 2007Applicants: NATIONAL INSTITUTE FOR MATERIALS SCIENCE, MYODO METAL CO., LTD.Inventors: Daisuke Kuroda, Shinichi Yanadori, Mitsuo Watanabe, Kazuma Miura
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Publication number: 20070031279Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu, or other materials and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: ApplicationFiled: April 7, 2006Publication date: February 8, 2007Applicant: Renesas Technology CorporationInventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Patent number: 7145236Abstract: A semiconductor module solder bonding of high reliability in which the heat resisting properties of the circuit substrate and electronic parts are taken into consideration. In order to achieve this, there are provided semiconductor devices each having solder bumps as external pads, and a circuit substrate bonded to the external pads of each of the semiconductor devices through a solder paste, each of the solder bumps being made of a first lead-free solder, the solder paste being made of a second lead-free solder having a melting point lower than that of the first lead-free solder.Type: GrantFiled: October 8, 2002Date of Patent: December 5, 2006Assignee: Renesas Technology Corp.Inventors: Kazuma Miura, Hanae Shimokawa, Koji Serizawa, Tasao Soga, Tetsuya Nakatsuka
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Patent number: 7075183Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu etc. and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: GrantFiled: June 12, 2001Date of Patent: July 11, 2006Assignee: Hitachi, Ltd.Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Publication number: 20060061974Abstract: A solder foil formed from a material comprising particles of Cu, etc. as metal particles and Sn particles as solder particles by rolling is suitable for solder bonding at a high temperature side in temperature-hierarchical bonding, and semiconductor devices and electronic devices produced by use of such solder bonding have distinguished reliability of mechanical characteristics, etc.Type: ApplicationFiled: December 19, 2001Publication date: March 23, 2006Inventors: Tasao Soga, Hanae Hata, Toshiharu Ishida, Kanko Ishida, Tetsuya Nakatsuka, Masahide Okamoto, Kazuma Miura
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Publication number: 20040177997Abstract: It is an object of the present invention to provide an electronic device using completely new soldered connection, and more particularly to achieve flip chip bonding on a high temperature side in a temperature hierarchy connection as an alternative method for high Pb containing solder including a large mount of Pb. The object can be achieved by using a configuration in which metallic balls including a single metal, an alloy, a chemical compound or a mixture thereof are connected by Sn or In for pads between a chip and a substrate.Type: ApplicationFiled: April 29, 2004Publication date: September 16, 2004Inventors: Hanae Hata, Tasao Soga, Toshiharu Ishida, Kazuma Miura, Kanko Ishida
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Patent number: 6563225Abstract: There is provided an electronic device comprising at least one electronic part and a substrate on which said electronic part is mounted, said electronic part and said substrate being bonded by a joint comprising a phase of Al particles and another phase of a Al—Mg—Ge—Zn alloy, said Al particles being connected to each other by said Al—Mg—Ge—Zn alloy phase.Type: GrantFiled: February 27, 2002Date of Patent: May 13, 2003Assignee: Hitachi, Ltd.Inventors: Tasao Soga, Toshiharu Ishida, Kazuma Miura, Hanae Hata, Masahide Okamoto, Tetsuya Nakatsuka
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Publication number: 20030030149Abstract: The object of the invention is to obtain solder bonding of high reliability in which the heat resisting properties of a circuit substrate and electronic parts are taken into consideration. In order to achieve the object, there are provided semiconductor devices each having solder bumps as external pads, and a circuit substrate bonded to the external pads of each of the semiconductor devices through a solder paste, each of the solder bumps being made of a first lead-free solder, the solder paste being made of a second lead-free solder having a melting point lower than that of the first lead-free solder.Type: ApplicationFiled: October 8, 2002Publication date: February 13, 2003Inventors: Kazuma Miura, Hanae Shimokawa, Koji Serizawa, Tasao Soga, Tetsuya Nakatsuka
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Patent number: 6486411Abstract: A semiconductor module solder bonding of high reliability in which the heat resisting properties of the circuit substrate and electronic parts are taken into consideration. In order to achieve this, there are provided semiconductor devices each having solder bumps as external pads, and a circuit substrate bonded to the external pads of each of the semiconductor devices through a solder paste, each of the solder bumps being made of a first lead-free solder, the solder paste being made of a second lead-free solder having a melting point lower than that of the first lead-free solder.Type: GrantFiled: March 20, 2001Date of Patent: November 26, 2002Assignee: Hitachi, Ltd.Inventors: Kazuma Miura, Hanae Shimokawa, Koji Serizawa, Tasao Soga, Tetsuya Nakatsuka
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Publication number: 20020171157Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu etc. and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: ApplicationFiled: June 13, 2001Publication date: November 21, 2002Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Publication number: 20020149114Abstract: There is provided an electronic device comprising at least one electronic part and a substrate on which said electronic part is mounted, said electronic part and said substrate being bonded by a joint comprising a phase of Al particles and another phase of a Al—Mg—Ge—Zn alloy, said Al particles being connected to each other by said Al—Mg—Ge—Zn alloy phase.Type: ApplicationFiled: February 27, 2002Publication date: October 17, 2002Inventors: Tasao Soga, Toshiharu Ishida, Kazuma Miura, Hanae Hata, Masahide Okamoto, Tetsuya Nakatsuka
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Publication number: 20020114726Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu, or other materials and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: ApplicationFiled: March 22, 2002Publication date: August 22, 2002Applicant: Hitachi, Ltd.Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Publication number: 20020100986Abstract: Each of junctions formed between a semiconductor device and a substrate comprises metal balls of Cu, etc., and compounds of Sn and the metal balls, and the metal balls are bonded together by the compounds.Type: ApplicationFiled: March 22, 2002Publication date: August 1, 2002Applicant: Hitachi, Ltd.Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Kazuma Miura, Mikio Negishi, Hirokazu Nakajima, Tsuneo Endoh
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Publication number: 20010050181Abstract: The object of the invention is to obtain solder bonding of high reliability in which the heat resisting properties of a circuit substrate and electronic parts are taken into consideration. In order to achieve the object, there are provided semiconductor devices each having solder bumps as external pads, and a circuit substrate bonded to the external pads of each of the semiconductor devices through a solder paste, each of the solder bumps being made of a first lead-free solder, the solder paste being made of a second lead-free solder having a melting point lower than that of the first lead-free solder.Type: ApplicationFiled: March 20, 2001Publication date: December 13, 2001Inventors: Kazuma Miura, Hanae Shimokawa, Koji Serizawa, Tasao Soga, Tetsuya Nakatsuka