Abstract: An ultrasonic flaw detector including an ultrasonic probe for emitting an ultrasonic wave on an object to be inspected and receiving a reflected ultrasonic wave from the object, a drive element control unit for controlling a plurality of ultrasonic elements to emit an ultrasonic wave from the ultrasonic probe and to control a reflected ultrasonic wave from the object, and a calculation unit for obtaining, by using a refraction angle of the ultrasonic wave at a time of the ultrasonic wave entering the object, an incident position of the ultrasonic wave on a surface of the object, and a surface shape of a surface of the object at the incident position, the incident angle of the ultrasonic wave entering the incident position, and obtaining a plurality of ultrasonic elements to be driven, based on the incident position and the incident angle.

Abstract: An ultrasonic test equipment includes: a signal generating mechanism that generates a voltage waveform; an ultrasonic transmitting mechanism that excites ultrasonic vibrations having a lower frequency than a predetermined frequency to an object to be tested; an ultrasonic receiving mechanism that receives an ultrasonic response from the object to be tested; an AD converting mechanism that digitizes the received ultrasonic waveform; an analyzing mechanism that performs frequency analysis of the digital ultrasonic waveform digitized by the AD converting mechanism; an evaluating mechanism that extracts a variation of a nonlinear ultrasonic component from a frequency component of the digital ultrasonic wave obtained by the frequency analysis, compares the variation with defect data information in a defect information database, identifies a physical quantity of defect information of the object to be tested, and evaluates a defect in the object to be tested; and a control mechanism that partly or entirely controls

Abstract: A welding inspection method has steps of: generating transmission laser light for generating an ultrasonic wave and transmitting the transmission laser light to an object to be inspected during or after welding operation for irradiation; generating reception laser light for detecting an ultrasonic wave and transmitting the reception laser light to the object to be inspected for irradiation; collecting laser light scattered and reflected at surface of the object to be inspected; performing interference measurement of the laser light and obtaining an ultrasonic signal; and analyzing the ultrasonic signal obtained by the interference measurement. At least one of the transmission laser light generated in the transmission laser light irradiation step and the reception laser light generated in the reception laser light irradiation step is irradiated onto a welded metal part or a groove side surface.

Abstract: An ultrasonic test equipment includes: a signal generating mechanism that generates a voltage waveform; an ultrasonic transmitting mechanism that excites ultrasonic vibrations having a lower frequency than a predetermined frequency to an object to be tested; an ultrasonic receiving mechanism that receives an ultrasonic response from the object to be tested; an AD converting mechanism that digitizes the received ultrasonic waveform; an analyzing mechanism that performs frequency analysis of the digital ultrasonic waveform digitized by the AD converting mechanism; an evaluating mechanism that extracts a variation of a nonlinear ultrasonic component from a frequency component of the digital ultrasonic wave obtained by the frequency analysis, compares the variation with defect data information in a defect information database, identifies a physical quantity of defect information of the object to be tested, and evaluates a defect in the object to be tested; and a control mechanism that partly or entirely controls

Abstract: According to an embodiment, an ultrasonic flaw detection device is provided with: an ultrasonic probe, which applies ultrasonic waves, by driving a plurality of ultrasonic elements, to a test object to be inspected, and which receives reflected ultrasonic waves from the test object; and an analysis unit, which analyzes the signals of the reflected ultrasonic waves received by the ultrasonic probe, and which calculates the flaw detection results. The analysis unit calculates the flaw detection results using an ultrasonic wave propagation path obtained on the basis of the surface information of the test object having the ultrasonic waves applied thereto, thereby obtaining highly accurate detection results even the surface of the test object is formed in complex shape.

Abstract: An ultrasonic flaw detector including an ultrasonic probe for emitting an ultrasonic wave on an object to be inspected and receiving a reflected ultrasonic wave from the object, a drive element control unit for controlling a plurality of ultrasonic elements to emit an ultrasonic wave on the ultrasonic probe and to control a reflected ultrasonic wave from the ultrasonic probe, and a calculation unit for obtaining, by using a refraction angle of the ultrasonic wave at a time of the ultrasonic wave entering the object, an incident position of the ultrasonic wave on a surface of the object, and a surface shape of a surface of the object at the incident position, the incident angle of the ultrasonic wave entering the incident position, and obtaining a plurality of ultrasonic elements to be driven, based on the incident position and the incident angle.

Abstract: An operation image displaying device is provided with a displaying unit configured to display an operation image including operation input areas for inputting operations commands, a pointer displaying unit configured to show a pointer, which points a position on the displaying unit in accordance with an operation of a user, a distance detecting unit configured to detect a distance between the pointer and one of the operation image and the operation input areas.

Abstract: A welding system has: a welding mechanism, a reception laser light source, a reception optical mechanism, an interferometer, a data recording/analysis mechanism and a data recording/analysis mechanism. The reception laser light source generates reception laser light so as to irradiate the object to be welded with the reception laser light for the purpose of detecting a reflected ultrasonic wave obtained as a result of reflection of a transmission ultrasonic wave. The reception optical mechanism transmits, during or after welding operation, the reception laser light generated from the reception laser light source to the surface of the object to be welded for irradiation while moving, together with the welding mechanism, relative to the object to be welded and collects laser light scattered/reflected at the surface of the object to be welded.

Abstract: A welding inspection method has steps of: generating transmission laser light for generating an ultrasonic wave and transmitting the transmission laser light to an object to be inspected during or after welding operation for irradiation; generating reception laser light for detecting an ultrasonic wave and transmitting the reception laser light to the object to be inspected for irradiation; collecting laser light scattered and reflected at surface of the object to be inspected; performing interference measurement of the laser light and obtaining an ultrasonic signal; and analyzing the ultrasonic signal obtained by the interference measurement. At least one of the transmission laser light generated in the transmission laser light irradiation step and the reception laser light generated in the reception laser light irradiation step is irradiated onto a welded metal part or a groove side surface.

Abstract: A method of detecting the base concentration of a film is provided including: a film image entering process of reading a developed film with an image pickup device to generate the pixel values in each of the RGB color components; a non-exposure region detecting step of detecting the edge of each frame on the film from the detected pixel values and specifying as the non-exposure region each line of pixels disposed at the intermediate between any two adjacent frame-image edges from the detected edge data; and a base concentration calculating step of subjecting the pixel values in each non-exposure region specified in the non-exposure region detecting step to different arithmetic operations for calculating corresponding base concentrations of the film, whereby the highest of the base concentrations is judged as a true base concentration.

Abstract: An operation image displaying device is provided with a displaying unit configured to display an operation image including operation input areas for inputting operations commands, a pointer displaying unit configured to show a pointer, which points a position on the displaying unit in accordance with an operation of a user, a distance detecting unit configured to detect a distance between the pointer and one of the operation image and the operation input areas;

Abstract: After a probe control means causes a longitudinal wave probe to carry out transmission and reception, it slides a shear wave probe to the same position. The probe control means rotates the shear wave probe at each predetermined angle and rotates it 180° while causing it to carry out the transmission and the reception at each rotating position. A measured data analyzer 16 calculates the constant of texture induced anisotropy in a test piece from echo data when both the probes carry out the transmission and the reception. With this arrangement, it is possible to measure the residual stress of a material, in which both texture induced anisotropy and residual stress induced anisotropy mixedly exist with pinpoint accuracy by separating only the texture induced anisotropy from the material.

Abstract: An image correction processing apparatus for correcting a pixel value of each pixel constituting image data obtained from an original image affected by the peripheral light-off is disclosed. The apparatus includes a pixel coordinate transforming unit for converting a distance between each pixel of a group of pixels which have an equal amount of peripheral light amount reduction and which are located on a common contour line of an oval about a predetermined reference pixel located at the center thereof and said predetermined reference pixel into a radius of a true circle having a diameter corresponding to the major axis of the oval; a cos4 calculating unit for obtaining, for each pixel, an angle value thereof in proportion to the radius obtained by the conversion and then obtaining a cos4 value of the angle value; and a correction calculating unit for multiplying an inverse of said cos4 value obtained for each pixel by a pixel value of this pixel, thereby to obtain a corrected pixel value for the pixel.

Abstract: An image-forming system includes an image-forming device and a terminal device. The terminal device enables the image-forming device to form images based on image data. The terminal device includes: a determining portion; an acquiring portion; and a displaying portion. The determining portion determines whether bi-directional communication is possible between the terminal device and the image-forming device. The acquiring portion acquires, from the image-forming device, setup data related to a setup condition of the image-forming device when the determining portion determines that bi-directional communication is possible. The displaying portion displays data corresponding to the acquired setup data.

Abstract: A method of detecting the base concentration of a film is provided including: a film image entering process of reading a developed film with an image pickup device to generate the pixel values in each of the RGB color component; a non-exposure region detecting step of detecting the edge of each frame on the film from the detected pixel values and specifying as the non-exposure region each line of pixels disposed at the intermediate between any two adjacent frame-image edges from the detected edge data; and a base concentration calculating step of subjecting the pixel values in each non-exposure region specified in the non-exposure region detecting step to different arithmetic operations for calculating corresponding base concentrations of the film, whereby the highest of the base concentrations is judged as a true base concentration.

Abstract: An apparatus for producing hydrogen is able to measure a position of a interface or a surface boundary of liquids in a reaction vessel without direct contact. An apparatus for producing hydrogen by an IS process includes a reaction vessel, a first ultrasonic probe and a second ultrasonic probe. Reacting liquids are introduced to the reaction vessel. The first ultrasonic probe is provided at the bottom of the reaction vessel to detect a position of a boundary surface of the reacting liquids. The second ultrasonic probe is provided at the side wall of the reaction vessel to compensate the sound velocity.

Abstract: An image correction processing apparatus for correcting a pixel value of each pixel constituting image data obtained from an original image affected by the peripheral light-off is disclosed. The apparatus includes a pixel coordinate transforming unit for converting a distance between each pixel of a group of pixels which have an equal amount of peripheral light amount reduction and which are located on a common contour line of an oval about a predetermined reference pixel located at the center thereof and said predetermined reference pixel into a radius of a true circle having a diameter corresponding to the major axis of the oval; a cos4 calculating unit for obtaining, for each pixel, an angle value thereof in proportion to the radius obtained by the conversion and then obtaining a cos4 value of the angle value; and a correction calculating unit for multiplying an inverse of said cos4 value obtained for each pixel by a pixel value of this pixel, thereby to obtain a corrected pixel value for the pixel.

Abstract: An image processing system for correcting digital image data read from a photographic medium. This system includes a diffusing process unit (23) for effecting a diffusing process on an original image composed of the digital image data, thereby to generate a diffused image, and an image correcting unit (25) for generating a corrected image by effecting synthesis between the original image and the diffused image. The system further includes a synthesizing coefficient calculating unit (24) for calculating a synthesizing coefficient for each pixel of the diffused image by using a pixel value of the diffused image as a parameter. The image correcting unit (25) generates the diffused image by effecting the synthesis between the original image and the diffused image according to the synthesizing coefficient. In this, the synthesizing coefficient determines a ratio of the pixel value of the diffused image relative to the pixel value of the corrected image.

Abstract: A conventional undercoating method in repair painting on a damaged vehicle, which includes many working processes, possesses drawbacks of being low in working efficiency and making a finally repaired area exceedingly larger than an initial damaged area. To overcome the drawbacks, the invention provides a undercoat forming method using newly developed putty composed of specific compositions, which is capable of forming a thick coating layer. According to the invention, the processes of polishing of the coating layer by dry sanding and applying the putty respectively can be performed in one operation.

Abstract: In a radiation detecting apparatus, an &agr; ray and &bgr; ray are transmitted through a light shielding film but an incident light is shielded. A first light is emitted from a first scintillator by the &agr; ray transmitted through the light shielding film. The first scintillator has an emission center wavelength based on the &agr; ray. A second light is emitted in a second scintillator by the &bgr; ray transmitted through the light shielding film. The second scintillator has an emission center wavelength based on the &bgr; ray. The first and second lights are detected by two photo-detectors, respectively. The first emission center wavelength and the second emission center wavelength are different from each other.