Abstract: A lens barrel includes a printed-wiring board located on an outside of a lens as viewed in a first direction in which an optical axis of the lens extends and including a first principal surface on an object side, and a coil component including a winding portion and a core portion and mounted on the first principal surface of the printed-wiring board. The core portion includes first and second winding core portions with a gap therebetween in an axial direction in which the first and second winding core portions extend, around which the winding portion is wound. A number of turns of the winding portion around the first winding core portion is smaller than a number of turns of the winding portion around the second winding core portion. The first winding core portion is located on a side closer to an optical axis than the second winding core portion.

Abstract: A contact probe, a method of manufacturing a linked body of contact probes, and a method of manufacturing a contact probe, which allow for stable use are provided. Contact probe includes a contact portion to be brought into contact with an object to be measured, a main body portion connected to the contact portion, and a covering portion covering the whole circumference of a cross section of the main body portion in a direction intersecting with an extensional direction, excluding the contact portion. The covering portion is of a material having a lower volume resistivity than a volume resistivity of a material of the main body portion.

Abstract: According to an embodiment, a probe coming into contact with an electrode pad of a measurement object comprises a connection terminal part integrally formed and connected to a substrate, a contact part having a tapered configuration, and a supporting part which supports the contact part. The contact part extending from an end of the supporting part has a sectional configuration which shares at least one side face with the supporting part.

Abstract: It is an object of the present invention to provide a beam splitter providing a high-contrast image and preventing light from scattering, and a laser scanning microscope provided with the above, in which there is provided a high-quality probe coming in contact with an electrode pad of a semiconductor device, in which a foreign substance is not likely to attach, a configuration is not likely changed and a preferable electrical contact can be maintained for a long time. According to the present invention, a probe coming into contact with an electrode pad of a measurement object comprises a connection terminal part integrally formed and connected to a substrate, a contact part having a tapered configuration, and a supporting part which supports the contact part. The contact part extending from an end of the supporting part has a sectional configuration which shares at least one side face with the supporting part.