Patents by Inventor Kazuo Wakui

Kazuo Wakui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test pattern selection method for testing of integrated circuit
    Patent number: 5844909
    Abstract: The invention provides a test pattern selection method for testing of an integrated circuit which can achieve a high fault coverage using a small number of patterns and minimizes the total testing time. From within a test pattern file which includes L test patterns, N test patterns are read out as a set of temporarily selected patterns, and a fault coverage according to the combination of the N temporarily selected patterns is calculated. Then, one of the other test patterns is successively substituted into one of the N temporarily selected patterns and a fault coverage is calculated for each combination of test patterns. Then, N test patterns of a combination which exhibits the highest one of the fault coverages calculated in this manner are determined as finally selected patterns.
    Type: Grant
    Filed: March 27, 1997
    Date of Patent: December 1, 1998
    Assignee: NEC Corporation
    Inventor: Kazuo Wakui