Patents by Inventor Kazuo Yamauchi

Kazuo Yamauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8436616
    Abstract: A solid-state NMR sample tube and method of using same which can be spun stably and at high speed while suppressing its bending resonance. A solid sample to be investigated by solid-state NMR spectroscopy can be sealed in the sample tube. The sample tube includes a hollow cylinder having opposite ends. At least one of the ends is open. The sample tube has a length L, an outside diameter D, and an inside diameter d which satisfy a given relationship disclosed herein.
    Type: Grant
    Filed: August 4, 2010
    Date of Patent: May 7, 2013
    Assignee: Jeol Ltd.
    Inventors: Yuki Endo, Katsuya Hioka, Kazuo Yamauchi
  • Patent number: 8294893
    Abstract: A flame atomic absorption spectrophotometer in which a combustion gas is burned by a burner to form a flame and a nebulized sample is atomized in the flame, including a flashback detector for detecting an occurrence of a flashback phenomenon of the flame or detecting a state in which a flashback phenomenon is considered to have occurred; a flashback count memory for counting detection of a flashback by the flashback detector and storing a number of count; an ignition inhibitor for inhibiting, in a case where a flashback is detected by the flashback detector, an ignition after the detection; and an inhibition canceller for canceling, in an ignition inhibit state created by the ignition inhibitor, the ignition inhibit state only by a predetermined operation which is changed in accordance with the number of count stored in the flashback count memory.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: October 23, 2012
    Assignee: Shimadzu Corporation
    Inventor: Kazuo Yamauchi
  • Patent number: 8107072
    Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22.
    Type: Grant
    Filed: October 6, 2009
    Date of Patent: January 31, 2012
    Assignee: Shimadzu Corporation
    Inventor: Kazuo Yamauchi
  • Patent number: 8067729
    Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: November 29, 2011
    Assignee: Shimadzu Corporation
    Inventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
  • Publication number: 20110241674
    Abstract: A solid-state NMR sample tube and method of using same which can be spun stably and at high speed while suppressing its bending resonance. A solid sample to be investigated by solid-state NMR spectroscopy can be sealed in the sample tube. The sample tube includes a hollow cylinder having opposite ends. At least one of the ends is open. The sample tube has a length L, an outside diameter D, and an inside diameter d which satisfy a given relationship disclosed herein.
    Type: Application
    Filed: August 4, 2010
    Publication date: October 6, 2011
    Applicant: JEOL Ltd.
    Inventors: Yuki Endo, Katsuya Hioka, Kazuo Yamauchi
  • Patent number: 8013293
    Abstract: A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber (15) and IT block (16) or that of a TOF power unit (20) for applying an ion acceleration voltage is changed, is respectively measured beforehand, and parameters expressing a transfer function based on its response are stored in a transfer function memory (24). During an analysis, a mass shift predicting operation section (25) estimates the current shift length of the mass axis from the current temperatures of the IT block (16) and TOF power unit (20) obtained by first and second temperature sensors (34 and 35) as well as from the two transfer functions stored in the memory (24). A mass shift correcting section (29) corrects the mass axis of the mass spectrum according to the estimated shift length.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: September 6, 2011
    Assignee: Shimadzu Corporation
    Inventors: Kazuo Yamauchi, Takao Okado
  • Publication number: 20100325913
    Abstract: A substrate processing method dose not use or only use the least possible amount of an organic solvent, and can quickly and completely remove a liquid from a wet substrate surface without allowing the liquid to remain on the substrate surface. The substrate processing method for drying a substrate surface which is wet with a liquid, includes: removing the liquid from the substrate surface and sucking the liquid together with its surrounding gas into a gas/liquid suction nozzle, disposed opposite the substrate surface, while relatively moving the gas/liquid suction nozzle and the substrate parallel to each other; and blowing a dry gas from a dry gas supply nozzle, disposed opposite the substrate surface, toward that area of the substrate surface from which the liquid has been removed while relatively moving the dry gas supply nozzle and the substrate parallel to each other.
    Type: Application
    Filed: June 23, 2010
    Publication date: December 30, 2010
    Inventors: Xinming WANG, Kazuo Yamauchi, Akira Kodera, Tsukuru Suzuki, Yasushi Toma, Takayuki Saito, Hirokuni Hiyama
  • Publication number: 20100228498
    Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.
    Type: Application
    Filed: April 26, 2010
    Publication date: September 9, 2010
    Applicant: SHIMADZU CORPORATION
    Inventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
  • Publication number: 20100176292
    Abstract: A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber (15) and IT block (16) or that of a TOF power unit (20) for applying an ion acceleration voltage is changed, is respectively measured beforehand, and parameters expressing a transfer function based on its response are stored in a transfer function memory (24). During an analysis, a mass shift predicting operation section (25) estimates the current shift length of the mass axis from the current temperatures of the IT block (16) and TOF power unit (20) obtained by first and second temperature sensors (34 and 35) as well as from the two transfer functions stored in the memory (24). A mass shift correcting section (29) corrects the mass axis of the mass spectrum according to the estimated shift length.
    Type: Application
    Filed: April 14, 2008
    Publication date: July 15, 2010
    Applicant: SHIMADZU CORPORATION
    Inventors: Kazuo YAMAUCHI, Takao OKADO
  • Publication number: 20100134795
    Abstract: The present invention provides a flame atomic absorption spectrophotometer in which, when a flashback may occur, a continuous use of this apparatus through an easy operation by a user is prohibited, so that the apparatus cannot be used unless its safety is confirmed. In this apparatus, when a flashback occurrence detector 23 detects that a flashback has occurred while the flame was burning, it extinguishes the flame in accordance with a predetermined extinction sequence, sets a flashback occurrence flag to be “1,” and increments a flashback count value. Even if an ignition button 26 is pressed, an ignition is not allowed if the flashback occurrence flag is “1.” When a password that was issued after the safety was confirmed by the manufacturer is entered through an operation unit 41, a password verification unit 40 in a personal computer 4 obtains a flashback count value.
    Type: Application
    Filed: November 25, 2009
    Publication date: June 3, 2010
    Applicant: SHIMADZU CORPORATION
    Inventor: Kazuo YAMAUCHI
  • Publication number: 20100091277
    Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22.
    Type: Application
    Filed: October 6, 2009
    Publication date: April 15, 2010
    Applicant: SHIMADZU CORPORATION
    Inventor: Kazuo YAMAUCHI
  • Publication number: 20090026360
    Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.
    Type: Application
    Filed: April 27, 2006
    Publication date: January 29, 2009
    Applicant: SHIMADZU CORPORATION
    Inventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
  • Patent number: 7482810
    Abstract: The present invention discloses a sample tube for the magic angle high-speed rotation method used in a solid nuclear magnetic resonance device probe wherein a radio wave irradiation/detection coil is disposed close to a sample and a method of measuring a high resolution nuclear magnetic resonance absorption spectrum using the same. This tube is suitable for solid nuclear magnetic resonance (solid NMR) measurements of minute amounts of sample. The sample tube has a capillary part filled with a sample and non-capillary parts situated at its two ends, and a spinner which can be detachably inserted into at least one of the outer ends of the non-capillary parts. The capillary part and non-capillary parts are made of a ceramic and/or polymer material.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: January 27, 2009
    Assignee: National University Corporation Tokyo University of Agriculture and Technology
    Inventors: Kazuo Yamauchi, Tetsuo Asakura
  • Publication number: 20080007262
    Abstract: The present invention discloses a sample tube for the magic angle high-speed rotation method used in a solid nuclear magnetic resonance device probe wherein a radio wave irradiation/detection coil is disposed close to a sample and a method of measuring a high resolution nuclear magnetic resonance absorption spectrum using the same. This tube is suitable for solid nuclear magnetic resonance (solid NMR) measurements of minute amounts of sample. The sample tube has a capillary part filled with a sample and non-capillary parts situated at its two ends, and a spinner which can be detachably inserted into at least one of the outer ends of the non-capillary parts. The capillary part and non-capillary parts are made of a ceramic and/or polymer material.
    Type: Application
    Filed: April 15, 2005
    Publication date: January 10, 2008
    Inventors: Kazuo Yamauchi, Tetsuo Asakura
  • Patent number: 7314574
    Abstract: An etching apparatus comprises a workpiece holder (21) for holding a workpiece (X), a plasma generator (10, 20) for generating a plasma (30) in a vacuum chamber (3), an orifice electrode (4) disposed between the workpiece holder (21) and the plasma generator (10, 20), and a grid electrode (5) disposed upstream of the orifice electrode (4) in the vacuum chamber (3). The orifice electrode (4) has orifices (4a) defined therein. The etching apparatus further comprises a voltage applying unit (25, 26) for applying a voltage between the orifice electrode (4) and the grid electrode (5) to accelerate ions from the plasma (30) generated by the plasma generator (10, 20) and to pass the extracted ions through the orifices (4a) in the orifice electrode (4), for generating a collimated neutral particle beam having an energy ranging from 10 eV to 50 eV.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: January 1, 2008
    Assignee: Ebara Corporation
    Inventors: Katsunori Ichiki, Kazuo Yamauchi, Hirokuni Hiyama, Seiji Samukawa
  • Publication number: 20070088266
    Abstract: A residual liquid quantity in a syringe is reduced to the minimum. There are detected with high precision malfunctions due to chokes in pipes and incomplete switchings of an electromagnetic valve and a broken valve without a contamination problem produced. When a syringe pump is powered on, a motor is driven at low speed so that liquid in a syringe is discharged completely. When a desynchronization of the motor is detected by comparing motor driving pulses obtained by a rotary encoder with motor driving pulses supplied to the motor, a stop signal is supplied to a motor driver and the position of a rod is memorized as the origin of the syringe pump in an origin sensor. While the syringe pump is in a normal operating state, the position of the rod is detected to be at the origin to supply a stop signal to the motor driver.
    Type: Application
    Filed: August 1, 2006
    Publication date: April 19, 2007
    Applicant: FURUNO ELECTRIC COMPANY, LIMITED
    Inventors: Kazuo Yamauchi, Takayoshi Sawano, Noriaki Yamamoto
  • Patent number: 7144520
    Abstract: An etching apparatus comprises a workpiece holder (21) for holding a workpiece (X), a plasma generator (10, 20) for generating a plasma (30) in a vacuum chamber (3), an orifice electrode (4) disposed between the workpiece holder (21) and the plasma generator (10, 20), and a grid electrode (5) disposed upstream of the orifice electrode (4) in the vacuum chamber (3). The orifice electrode (4) has orifices (4a) defined therein. The etching apparatus further comprises a voltage applying unit (25, 26) for applying a voltage between the orifice electrode (4) and the grid electrode (5) to accelerate ions from the plasma (30) generated by the plasma generator (10, 20) and to pass the extracted ions through the orifices (4a) in the orifice electrode (4). A first collimated neutral particle beam is generated and applied to the workpiece (X) for etching a surface of a processing layer (60) of the workpiece (X).
    Type: Grant
    Filed: November 8, 2002
    Date of Patent: December 5, 2006
    Assignees: Ebara Corporation, Japan as Represented by President of Tohoku University
    Inventors: Katsunori Ichiki, Kazuo Yamauchi, Hirokuni Hiyama, Seiji Samukawa
  • Patent number: 7078862
    Abstract: A beam source has a plasma generating chamber, an antenna for generating plasma in the plasma generating chamber, a first electrode disposed in the plasma generating chamber, and a second electrode disposed in the plasma generating chamber. Both of the antenna and the second electrode face the first electrode. The beam source also includes a power supply for applying a voltage between the first electrode and the second electrode to extract particles from the plasma generated by the antenna. The beam source applies various kinds of beams having a large diameter, such as a positive ion beam, a negative ion beam, and a neutral particle beam, uniformly to a workpiece.
    Type: Grant
    Filed: March 11, 2004
    Date of Patent: July 18, 2006
    Assignees: Ebara Corporation, Tohoku University
    Inventors: Akira Fukuda, Akio Shibata, Hirokuni Hiyama, Katsunori Ichiki, Kazuo Yamauchi, Seiji Samukawa
  • Patent number: 7060946
    Abstract: An analytical device includes a heat output portion for heating an interior of a housing with which an analyzing portion is surrounded; a first temperature sensor for measuring a temperature of the analyzing portion; a second temperature sensor for measuring a temperature of an interior of the housing; and a control portion. The control portion determines a setting value of the temperature in the housing according to a transfer function of a PID control based on a difference between a preset temperature of the analyzing portion and the temperature measured by the first temperature sensor. Further, the control portion determines an output value of the heat output portion according to a transfer function of PID control based on a difference between the setting value of the temperature in the housing and the temperature measured by the second temperature sensor.
    Type: Grant
    Filed: November 23, 2004
    Date of Patent: June 13, 2006
    Assignee: Shimadzu Corporation
    Inventor: Kazuo Yamauchi
  • Patent number: RE49929
    Abstract: A first embodiment of a substrate for a high-frequency printed wiring board according to the present disclosure is directed to a substrate for a high-frequency printed wiring board, the substrate including: a dielectric layer including a fluororesin and an inorganic filler; and a copper foil layered on at least one surface of the dielectric layer, wherein a surface of the copper foil at the dielectric layer side has a maximum height roughness (Rz) of less than or equal to 2 ?m, and a ratio of the number of inorganic atoms of the inorganic filler to the number of fluorine atoms of the fluororesin in a superficial region of the dielectric layer at the copper foil side is less than or equal to 0.08.
    Type: Grant
    Filed: November 17, 2021
    Date of Patent: April 16, 2024
    Assignees: Sumitomo Electric Industries, Ltd., SUMITOMO ELECTRIC PRINTED CIRCUITS, INC.
    Inventors: Shingo Kaimori, Masaaki Yamauchi, Kentaro Okamoto, Satoshi Kiya, Kazuo Murata