Patents by Inventor Kazuo Yamauchi
Kazuo Yamauchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8436616Abstract: A solid-state NMR sample tube and method of using same which can be spun stably and at high speed while suppressing its bending resonance. A solid sample to be investigated by solid-state NMR spectroscopy can be sealed in the sample tube. The sample tube includes a hollow cylinder having opposite ends. At least one of the ends is open. The sample tube has a length L, an outside diameter D, and an inside diameter d which satisfy a given relationship disclosed herein.Type: GrantFiled: August 4, 2010Date of Patent: May 7, 2013Assignee: Jeol Ltd.Inventors: Yuki Endo, Katsuya Hioka, Kazuo Yamauchi
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Patent number: 8294893Abstract: A flame atomic absorption spectrophotometer in which a combustion gas is burned by a burner to form a flame and a nebulized sample is atomized in the flame, including a flashback detector for detecting an occurrence of a flashback phenomenon of the flame or detecting a state in which a flashback phenomenon is considered to have occurred; a flashback count memory for counting detection of a flashback by the flashback detector and storing a number of count; an ignition inhibitor for inhibiting, in a case where a flashback is detected by the flashback detector, an ignition after the detection; and an inhibition canceller for canceling, in an ignition inhibit state created by the ignition inhibitor, the ignition inhibit state only by a predetermined operation which is changed in accordance with the number of count stored in the flashback count memory.Type: GrantFiled: November 25, 2009Date of Patent: October 23, 2012Assignee: Shimadzu CorporationInventor: Kazuo Yamauchi
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Patent number: 8107072Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22.Type: GrantFiled: October 6, 2009Date of Patent: January 31, 2012Assignee: Shimadzu CorporationInventor: Kazuo Yamauchi
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Patent number: 8067729Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.Type: GrantFiled: April 26, 2010Date of Patent: November 29, 2011Assignee: Shimadzu CorporationInventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
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Publication number: 20110241674Abstract: A solid-state NMR sample tube and method of using same which can be spun stably and at high speed while suppressing its bending resonance. A solid sample to be investigated by solid-state NMR spectroscopy can be sealed in the sample tube. The sample tube includes a hollow cylinder having opposite ends. At least one of the ends is open. The sample tube has a length L, an outside diameter D, and an inside diameter d which satisfy a given relationship disclosed herein.Type: ApplicationFiled: August 4, 2010Publication date: October 6, 2011Applicant: JEOL Ltd.Inventors: Yuki Endo, Katsuya Hioka, Kazuo Yamauchi
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Patent number: 8013293Abstract: A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber (15) and IT block (16) or that of a TOF power unit (20) for applying an ion acceleration voltage is changed, is respectively measured beforehand, and parameters expressing a transfer function based on its response are stored in a transfer function memory (24). During an analysis, a mass shift predicting operation section (25) estimates the current shift length of the mass axis from the current temperatures of the IT block (16) and TOF power unit (20) obtained by first and second temperature sensors (34 and 35) as well as from the two transfer functions stored in the memory (24). A mass shift correcting section (29) corrects the mass axis of the mass spectrum according to the estimated shift length.Type: GrantFiled: April 14, 2008Date of Patent: September 6, 2011Assignee: Shimadzu CorporationInventors: Kazuo Yamauchi, Takao Okado
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Publication number: 20100325913Abstract: A substrate processing method dose not use or only use the least possible amount of an organic solvent, and can quickly and completely remove a liquid from a wet substrate surface without allowing the liquid to remain on the substrate surface. The substrate processing method for drying a substrate surface which is wet with a liquid, includes: removing the liquid from the substrate surface and sucking the liquid together with its surrounding gas into a gas/liquid suction nozzle, disposed opposite the substrate surface, while relatively moving the gas/liquid suction nozzle and the substrate parallel to each other; and blowing a dry gas from a dry gas supply nozzle, disposed opposite the substrate surface, toward that area of the substrate surface from which the liquid has been removed while relatively moving the dry gas supply nozzle and the substrate parallel to each other.Type: ApplicationFiled: June 23, 2010Publication date: December 30, 2010Inventors: Xinming WANG, Kazuo Yamauchi, Akira Kodera, Tsukuru Suzuki, Yasushi Toma, Takayuki Saito, Hirokuni Hiyama
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Publication number: 20100228498Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.Type: ApplicationFiled: April 26, 2010Publication date: September 9, 2010Applicant: SHIMADZU CORPORATIONInventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
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Publication number: 20100176292Abstract: A shift of mass axis that occurs when the temperature of a vacuum container consisting of a vacuum chamber (15) and IT block (16) or that of a TOF power unit (20) for applying an ion acceleration voltage is changed, is respectively measured beforehand, and parameters expressing a transfer function based on its response are stored in a transfer function memory (24). During an analysis, a mass shift predicting operation section (25) estimates the current shift length of the mass axis from the current temperatures of the IT block (16) and TOF power unit (20) obtained by first and second temperature sensors (34 and 35) as well as from the two transfer functions stored in the memory (24). A mass shift correcting section (29) corrects the mass axis of the mass spectrum according to the estimated shift length.Type: ApplicationFiled: April 14, 2008Publication date: July 15, 2010Applicant: SHIMADZU CORPORATIONInventors: Kazuo YAMAUCHI, Takao OKADO
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Publication number: 20100134795Abstract: The present invention provides a flame atomic absorption spectrophotometer in which, when a flashback may occur, a continuous use of this apparatus through an easy operation by a user is prohibited, so that the apparatus cannot be used unless its safety is confirmed. In this apparatus, when a flashback occurrence detector 23 detects that a flashback has occurred while the flame was burning, it extinguishes the flame in accordance with a predetermined extinction sequence, sets a flashback occurrence flag to be “1,” and increments a flashback count value. Even if an ignition button 26 is pressed, an ignition is not allowed if the flashback occurrence flag is “1.” When a password that was issued after the safety was confirmed by the manufacturer is entered through an operation unit 41, a password verification unit 40 in a personal computer 4 obtains a flashback count value.Type: ApplicationFiled: November 25, 2009Publication date: June 3, 2010Applicant: SHIMADZU CORPORATIONInventor: Kazuo YAMAUCHI
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Publication number: 20100091277Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22.Type: ApplicationFiled: October 6, 2009Publication date: April 15, 2010Applicant: SHIMADZU CORPORATIONInventor: Kazuo YAMAUCHI
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Publication number: 20090026360Abstract: In a mass analysis data analyzing apparatus, centroid data is used as mass spectrum data to be analyzed. First, peaks on the centroid data are specified in order of intensity as a standard peak for identifying an isotopic cluster. The isotopic cluster is detected by comparing an emerging pattern of peaks near the standard peak and an emerging pattern of peaks of an expected isotopic cluster in the case where each valence is assumed. The valence of the determined isotopic cluster is set as the valence of the peaks belonging to the isotopic cluster, and the peak at the forefront of cluster is selected as a monoisotopic peak. With such a mass analysis data analyzing apparatus, it is possible to determine the valence of each peak and identify the monoisotopic peak in a mass spectrum.Type: ApplicationFiled: April 27, 2006Publication date: January 29, 2009Applicant: SHIMADZU CORPORATIONInventors: Kazuo Yamauchi, Yoshitake Yamamoto, Yoshikatsu Umemura
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Patent number: 7482810Abstract: The present invention discloses a sample tube for the magic angle high-speed rotation method used in a solid nuclear magnetic resonance device probe wherein a radio wave irradiation/detection coil is disposed close to a sample and a method of measuring a high resolution nuclear magnetic resonance absorption spectrum using the same. This tube is suitable for solid nuclear magnetic resonance (solid NMR) measurements of minute amounts of sample. The sample tube has a capillary part filled with a sample and non-capillary parts situated at its two ends, and a spinner which can be detachably inserted into at least one of the outer ends of the non-capillary parts. The capillary part and non-capillary parts are made of a ceramic and/or polymer material.Type: GrantFiled: April 15, 2005Date of Patent: January 27, 2009Assignee: National University Corporation Tokyo University of Agriculture and TechnologyInventors: Kazuo Yamauchi, Tetsuo Asakura
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Publication number: 20080007262Abstract: The present invention discloses a sample tube for the magic angle high-speed rotation method used in a solid nuclear magnetic resonance device probe wherein a radio wave irradiation/detection coil is disposed close to a sample and a method of measuring a high resolution nuclear magnetic resonance absorption spectrum using the same. This tube is suitable for solid nuclear magnetic resonance (solid NMR) measurements of minute amounts of sample. The sample tube has a capillary part filled with a sample and non-capillary parts situated at its two ends, and a spinner which can be detachably inserted into at least one of the outer ends of the non-capillary parts. The capillary part and non-capillary parts are made of a ceramic and/or polymer material.Type: ApplicationFiled: April 15, 2005Publication date: January 10, 2008Inventors: Kazuo Yamauchi, Tetsuo Asakura
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Patent number: 7314574Abstract: An etching apparatus comprises a workpiece holder (21) for holding a workpiece (X), a plasma generator (10, 20) for generating a plasma (30) in a vacuum chamber (3), an orifice electrode (4) disposed between the workpiece holder (21) and the plasma generator (10, 20), and a grid electrode (5) disposed upstream of the orifice electrode (4) in the vacuum chamber (3). The orifice electrode (4) has orifices (4a) defined therein. The etching apparatus further comprises a voltage applying unit (25, 26) for applying a voltage between the orifice electrode (4) and the grid electrode (5) to accelerate ions from the plasma (30) generated by the plasma generator (10, 20) and to pass the extracted ions through the orifices (4a) in the orifice electrode (4), for generating a collimated neutral particle beam having an energy ranging from 10 eV to 50 eV.Type: GrantFiled: September 24, 2002Date of Patent: January 1, 2008Assignee: Ebara CorporationInventors: Katsunori Ichiki, Kazuo Yamauchi, Hirokuni Hiyama, Seiji Samukawa
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Publication number: 20070088266Abstract: A residual liquid quantity in a syringe is reduced to the minimum. There are detected with high precision malfunctions due to chokes in pipes and incomplete switchings of an electromagnetic valve and a broken valve without a contamination problem produced. When a syringe pump is powered on, a motor is driven at low speed so that liquid in a syringe is discharged completely. When a desynchronization of the motor is detected by comparing motor driving pulses obtained by a rotary encoder with motor driving pulses supplied to the motor, a stop signal is supplied to a motor driver and the position of a rod is memorized as the origin of the syringe pump in an origin sensor. While the syringe pump is in a normal operating state, the position of the rod is detected to be at the origin to supply a stop signal to the motor driver.Type: ApplicationFiled: August 1, 2006Publication date: April 19, 2007Applicant: FURUNO ELECTRIC COMPANY, LIMITEDInventors: Kazuo Yamauchi, Takayoshi Sawano, Noriaki Yamamoto
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Patent number: 7144520Abstract: An etching apparatus comprises a workpiece holder (21) for holding a workpiece (X), a plasma generator (10, 20) for generating a plasma (30) in a vacuum chamber (3), an orifice electrode (4) disposed between the workpiece holder (21) and the plasma generator (10, 20), and a grid electrode (5) disposed upstream of the orifice electrode (4) in the vacuum chamber (3). The orifice electrode (4) has orifices (4a) defined therein. The etching apparatus further comprises a voltage applying unit (25, 26) for applying a voltage between the orifice electrode (4) and the grid electrode (5) to accelerate ions from the plasma (30) generated by the plasma generator (10, 20) and to pass the extracted ions through the orifices (4a) in the orifice electrode (4). A first collimated neutral particle beam is generated and applied to the workpiece (X) for etching a surface of a processing layer (60) of the workpiece (X).Type: GrantFiled: November 8, 2002Date of Patent: December 5, 2006Assignees: Ebara Corporation, Japan as Represented by President of Tohoku UniversityInventors: Katsunori Ichiki, Kazuo Yamauchi, Hirokuni Hiyama, Seiji Samukawa
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Patent number: 7078862Abstract: A beam source has a plasma generating chamber, an antenna for generating plasma in the plasma generating chamber, a first electrode disposed in the plasma generating chamber, and a second electrode disposed in the plasma generating chamber. Both of the antenna and the second electrode face the first electrode. The beam source also includes a power supply for applying a voltage between the first electrode and the second electrode to extract particles from the plasma generated by the antenna. The beam source applies various kinds of beams having a large diameter, such as a positive ion beam, a negative ion beam, and a neutral particle beam, uniformly to a workpiece.Type: GrantFiled: March 11, 2004Date of Patent: July 18, 2006Assignees: Ebara Corporation, Tohoku UniversityInventors: Akira Fukuda, Akio Shibata, Hirokuni Hiyama, Katsunori Ichiki, Kazuo Yamauchi, Seiji Samukawa
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Patent number: 7060946Abstract: An analytical device includes a heat output portion for heating an interior of a housing with which an analyzing portion is surrounded; a first temperature sensor for measuring a temperature of the analyzing portion; a second temperature sensor for measuring a temperature of an interior of the housing; and a control portion. The control portion determines a setting value of the temperature in the housing according to a transfer function of a PID control based on a difference between a preset temperature of the analyzing portion and the temperature measured by the first temperature sensor. Further, the control portion determines an output value of the heat output portion according to a transfer function of PID control based on a difference between the setting value of the temperature in the housing and the temperature measured by the second temperature sensor.Type: GrantFiled: November 23, 2004Date of Patent: June 13, 2006Assignee: Shimadzu CorporationInventor: Kazuo Yamauchi
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Patent number: RE49929Abstract: A first embodiment of a substrate for a high-frequency printed wiring board according to the present disclosure is directed to a substrate for a high-frequency printed wiring board, the substrate including: a dielectric layer including a fluororesin and an inorganic filler; and a copper foil layered on at least one surface of the dielectric layer, wherein a surface of the copper foil at the dielectric layer side has a maximum height roughness (Rz) of less than or equal to 2 ?m, and a ratio of the number of inorganic atoms of the inorganic filler to the number of fluorine atoms of the fluororesin in a superficial region of the dielectric layer at the copper foil side is less than or equal to 0.08.Type: GrantFiled: November 17, 2021Date of Patent: April 16, 2024Assignees: Sumitomo Electric Industries, Ltd., SUMITOMO ELECTRIC PRINTED CIRCUITS, INC.Inventors: Shingo Kaimori, Masaaki Yamauchi, Kentaro Okamoto, Satoshi Kiya, Kazuo Murata