Patents by Inventor Kazushi Hanakawa

Kazushi Hanakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180353773
    Abstract: A treatment planning apparatus of the present invention comprises a processor configured to predict a degree of sharpness of an X-ray image which is acquired with assumed X-ray intensity and calculate position uncertainty of an affected area, calculate irradiation parameters of a therapeutic radiation based on the calculated position uncertainty of the affected area, calculate an X-ray irradiation amount with which a patient is irradiated by an X-ray imaging device with the assumed X-ray intensity and calculate a dose distribution of the therapeutic radiation which is irradiated to the patient using the calculated irradiation parameters of the therapeutic radiation and a display that displays the calculated X-ray irradiation amount and the calculated therapeutic radiation dose distribution.
    Type: Application
    Filed: November 17, 2015
    Publication date: December 13, 2018
    Applicant: HITACHI, LTD.
    Inventors: Yusuke SAKAMOTO, Kazushi HANAKAWA
  • Patent number: 9881711
    Abstract: A beam shaping device included in a beam transport system is provided with: a pre-stage quadrupole electromagnet that reduces a distribution width of x-angle components that are inclinations in the x-direction of the charged particles in the beam with respect to the traveling direction; a penumbra expander that moderates an end profile of a particle-number distribution of the x-angle components in the beam having passed through the pre-stage quadrupole electromagnet; and a post-stage quadrupole electromagnet that adjusts a betatron phase in a phase-space distribution in the x-direction, of the beam having passed through the penumbra expander; wherein the post-stage quadrupole electromagnet adjusts a phase advance angle of the betatron phase from the penumbra expander to the isocenter, to be in a range of an odd multiple of 90 degreesĀ±45 degrees.
    Type: Grant
    Filed: September 12, 2014
    Date of Patent: January 30, 2018
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Shuhei Odawara, Kazushi Hanakawa
  • Publication number: 20170213613
    Abstract: A beam shaping device included in a beam transport system is provided with: a pre-stage quadrupole electromagnet that reduces a distribution width of x-angle components that are inclinations in the x-direction of the charged particles in the beam with respect to the traveling direction; a penumbra expander that moderates an end profile of a particle-number distribution of the x-angle components in the beam having passed through the pre-stage quadrupole electromagnet; and a post-stage quadrupole electromagnet that adjusts a betatron phase in a phase-space distribution in the x-direction, of the beam having passed through the penumbra expander; wherein the post-stage quadrupole electromagnet adjusts a phase advance angle of the betatron phase from the penumbra expander to the isocenter, to be in a range of an odd multiple of 90 degreesĀ±45 degrees.
    Type: Application
    Filed: September 12, 2014
    Publication date: July 27, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Shuhei ODAWARA, Kazushi HANAKAWA
  • Patent number: 9630027
    Abstract: In a beam transport system, based on a beam temporal-variation related amount that has been calculated by a beam analyzer and that is a beam-position temporal variation amount or a beam diameter at a beam profile monitor, an optical parameter calculator calculates a start-point momentum dispersion function that is a momentum dispersion function (?, ??) of a charged particle beam at a start point in design of the beam transport system that is set on a beam trajectory of the accelerator; and calculates optical parameters using, as an initial condition, the start-point momentum dispersion function and a beginning condition at an irradiation position at the time of detecting profile data.
    Type: Grant
    Filed: July 11, 2013
    Date of Patent: April 25, 2017
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kazushi Hanakawa, Kengo Sugahara, Shuhei Odawara
  • Patent number: 9402298
    Abstract: A method of manufacturing a radio frequency accelerator that accelerates charged particles injected into a second-stage linear accelerator from a first-stage linear accelerator includes a step of setting a value of a power distribution factor R for the power distributor to supply radio frequency power to the second-stage linear accelerator and a value of a ratio L/? of a length L of the matching section between the outlet of the first-stage linear accelerator and the inlet of the second-stage linear accelerator to the angular frequency ? of the radio frequency power, so that a charged particle beam is extracted from the second-stage linear accelerator over a range of the total radio frequency power wider than a widest allowable range among allowable total radio frequency power ranges determined for each phase of charged particles on the basis of phase acceptance of the second-stage accelerator.
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: July 26, 2016
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kengo Sugahara, Kazushi Hanakawa, Yasuto Kishii, Kazuo Yamamoto
  • Patent number: 9387346
    Abstract: A particle beam treatment system includes an accelerator system that accelerates a charged particle beam and a beam transport system that transports a high-energy beam emitted from the accelerator to an irradiation location, wherein the beam transport system is provided with at least one steering electromagnet and at least one beam position monitor corresponding to the at least one steering electromagnet, and wherein the at least one beam position monitor supplies an excitation current for correcting a beam position, which periodically varies, to the at least one steering electromagnet.
    Type: Grant
    Filed: September 21, 2012
    Date of Patent: July 12, 2016
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kazushi Hanakawa, Kengo Sugahara, Shuhei Odawara, Hisashi Harada, Masahiro Ikeda, Toshihiro Otani, Taizo Honda, Katsuhisa Yoshida
  • Publication number: 20160144202
    Abstract: In a beam transport system, based on a beam temporal-variation related amount that has been calculated by a beam analyzer and that is a beam-position temporal variation amount or a beam diameter at a beam profile monitor, an optical parameter calculator calculates a start-point momentum dispersion function that is a momentum dispersion function (?, ??) of a charged particle beam at a start point in design of the beam transport system that is set on a beam trajectory of the accelerator; and calculates optical parameters using, as an initial condition, the start-point momentum dispersion function and a beginning condition at an irradiation position at the time of detecting profile data.
    Type: Application
    Filed: July 11, 2013
    Publication date: May 26, 2016
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kazushi HANAKAWA, Kengo SUGAHARA, Shuhei ODAWARA
  • Patent number: 9312100
    Abstract: In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: April 12, 2016
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Toshihiro Otani, Hisashi Harada, Masahiro Ikeda, Kazushi Hanakawa, Taizo Honda
  • Publication number: 20160014877
    Abstract: A method of manufacturing a radio frequency accelerator that accelerates charged particles injected into a second-stage linear accelerator from a first-stage linear accelerator includes a step of setting a value of a power distribution factor R for the power distributor to supply radio frequency power to the second-stage linear accelerator and a value of a ratio L/? of a length L of the matching section between the outlet of the first-stage linear accelerator and the inlet of the second-stage linear accelerator to the angular frequency ? of the radio frequency power, so that a charged particle beam is extracted from the second-stage linear accelerator over a range of the total radio frequency power wider than a widest allowable range among allowable total radio frequency power ranges determined for each phase of charged particles on the basis of phase acceptance of the second-stage accelerator.
    Type: Application
    Filed: February 28, 2013
    Publication date: January 14, 2016
    Applicant: Mitsubishi Electric Corporation
    Inventors: Kengo SUGAHARA, Kazushi HANAKAWA, Yasuto KISHII, Kazuo YAMAMOTO
  • Patent number: 9101763
    Abstract: A particle beam irradiation apparatus according to the present invention is provided with a vacuum duct that forms a vacuum region through which the charged particle beam passes, a vacuum window through which the charged particle beam is launched from the vacuum region, a scanning electromagnet that scans the charged particle beam; a monitoring apparatus including a position monitor that detects the passing position of a charged particle beam and the beam size thereof, a low-scattering gas filling chamber including the monitoring apparatus, and an irradiation management apparatus that controls irradiation of the charged particle beam; the particle beam irradiation apparatus is characterized in that the low-scattering gas filling chamber is changeably disposed in such a manner that the beam-axis-direction positional relationship between the monitoring apparatus and the vacuum window is a desired one and in that the low-scattering gas filling chamber is filled with a low-scattering gas.
    Type: Grant
    Filed: November 3, 2011
    Date of Patent: August 11, 2015
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masahiro Ikeda, Hisashi Harada, Kazushi Hanakawa, Toshihiro Otani, Tadashi Katayose, Taizo Honda, Yukiko Yamada, Yuehu Pu
  • Patent number: 9079025
    Abstract: In gantry type particle beam irradiation system comprising a gantry and being configured to irradiate a particle beam, which has small emittance in X direction and large emittance in Y direction at an extraction position of a circular accelerator, from an irradiation nozzle installed in the gantry to an irradiation target, the irradiation nozzle has a ridge filter which is installed so as for a direction in which emittance in X direction is maintained to tilt to a direction which is perpendicular to a ridge of the ridge filter by a predetermined angle in the state where the gantry is a reference angle.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: July 14, 2015
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Kengo Sugahara, Kazushi Hanakawa, Taizo Honda
  • Patent number: 9067066
    Abstract: A control unit is provided with, a retaining section that retains a plurality of operation patterns each being a pattern of operation to be periodically repeated by an accelerator, the operation patterns having respective operation conditions adjusted for different emission times of an particle beam, to cause a deflection electromagnet in the accelerator to have an intended magnetic field intensity even under a presence of a hysteresis; a reading section for a plurality of slices of an irradiation target in a depth direction, which reads an irradiation condition for each of the slices; a selection section that selects the operation pattern suitable for each of the slices, on the basis of the read irradiation condition; and a main control section that controls, for each of the slices, the accelerator on the basis of the selected operation pattern and an irradiation device on the basis of the irradiation condition.
    Type: Grant
    Filed: March 27, 2012
    Date of Patent: June 30, 2015
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Yukiko Yamada, Hisashi Harada, Taizo Honda, Masahiro Ikeda, Kazushi Hanakawa, Toshihiro Otani, Tadashi Katayose
  • Patent number: 9067065
    Abstract: The particle beam irradiation apparatus comprises: a position monitor that detects a passing position of a charged particle beam; and an irradiation control apparatus that calculates a distance from a predetermined reference point to the position monitor, calculates a beam irradiation position on an irradiation subject, and controls irradiation of the beam; wherein the irradiation control apparatus includes a position calculation apparatus that calculates the beam irradiation position, based on a beam position detected by the position monitor, a scanning starting point distance information on a distance from a irradiation plane of the irradiation subject to a scanning starting point, of the beam, in a scanning electromagnet, and a position monitor distance information on a distance, from the irradiation plane to the position monitor, that is calculated based on the calculated distance.
    Type: Grant
    Filed: March 7, 2011
    Date of Patent: June 30, 2015
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Yukiko Yamada, Hisashi Harada, Takaaki Iwata, Toshihiro Otani, Masahiro Ikeda, Kazushi Hanakawa, Taizo Honda
  • Publication number: 20150031934
    Abstract: In gantry type particle beam irradiation system comprising a gantry and being configured to irradiate a particle beam, which has small emittance in X direction and large emittance in Y direction at an extraction position of a circular accelerator, from an irradiation nozzle installed in the gantry to an irradiation target, the irradiation nozzle has a ridge filter which is installed so as for a direction in which emittance in X direction is maintained to tilt to a direction which is perpendicular to a ridge of the ridge filter by a predetermined angle in the state where the gantry is a reference angle.
    Type: Application
    Filed: April 19, 2012
    Publication date: January 29, 2015
    Applicant: Mitsubishi Electric Corporation
    Inventors: Kengo Sugahara, Kazushi Hanakawa, Taizo Honda
  • Patent number: 8933420
    Abstract: A particle beam therapy system comprising a treatment table, a treatment table control unit and an irradiation control unit configured to output an instruction for controlling the treatment table control unit, an accelerator and a scanning electromagnet, wherein after the treatment table control unit controls the treatment table so as for a patient isocenter which is reference position of an affected area of a patient to move to a position of an irradiation isocenter which is set at a position which is closer to an irradiation nozzle than an equipment isocenter which is reference of positional relation of the irradiation nozzle and the treatment table, the irradiation control unit outputs an instruction for irradiating the patient with a particle beam.
    Type: Grant
    Filed: November 2, 2011
    Date of Patent: January 13, 2015
    Assignee: Mitsubishi Electric Corporation
    Inventors: Masahiro Ikeda, Hisashi Harada, Kazushi Hanakawa, Toshihiro Otani, Tadashi Katayose, Taizo Honda, Yukiko Yamada, Yuehu Pu
  • Publication number: 20140374624
    Abstract: In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
    Type: Application
    Filed: September 5, 2014
    Publication date: December 25, 2014
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Toshihiro OTANI, Hisashi HARADA, Masahiro IKEDA, Kazushi HANAKAWA, Taizo HONDA
  • Publication number: 20140323793
    Abstract: A control unit is provided with, a retaining section that retains a plurality of operation patterns each being a pattern of operation to be periodically repeated by an accelerator, the operation patterns having respective operation conditions adjusted for different emission times of an particle beam, to cause a deflection electromagnet in the accelerator to have an intended magnetic field intensity even under a presence of a hysteresis; a reading section for a plurality of slices of an irradiation target in a depth direction, which reads an irradiation condition for each of the slices; a selection section that selects the operation pattern suitable for each of the slices, on the basis of the read irradiation condition; and a main control section that controls, for each of the slices, the accelerator on the basis of the selected operation pattern and an irradiation device on the basis of the irradiation condition.
    Type: Application
    Filed: March 27, 2012
    Publication date: October 30, 2014
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Yukiko Yamada, Hisashi Harada, Taizo Honda, Masahiro Ikeda, Kazushi Hanakawa, Toshihiro Otani, Tadashi Katayose
  • Patent number: 8854048
    Abstract: In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: October 7, 2014
    Assignee: Mitsubishi Electric Corporation
    Inventors: Toshihiro Otani, Hisashi Harada, Masahiro Ikeda, Kazushi Hanakawa, Taizo Honda
  • Publication number: 20140235922
    Abstract: A particle beam treatment system includes an accelerator system that accelerates a charged particle beam and a beam transport system that transports a high-energy beam emitted from the accelerator to an irradiation location, wherein the beam transport system is provided with at least one steering electromagnet and at least one beam position monitor corresponding to the at least one steering electromagnet, and wherein the at least one beam position monitor supplies an excitation current for correcting a beam position, which periodically varies, to the at least one steering electromagnet.
    Type: Application
    Filed: September 21, 2012
    Publication date: August 21, 2014
    Applicant: Mitsubishi Electric Corporation
    Inventors: Kazushi Hanakawa, Kengo Sugahara, Shuhei Odawara, Hisashi Harada, Masahiro Ikeda, Toshihiro Otani, Taizo Honda, Katsuhisa Yoshida
  • Publication number: 20140228615
    Abstract: A particle beam irradiation apparatus according to the present invention is provided with a vacuum duct that forms a vacuum region through which the charged particle beam passes, a vacuum window through which the charged particle beam is launched from the vacuum region, a scanning electromagnet that scans the charged particle beam; a monitoring apparatus including a position monitor that detects the passing position of a charged particle beam and the beam size thereof, a low-scattering gas filling chamber including the monitoring apparatus, and an irradiation management apparatus that controls irradiation of the charged particle beam; the particle beam irradiation apparatus is characterized in that the low-scattering gas filling chamber is changeably disposed in such a manner that the beam-axis-direction positional relationship between the monitoring apparatus and the vacuum window is a desired one and in that the low-scattering gas filling chamber is filled with a low-scattering gas.
    Type: Application
    Filed: November 3, 2011
    Publication date: August 14, 2014
    Applicant: Mitsubishi Electric Corporation
    Inventors: Masahiro Ikeda, Hisashi Harada, Kazushi Hanakawa, Toshihiro Otani, Tadashi Katayose, Taizo Honda, Yukiko Yamada, Yuehu Pu