Abstract: [Problems] To provide a semiconductor integrated circuit by which what has been referred to as two-pattern test is made possible without greatly increasing an occupying area. [Means for Solving Problems] the semiconductor integrated circuit is provided with a plurality of flip-flop circuits and selectors corresponding to each flip-flop circuit. Each flip-flop circuit is provided with a master latch and a slave latch connected to the master latch. The selector is electrically connected with the master latch of the flip-flop circuit to which the selector corresponds, and is also connected with the master latch of the flip-flop circuit other than the one to which the selector corresponds.