Patents by Inventor Kazuya NABETA

Kazuya NABETA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210092798
    Abstract: Described herein is a technique capable of preventing a deterioration in controllability of a gas flow rate in a substrate processing apparatus. According to one aspect thereof a substrate processing apparatus includes: a process furnace including a process chamber; a process gas supply path; a process gas supply controller; a heater configured to heat at least a part of the process gas supply controller or the process gas supply path; a gas box accommodating the process gas supply path, the process gas supply controller and the heater. The gas box includes: an inlet port configured to introduce an outer atmosphere; an exhaust port connected to an exhaust duct and configured to exhaust an inner atmosphere to the exhaust duct; a temperature controller configured to lower and monitor a temperature of the inner atmosphere; and a gas leakage sensor configured to detect the process gas leaked in the gas box.
    Type: Application
    Filed: September 17, 2020
    Publication date: March 25, 2021
    Inventors: Kazuya NABETA, Motoya TAKEWAKI
  • Patent number: 10755962
    Abstract: A stable and highly reliable device for detecting damage or contact failures of respective parts is provided. The device includes a processing chamber for processing a substrate; a heater for heating the substrate; a substrate support accommodating the heater and installed inside the processing chamber; a shaft for supporting the substrate support; a wire inserted through the shaft; a supporting unit for holding the wire; and a temperature detector connected to the supporting unit.
    Type: Grant
    Filed: March 1, 2016
    Date of Patent: August 25, 2020
    Assignee: KOKUSAI ELECTRIC CORPORATION
    Inventors: Kazuya Nabeta, Naoki Ukae, Mitsunori Takeshita
  • Patent number: 9842754
    Abstract: In the present invention, a substrate is placed at a predetermined position on a substrate support even though the substrate is deviated on a substrate transfer unit. There is provided a substrate processing apparatus that includes a process chamber, a transfer chamber accommodating a substrate transfer unit, a substrate detecting unit, a memory unit configured to store a first reference position information, a second reference position information and a substrate reference position information and a controller configured to generate a detected position information representing a position of a substrate being transferred in the transfer chamber based on a detection result and to control the substrate transfer unit to place the substrate based on the detected position information, the first reference position information, the substrate reference position information and a difference between the first reference position information and the second reference position information.
    Type: Grant
    Filed: August 28, 2015
    Date of Patent: December 12, 2017
    Assignee: Hitachi Kokusai Electric, Inc.
    Inventors: Akira Takahashi, Takeshi Yasui, Hiroyuki Ogawa, Kazuya Nabeta, Naoya Matsuura
  • Publication number: 20160201196
    Abstract: A stable and highly reliable device for detecting damage or contact failures of respective parts is provided. The device includes a processing chamber for processing a substrate; a heater for heating the substrate; a substrate support accommodating the heater and installed inside the processing chamber; a shaft for supporting the substrate support; a wire inserted through the shaft; a supporting unit for holding the wire; and a temperature detector connected to the supporting unit.
    Type: Application
    Filed: March 1, 2016
    Publication date: July 14, 2016
    Applicant: HITACHI KOKUSAI ELECTRIC INC
    Inventors: Kazuya NABETA, Naoki UKAE, Mitsunori TAKESHITA
  • Patent number: 9305820
    Abstract: A stable and highly reliable device for detecting damage or contact failures of respective parts is provided. The device includes a processing chamber for processing a substrate; a heater for heating the substrate; a substrate support accommodating the heater and installed inside the processing chamber; a shaft for supporting the substrate support; a wire inserted through the shaft; a supporting unit for holding the wire; and a temperature detector connected to the supporting unit.
    Type: Grant
    Filed: December 10, 2010
    Date of Patent: April 5, 2016
    Assignee: HITACHI KOKUSAI ELECTRIC INC.
    Inventors: Kazuya Nabeta, Naoki Ukae, Mitsunori Takeshita
  • Publication number: 20150371883
    Abstract: In the present invention, a substrate is placed at a predetermined position on a substrate support even though the substrate is deviated on a substrate transfer unit. There is provided a substrate processing apparatus that includes a process chamber, a transfer chamber accommodating a substrate transfer unit, a substrate detecting unit, a memory unit configured to store a first reference position information, a second reference position information and a substrate reference position information and a controller configured to generate a detected position information representing a position of a substrate being transferred in the transfer chamber based on a detection result and to control the substrate transfer unit to place the substrate based on the detected position information, the first reference position information, the substrate reference position information and a difference between the first reference position information and the second reference position information.
    Type: Application
    Filed: August 28, 2015
    Publication date: December 24, 2015
    Applicant: HITACHI KOKUSAI ELECTRIC INC.
    Inventors: Akira TAKAHASHI, Takeshi YASUI, Hiroyuki OGAWA, Kazuya NABETA, Naoya MATSUURA
  • Publication number: 20110139070
    Abstract: A stable and highly reliable device for detecting damage or contact failures of respective parts is provided. The device includes a processing chamber for processing a substrate; a heater for heating the substrate; a substrate support accommodating the heater and installed inside the processing chamber; a shaft for supporting the substrate support; a wire inserted through the shaft; a supporting unit for holding the wire; and a temperature detector connected to the supporting unit.
    Type: Application
    Filed: December 10, 2010
    Publication date: June 16, 2011
    Applicant: HITACHI-KOKUSAI ELECTRIC INC.
    Inventors: Kazuya NABETA, Naoki UKAE, Mitsunori TAKESHITA