Patents by Inventor Kazuya Tokuda

Kazuya Tokuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210230337
    Abstract: The present disclosure relates to a resin composition for optical fiber coating, the resin composition including a base resin containing a urethane (meth)acrylate oligomer, a monomer, and a photopolymerization initiator; and inorganic oxide particles, in which a volume average particle size of the inorganic oxide particles as measured by a small angle X-ray scattering method is 800 nm or less, and a standardized dispersion of the volume average particle size is 60% or less.
    Type: Application
    Filed: February 18, 2020
    Publication date: July 29, 2021
    Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Katsushi HAMAKUBO, Kazuyuki SOHMA, Kazuya TOKUDA, Tatsuya KONISHI
  • Publication number: 20210149107
    Abstract: The present disclosure relates to an optical fiber comprising a glass fiber including a core and a clad; a primary resin layer that coats the glass fiber by being in contact with the glass fiber; and a secondary resin layer that coats the primary resin layer, in which the secondary resin layer is formed from a cured product of a resin composition that includes a base resin containing a urethane (meth)acrylate oligomer, a monomer, and a photopolymerization initiator; and inorganic oxide particles, a volume average particle size of the inorganic oxide particles as measured by a small angle X-ray scattering method is 800 nm or less, and a standardized dispersion of the volume average particle size is 60% or less.
    Type: Application
    Filed: February 18, 2020
    Publication date: May 20, 2021
    Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Katsushi HAMAKUBO, Kazuyuki SOHMA, Kazuya TOKUDA, Tatsuya KONISHI
  • Patent number: 10894744
    Abstract: Provided are: an oxide sintered material including an In2O3 crystal phase, a Zn4In2O7 crystal phase and a ZnWO4 crystal phase, wherein the roundness of crystal particles composed of the ZnWO4 crystal phase is 0.01 or more and less than 0.7; a method for producing the oxide sintered material; and a method for manufacturing a semiconductor device including an oxide semiconductor film that is formed by using the oxide sintered material as a sputter target.
    Type: Grant
    Filed: June 26, 2017
    Date of Patent: January 19, 2021
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventors: Miki Miyanaga, Kenichi Watatani, Hideaki Awata, Kazuya Tokuda, Aiko Tominaga
  • Publication number: 20200126790
    Abstract: There are provided an oxide sintered material and a method of manufacturing the same as well as an oxide semiconductor film. The oxide sintered material contains In, W and Zn, includes an In2O3 crystal phase and an In2(ZnO)mO3 crystal phase (m represents a natural number), and an average number of oxygen atoms coordinated to an indium atom is 3 or more and less than 5.5. The oxide semiconductor film contains In, W and Zn. The oxide semiconductor film is amorphous, and an average number of oxygen atoms coordinated to an indium atom is 2 or more and less than 4.5.
    Type: Application
    Filed: May 1, 2018
    Publication date: April 23, 2020
    Applicant: Sumitomo Electric Industries, Ltd.
    Inventors: Miki MIYANAGA, Kenichi WATATANI, Hideaki AWATA, Aiko TOMINAGA, Kazuya TOKUDA
  • Publication number: 20200062651
    Abstract: Provided are: an oxide sintered material including an In2O3 crystal phase, a Zn4In2O7 crystal phase and a ZnWO4 crystal phase, wherein the roundness of crystal particles composed of the ZnWO4 crystal phase is 0.01 or more and less than 0.7; a method for producing the oxide sintered material; and a method for manufacturing a semiconductor device including an oxide semiconductor film that is formed by using the oxide sintered material as a sputter target.
    Type: Application
    Filed: June 26, 2017
    Publication date: February 27, 2020
    Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Miki MIYANAGA, Kenichi WATATANI, Hideaki AWATA, Kazuya TOKUDA, Aiko TOMINAGA
  • Patent number: 6674523
    Abstract: A pre-viewing inspection method and apparatus for inspecting an inspection article prior to visual inspection thereof, the inspection article being an electrophotographic member, such as an electrophotographic photosensitive member. The method (apparatus) comprises a defect signal detecting step (means) of detecting a defect signal based on a defect state of the inspection article, a detailed defect information generating step (means) of generating detailed defect information based on the defect signal detected in the defect signal detecting step, the detailed defect information including defect position information, and a detailed defect information visualizing step (means) of visualizing, on the inspection article, the detailed defect information generated in the detailed defect information generating step.
    Type: Grant
    Filed: July 23, 2001
    Date of Patent: January 6, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoichi Kawamorita, Ryozo Fukuda, Kazuya Tokuda, Kenji Muranaka, Shoshin Igarashi
  • Publication number: 20020021123
    Abstract: The invention provides a pre-viewing inspection method for an inspection article prior to visual inspection thereof, the method comprising a defect signal detecting step of detecting a defect signal based on a defect state of the inspection article, a detailed defect information generating step of generating detailed defect information based on the defect signal detected by the defect signal detecting step, and a detailed defect information visualizing step of visualizing, on the inspection article, the detailed defect information generated in the detailed defect information generating step, and a pre-viewing inspection device for an inspection article prior to visual inspection thereof, the device comprising defect signal detecting means for detecting a defect signal based on a defect state of the inspection article, detailed defect information generating means for generating detailed defect information based on the defect signal detected by the defect signal detecting means, and detailed defect information
    Type: Application
    Filed: July 23, 2001
    Publication date: February 21, 2002
    Inventors: Yoichi Kawamorita, Ryozo Fukuda, Kazuya Tokuda, Kenji Muranaka, Shoshin Igarashi