Abstract: A measurement apparatus includes: an eyelid opening section that comes into contact with skin on a periphery of an eyeball of a measurement subject and maintains an eyelid of the measurement subject in an open state; an emission section that emits light such that the light travels across an anterior chamber of the eyeball in which the eyelid is maintained in an open state by the eyelid opening portion; and a light reception section that receives the light which travels across the anterior chamber.

Abstract: An optical measurement apparatus for an eyeball, including: a light irradiation section that is disposed on an inner canthus side of the eyeball and that includes a light source, a polarization portion that performs polarization control of light from the light source, and a light reflection portion that is disposed closer to an inward side of an eyeball than the polarization portion is and that reflects light subjected to the polarization control by the polarization portion such that the light travels across an anterior chamber of the eyeball; and a light reception section that is disposed on an outer canthus side of the eyeball, that receives the light traveling across the anterior chamber without further going through a light reflection portion that changes a polarization state of light, and that detects a change of the polarization state of the received light.

Abstract: An optical measurement apparatus for an eyeball includes a light emission section that emits light to travel across an anterior chamber inside an eyeball of a measurement subject, a light reception section that receives light traveling across the anterior chamber, a holding member that holds the light emission section and the light reception section, and an adjustment section that is provided in the holding member and switches an angle of the light emitted from the light emission section toward the anterior chamber to adjust the angle of the light to an angle at which the light travels across the anterior chamber and received by the light reception section.

Abstract: An optical measuring apparatus includes a light output device that outputs light so as to cross an anterior chamber of an eyeball of a subject, a light receiving device that receives the light having crossed the anterior chamber, and a positioning device that positions the light output device and the light receiving device at such positions that, when the eyeball is adducted, the light output from the light output device crosses the anterior chamber and is received by the light receiving device.

Abstract: A concentration calculation system of an optically active substance, includes: a calculation unit configured to: acquire an amount of change in a polarization state by allowing light having different wavelengths to pass through a cornea and an aqueous humor; and calculate a concentration of a specific optically active substance contained in the aqueous humor by a least squares method based on a theoretical formula which includes a matrix representing a polarization property of the cornea and a matrix representing a polarization property of the aqueous humor and represents a wavelength dependence of the amount of the change, wherein the matrix representing the polarization property of the aqueous humor is represented by a function of an expression representing the wavelength dependence of an optical rotation degree of the specific substance and the expression includes a concentration value of the specific substance as an unknown quantity or a temporal known quantity.

Abstract: The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unit 210 to receive and manage a detection value for each detection part, an effective area ratio calculation unit 230 to calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unit 250 to correct the managed count value using the calculated effective area ratio to estimate a true value.

Abstract: An optical measuring instrument 1 is equipped with an optical system 20 to be used for measuring a characteristic of the aqueous humor in the anterior chamber 13 of an eyeball 10 of a measurement subject person and a holding unit 50 which holds the optical system 20 etc. The optical system 20 is equipped with a light emitting system 20A and a photodetecting system 20B. An optical path 28 is set so that light emitted from the light emitting system 20A passes through (traverses) the anterior chamber 13 and is detected by the photodetecting system 20B in a state that the eyeball 10 is turned outward.

Abstract: A concentration calculation system calculates a concentration of the optically active substance based on a formula. The formula includes a first function representing wavelength dependence of an optical rotation of a first optically-active substance, and a second function representing wavelength dependence of an optical rotation of a second optically-active substance. In the first function, concentration of the first optically-active substance has an unknown value, and an inherent value for defining a characteristic of optical rotatory dispersion of the first optically-active substance is a known value or an unknown value within a certain limited range. In the second function, an inherent value for defining a characteristic of optical rotatory dispersion of the second optically-active substance is an unknown value.

Abstract: There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an external apparatus 200, includes: a sensor 110 that generates pulses when radiation particles are detected; a plurality of counters 140a, 140b provided so as to be able to count the pulses; and a control circuit 160 configured to switch a counter to count the pulses among the plurality of counters 140a, 140b, when receiving a synchronization signal from the external apparatus 200.

Abstract: An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unit 210 to receive and manage X-ray data that is detected by a detector, a calculation unit 230 which calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unit 250 to reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.

Abstract: A silicon strip detector having a first X-ray detection unit having plural strips arranged in parallel to one another in a first direction, and a second X-ray detection unit having plural strips arranged in parallel to one another in a second direction orthogonal to the first direction is used as an X-ray detector. The X-ray detector is mounted in an X-ray diffraction device while the first direction is matched with the tangential direction of 2?-rotation, and the second direction is matched with the tangential direction of ?-rotation for executing in-plane diffraction measurement.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: A vertical cavity surface emitting laser that includes: a substrate; a first semiconductor multilayer reflector; an active region; a second semiconductor multilayer reflector; a columnar structure formed from the second semiconductor multilayer reflector to the first semiconductor multilayer reflector; a current narrowing layer formed inside of the columnar structure and having a conductive region surrounded by an oxidization region; a first electrode formed at a top of the columnar structure, electrically connected to the second semiconductor multilayer reflector and defining a beam window; a first insulating film comprised of a material with a first refractive index and formed on the first electrode to cover the beam window; and a second insulating film comprised of a material with a second refractive index and formed on the first insulating film, of which a radius is smaller than a radius of the conductive region.

Abstract: The present invention provides a semiconductor strip detector that can reduce noise generated from floating capacitance between electrodes while maintaining high detection efficiency. The semiconductor strip detector for detecting radiation includes: a substrate integrally formed from semiconductor and receiving incident radiation; a first electrode group made up of a plurality of strip-shaped electrodes to provided in parallel to each other on a major surface of the substrate; and a second electrode group made up of a plurality of strip-shaped electrodes to provided coaxially with an orthogonal projection of the plurality of strip-shaped electrodes to of the first electrode group onto the major surface of the substrate, and the electrode groups are formed so that a ratio of a longitudinal length to an electrode-to-electrode length is 10 or more. Therefore, noise can be sufficiently reduced while a detection range is being maintained.

Abstract: A vertical cavity surface emitting laser that includes: a substrate; a first semiconductor multilayer reflector; an active region; a second semiconductor multilayer reflector; a columnar structure formed from the second semiconductor multilayer reflector to the first semiconductor multilayer reflector; a current narrowing layer formed inside of the columnar structure and having a conductive region surrounded by an oxidization region; a first electrode formed at a top of the columnar structure, electrically connected to the second semiconductor multilayer reflector and defining a beam window; a first insulating film comprised of a material with a first refractive index and formed on the first electrode to cover the beam window; and a second insulating film comprised of a material with a second refractive index and formed on the first insulating film, of which a radius is smaller than a radius of the conductive region.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement.

Abstract: A vertical cavity surface emitting laser including a substrate, a first semiconductor multilayer film reflector formed on the substrate, an active region formed on the first semiconductor multilayer film reflector, a second semiconductor multilayer film reflector formed on the active region, an electrode formed on the second semiconductor multilayer film reflector, a light absorption layer, and a light transmission layer. In the electrode, a light emitting aperture is formed. The light absorption layer is formed in a peripheral region of the light emitting aperture, and absorbs emitted light. The light transmission layer is composed of a material which the emitted light can pass through, and formed in a central region of the light emitting aperture. Thicknesses of the light absorption layer and the light transmission layer are selected so that phases of light from the light absorption layer and from the light transmission layer are adjusted.

Abstract: A vertical cavity surface emitting laser includes a substrate, a first semiconductor multilayer film reflector formed on the substrate, an active region formed on the first semiconductor multilayer film reflector, a second semiconductor multilayer film reflector formed on the active region, an electrode which is formed on the second semiconductor multilayer film reflector and in which a light emitting aperture is formed, a first substance that is composed of a material and that is formed in the light emitting aperture, and a second substance that is composed of a dielectric and that is formed on the first substance to cover one portion of the first substance. Light having an emission wavelength can pass through the material and dielectric. A reflectivity of a portion covered with the second substance is higher than a reflectivity of a portion that is not covered with the second substance.

Abstract: A vertical cavity surface emitting laser including a substrate, a first semiconductor multilayer film reflector formed on the substrate, an active region formed on the first semiconductor multilayer film reflector, a second semiconductor multilayer film reflector formed on the active region, an electrode formed on the second semiconductor multilayer film reflector, a light absorption layer, and a light transmission layer. In the electrode, a light emitting aperture is formed. The light absorption layer is formed in a peripheral region of the light emitting aperture, and absorbs emitted light. The light transmission layer is composed of a material which the emitted light can pass through, and formed in a central region of the light emitting aperture. Thicknesses of the light absorption layer and the light transmission layer are selected so that phases of light from the light absorption layer and from the light transmission layer are adjusted.