Abstract: An object detection device is configured to execute a first process, a second process, and an object detection process (third and fourth processes). The first process estimates a shape of a road surface in a real space on the basis of a first disparity map. The first disparity map is generated on the basis of an output of a stereo camera that captures an image including the road surface, and is a map in which a disparity obtained from the output of the stereo camera is associated with two-dimensional coordinates formed by a first direction corresponding to a horizontal direction of the image captured by the stereo camera and a second direction intersecting the first direction. The second process removes from the first disparity map a disparity for which a height from the road surface in the real space corresponds to a predetermined range on the basis of the estimated shape of the road surface to generate a second disparity map.

Abstract: An object detection device includes a processor. The processor is configured to apply a Hough transform to coordinate points on a UD map to detect a straight line having a predetermined length, and detect a target disparity corresponding to the detected straight line having the predetermined length as a disparity corresponding to an object parallel to a direction of travel of a stereo camera. In the UD map, a target disparity satisfying a predetermined condition among disparities acquired from a captured image is associated with coordinate points, each of the coordinate points having two-dimensional coordinates formed by a first direction and a direction corresponding to a magnitude of a disparity. The processor is configured to convert, in the Hough transform, a straight line passing through coordinate points associated with the target disparity and a predetermined range based on a vanishing point into a Hough space.

Abstract: An information processing apparatus includes at least one projection unit configured to project a light pattern on a measuring target object, at least one imaging unit configured to capture an image of the measuring target object with the light pattern projected thereon, a measurement unit configured to measure a distance from the at least one projection unit or imaging unit to the measuring target object based on the image captured by the at least one imaging unit, a determination unit configured to determine whether a measured distance is valid, and a control unit configured to reduce luminance of a light pattern, included in a projected light pattern, which is projected on an area with respect to which the measured distance is determined by the determination unit to be valid.

Abstract: A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.

Abstract: A dark region as a region on which light is not projected by a light projection unit is set. Disturbance light projected on a measurement target object is estimated from the set dark region. A captured image is corrected based on the estimated disturbance light. Distance to the measurement target object is executed from the corrected captured image.

Abstract: An information processing apparatus includes at least one projection unit configured to project a light pattern on a measuring target object, at least one imaging unit configured to capture an image of the measuring target object with the light pattern projected thereon, a measurement unit configured to measure a distance from the at least one projection unit or imaging unit to the measuring target object based on the image captured by the at least one imaging unit, a determination unit configured to determine whether a measured distance is valid, and a control unit configured to reduce luminance of a light pattern, included in a projected light pattern, which is projected on an area with respect to which the measured distance is determined by the determination unit to be valid.

Abstract: A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, and a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light. In addition, an extraction unit extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.

Abstract: This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Abstract: An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.

Abstract: This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Abstract: This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Abstract: A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.

Abstract: An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.

Abstract: This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Abstract: A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light, and an extraction unit which extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.

Abstract: This invention secures the breakdown voltage between stem pins or the like for high voltage service in a cathode ray tube. This insulator formed is of a clay-like silicone compound having a tip-throughhole and pin-throughholes or a stem base with the electric insulator mounted to the stem base: A inter-stem electric insulation device is structured by mounting either one of the electric insulator or the stem base with the electric insulator to the stem of a cathode ray tube and by pressing to fix together. This structure does not occur bubble generation caused by the electric insulator, and makes the handling easy, and furthermore, accomplish an automatic mounting of the electric insulator to a stem.

Abstract: This invention secures the breakdown voltage between stem pins or the like for high voltage service in a cathode ray tube. This insulator is formed of a clay-like silicone compound having a tip-throughhole and pin-throughholes or a stem base with the electric insulator mounted to the stem base. An inter-stem electric insulation device is structured by mounting either one of the electric insulator or the stem base with the electric insulator to the stem of a cathode ray tube and by pressing to fix together. This structure does not allow bubble generation caused by the electric insulator, and makes the handling easy, and furthermore, allows an automatic mounting of the electric insulator to a stem.

Abstract: A method of manufacturing a resistor element, particularly one for use as an arc suppressing resistor in a cathode ray tube which consists in providing an arc suppressing resistor having a resistor core of predetermined resistance covered with an integral ceramic insulating layer, and baking the resistor in a vacuum atmosphere at a vacuum ranging from 1.times.10.sup.-3 Torr to 1.times.10.sup.-7 Torr, a temperature from 250.degree. to 500.degree. C. and a treatment time or more than 30 minutes.