Abstract: A wafer optical inspection system, including an image capturing device, which consists of a photosensitive device, an LED source and a laser source. The LED source generates a reflective feature at the edge of a batch wafers, and the laser source generates a contour feature at the edge of the batch wafers. The photosensitive device captures a wafer image alongside with the reflective feature and the contour feature to form a side image of the wafer group. An image recognition device identifies the number of wafers and their positions in the batch based on the side image of the wafer group.

Abstract: An omnibearing display, having a display face, with the blanking element in front of the display face, is rotated with a high speed by a rotation actuating mechanism to cyclically and repeatedly appear to eyes of an observer around the display face within a duration of persistence of vision. This results in an effect that observers at any positions around the display face will see the same display face within the duration of persistence of vision, namely, the omnibearing display effect.