Patents by Inventor Kee Ann Chan

Kee Ann Chan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multi-axis test apparatus
    Patent number: 7905155
    Abstract: A testing apparatus for testing a device or components of a device is presented. It is desirable to simulate the effects of rotary and other forces as well as environmental factors on various components of devices to optimize design improvements so as to increase the quality of the various components and the device or to increase the length of service of the various components and the device.
    Type: Grant
    Filed: April 2, 2008
    Date of Patent: March 15, 2011
    Assignee: Seagate Technology LLC
    Inventors: Shang Jiun Wong, Jian Bing Zhao, Swee Tiong Tan, Ying Wang, Chung Poh Ong, Kee Ann Chan
  • Electronic device torsion testing
    Patent number: 7730791
    Abstract: A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
    Type: Grant
    Filed: November 6, 2008
    Date of Patent: June 8, 2010
    Assignee: Seagate Technology LLC
    Inventors: Swee Tiong Tan, Chung Poh Ong, Shang Jiun Wong, Kee Ann Chan, Cheng Siong Chin
  • MULTI-AXIS TEST APPARATUS
    Publication number: 20090249899
    Abstract: A testing apparatus for testing a device or components of a device is presented. It is desirable to simulate the effects of rotary and other forces as well as environmental factors on various components of devices to optimize design improvements so as to increase the quality of the various components and the device or to increase the length of service of the various components and the device.
    Type: Application
    Filed: April 2, 2008
    Publication date: October 8, 2009
    Inventors: Shang Jiun Wong, Jian Bing Zhao, Swee Tiong Tan, Ying Wang, Chung Poh Ong, Kee Ann Chan
  • ELECTRONIC DEVICE TORSION TESTING
    Publication number: 20090056470
    Abstract: A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
    Type: Application
    Filed: November 6, 2008
    Publication date: March 5, 2009
    Applicant: Seagate Technology LLC
    Inventors: Swee Tiong Tan, Chung Poh Ong, Shang Jiun Wong, Kee Ann Chan, Cheng Siong Chin
  • Electronic device torsion testing
    Patent number: 7454980
    Abstract: A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: November 25, 2008
    Assignee: Seagate Technology, LLC
    Inventors: Swee Tiong Tan, Chung Poh Ong, Shang Jiun Wong, Kee Ann Chan, Cheng Siong Chin
  • Electronic device torsion testing
    Publication number: 20080066556
    Abstract: A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
    Type: Application
    Filed: September 18, 2006
    Publication date: March 20, 2008
    Applicant: Seagate Technology LLC
    Inventors: Swee Tiong Tan, Chung Poh Ong, Shang Jiun Wong, Kee Ann Chan, Cheng Siong Chin