Abstract: A method and apparatus are disclosed for improving reliability in a memory circuit. The method includes coupling a pull-down element to a word line, the pull-down element coupled distal to a word line driver. The method further includes, when the word line exhibits a defect causing a first portion of the word line to be electrically isolated from a second portion of the word line, holding the second portion of the word line at a logically low value using the pull-down element. A memory device is disclosed that includes a word line coupled to a memory cell, a word line driver coupled to one end of the word line, and a pull-down element coupled proximate the other end of the word line. The pull-down element is operable, when the word line exhibits a defect causing a first portion of the word line to be electrically isolated from a second portion of the word line, to hold the second portion of the word line at a logical low value.

Abstract: A packaged integrated circuit device and a circuit board assembly are disclosed that include a semiconductor die and a package substrate that includes a first grid array of contact pads that are electrically coupled to corresponding contact pads on the semiconductor die. The first grid array of contact pads includes a first set of adjacent rows or columns of contact pads that are coupled to a first channel that extends within a ground plane of the package substrate. The first grid array of contact pads includes a second set of adjacent rows or columns of contact pads that are electrically coupled to a second channel that extends within a power plane of the package substrate. The contact pads in the first set of adjacent rows or columns of contact pads directly overlie a portion of the first channel and the contact pads in the second set of adjacent rows or columns of contact pads directly overlie a portion of the second channel.

Abstract: A novel method for scanning bit parity in a memory array, and a circuit for implementing it, are disclosed. In a memory array that has one or more rows of memory cells, the method for checking data parity includes storing a plurality of data bits in the memory cells, scanning a row of memory cells independently of a memory read operation to ascertain the stored data bits; and determining parity for the row of memory cells by the results of the scanning. The method is accomplished by means of a dedicated parity scanning circuit.

Abstract: A method and an apparatus for reading/writing data from/into a semiconductor memory device. In a read mode, a memory cell array block from which data is to be read is selected in response to a row address signal and a column of the selected memory cell array block is selected in response to a column address signal. Data are transferred from a memory cell of the selected column to a pair of bit lines of the selected column and then sense-amplified. A read signal is decoded and a pair of column decoding lines of the selected column become a desired logic state in accordance with the decoded result. A current path is formed between one of the column decoding lines and a ground terminal in response to the sense-amplified data on the bit lines. Data on the column decoding lines are selected and sense-amplified. The sense-amplified data are transferred externally.

Abstract: A data output buffer for a semiconductor memory device having a plurality of memory cells, each of the memory cells storing a data signal. The data output buffer comprises: an input line for inputting the data signal from each of the memory cells; a pull-up driver connected between a supply voltage source and an output line, the pull-up driver being driven in response to a first logic of the data signal from the input line; a pull-down driver connected between a ground voltage source and the output line, the pull-down driver being driven complementarily to the pull-up driver in response to a second logic of the data signal from the input line; at least one auxiliary pull-up driver connected in parallel to the pull-up driver; and a controller for driving the at least one auxiliary pull-up driver for a predetermined time period from a start portion of the first logic of the data signal from the input line.