Patents by Inventor Keenan T. O'Brien

Keenan T. O'Brien has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9246519
    Abstract: A method for producing a LDPC encoded test pattern for media in a LDPC based drive system includes adding error detection code data to a predominantly zero bit test pattern and adding additional zero bits to produce a test pattern of a desirable length. The test pattern may then be scrambled to produce a desirable flaw detection test pattern. The flaw detection test pattern may then be encoding with an LDPC code, or other error correction code with minimal disturbance to the run length constraints of the data pattern, and written to a storage medium.
    Type: Grant
    Filed: November 8, 2012
    Date of Patent: January 26, 2016
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Jefferson E. Singleton, Shaohua Yang, Bruce A. Wilson, Keenan T. O'Brien
  • Publication number: 20140129890
    Abstract: A method for producing a LDPC encoded test pattern for media in a LDPC based drive system includes adding error detection code data to a predominantly zero bit test pattern and adding additional zero bits to produce a test pattern of a desirable length. The test pattern may then be scrambled to produce a desirable flaw detection test pattern. The flaw detection test pattern may then be encoding with an LDPC code, or other error correction code with minimal disturbance to the run length constraints of the data pattern, and written to a storage medium.
    Type: Application
    Filed: November 8, 2012
    Publication date: May 8, 2014
    Applicant: LSI CORPORATION
    Inventors: Jefferson E. Singleton, Shaohua Yang, Bruce A. Wilson, Keenan T. O'Brien
  • Patent number: 7817363
    Abstract: In one embodiment, defects are detected on the face of a hard-disk drive platter. A preamble, a sync mark, user or pseudorandom data, and a data pad are written to every sector on a track of the platter. Inter-sector gaps that separate consecutive sectors are overwritten with a fixed data pattern such that consecutive sectors are in phase lock with one another. After the track has been written, the track is read back and analyzed. Consecutive sectors are analyzed continuously without stopping. The preambles, sync marks, data pads, and overwritten inter-sector gaps are analyzed using suitable flaw-scan techniques. The user or pseudorandom data is analyzed using both data-integrity checks and suitable flaw-scan techniques. This process is repeated for all tracks on the disk, and defect detection is completed when all tracks have been analyzed.
    Type: Grant
    Filed: November 17, 2008
    Date of Patent: October 19, 2010
    Assignee: Agere Systems Inc.
    Inventors: Keenan T. O'Brien, Richard Rauschmayer
  • Publication number: 20100123962
    Abstract: In one embodiment, defects are detected on the face of a hard-disk drive platter. A preamble, a sync mark, user or pseudorandom data, and a data pad are written to every sector on a track of the platter. Inter-sector gaps that separate consecutive sectors are overwritten with a fixed data pattern such that consecutive sectors are in phase lock with one another. After the track has been written, the track is read back and analyzed. Consecutive sectors are analyzed continuously without stopping. The preambles, sync marks, data pads, and overwritten inter-sector gaps are analyzed using suitable flaw-scan techniques. The user or pseudorandom data is analyzed using both data-integrity checks and suitable flaw-scan techniques. This process is repeated for all tracks on the disk, and defect detection is completed when all tracks have been analyzed.
    Type: Application
    Filed: November 17, 2008
    Publication date: May 20, 2010
    Applicant: AGERE SYSTEMS INC.
    Inventors: Keenan T. O'Brien, Richard Rauschmayer