Abstract: A method of accelerating a Monte Carlo (MC) simulation for a system including a first component having a first input parameter and a second component having a second input parameter. The simulation model provided includes a first component model including a first model parameter corresponding to the first input parameter and a second component model having a second model parameter corresponding to the second input parameter. A first acceleration factor for the first component and a second acceleration factor for the second component are calculated based on at least the respective number of instances. A first scaled distribution is computed from the first distribution and a second scaled distribution is computed from the second distribution based on the respective acceleration factors. The MC simulation for the system is run, wherein values for the first model parameter value and second model parameter value are obtained based on the respective scaled distributions.

Abstract: Embodiments of the present disclosure provide a power controller, a method of operating a power controller and a semiconductor memory system. In one embodiment, the power controller is for use with a memory and includes an access module configured to provide an active state of the memory to allow memory access. The power controller also includes a retain-till-access module configured to cycle a portion of the memory between the active state and a low leakage data retention state of the memory. The power controller further includes an expanded retain-till-access module configured to extend the active state of the memory for a specified period of time before returning the memory to the low leakage data retention state.

Abstract: Various systems and methods for delaying a signal relative to another signal are disclosed. As one example, a delay lock loop circuit is disclosed that includes at least two delay stages. Each of the aforementioned delay stages include a plurality of selectable delay elements. Such selectable delay elements may be, but are not limited to, a plurality of single input buffers, and a plurality of multiple input logic gates. Further, a first of the delay stages is selectably driven by one of a first signal and a reference signal, and the stage provides a first stage output. A second of the delay stages is selectably driven by one of a second signal and the first stage output, and the stage provides a second stage output. The circuit further includes a mode signal that has at least two states.

Abstract: Delay lock loop circuits are described, which may include two or more delay stages that each includes a plurality of selectable delay elements. A reference signal drives an input of the first delay stage, which provides a first output. The first output drives an input of the second delay stage, which provides a second output. The circuits further include a first selector register that is associated with the first delay stage. A value maintained in the first selector register determines a number of the selectable delay elements utilized in the first delay stage. The circuits further include a second selector register associated with the second delay stage. A value maintained in the second selector register determines a number of the selectable delay elements utilized in the second delay stage. Modification of the values maintained in the first and second selector registers are synchronized to the first and second outputs, respectively.

Abstract: Various systems and methods for signal synchronization are disclosed. For example, some embodiments of the present invention provide methods for reduced area delay signal timing. Such methods include providing a delay lock loop circuit with a plurality of selectable delay elements. The methods further include operating the delay lock loop circuit in a first mode where a program number is established in relation to a reference frequency. The program number corresponds to a number of the plurality of selectable delay elements used to establish a first delay time at the reference frequency. The program number is multiplied by a multiplicand, and the product of the multiplication is used while operating the delay lock loop circuit in a second mode to select the number of delay elements utilized in delaying an input signal. In the second mode, an input signal is delayed by a second delay time that is approximately the first delay time multiplied by the multiplicand.

Abstract: A method of accelerating a Monte Carlo (MC) simulation for a system including a first component having a first input parameter and a second component having a second input parameter. The simulation model provided includes a first component model including a first model parameter corresponding to the first input parameter and a second component model having a second model parameter corresponding to the second input parameter. A first acceleration factor for the first component and a second acceleration factor for the second component are calculated based on at least the respective number of instances. A first scaled distribution is computed from the first distribution and a second scaled distribution is computed from the second distribution based on the respective acceleration factors. The MC simulation for the system is run, wherein values for the first model parameter value and second model parameter value are obtained based on the respective scaled distributions.

Abstract: Various embodiments of the present invention provide systems and methods for glitch reduced circuits. As one example, a glitch reduced, variable width driver circuit is disclosed. Such circuits include a data output, and at least two transistors that each includes a gate, a first leg and a second leg. The gate of the first transistor is electrically coupled to a first combined control signal, and the gate of the second transistor is electrically coupled to a second combined control signal. The first leg of the first transistor and the first leg of the second transistor are electrically coupled to a power source, and the second leg of the first transistor and the second leg of the second transistor are electrically coupled to an output signal. The circuits further include a control circuit that combines a first control signal with the data output to create the first combined control signal, and combines a second control signal with the data output to create the second combined control signal.

Abstract: Various embodiments of the present invention provide systems and methods for glitch reduced circuits. As one example, a glitch reduced, variable width driver circuit is disclosed. Such circuits include a data output, and at least two transistors that each includes a gate, a first leg and a second leg. The gate of the first transistor is electrically coupled to a first combined control signal, and the gate of the second transistor is electrically coupled to a second combined control signal. The first leg of the first transistor and the first leg of the second transistor are electrically coupled to a power source, and the second leg of the first transistor and the second leg of the second transistor are electrically coupled to an output signal. The circuits further include a control circuit that combines a first control signal with the data output to create the first combined control signal, and combines a second control signal with the data output to create the second combined control signal.

Abstract: Various systems and methods for signal synchronization are disclosed. For example, some embodiments of the present invention provide methods for reduced area delay signal timing. Such methods include providing a delay lock loop circuit with a plurality of selectable delay elements. The methods further include operating the delay lock loop circuit in a first mode where a program number is established in relation to a reference frequency. The program number corresponds to a number of the plurality of selectable delay elements used to establish a first delay time at the reference frequency. The program number is multiplied by a multiplicand, and the product of the multiplication is used while operating the delay lock loop circuit in a second mode to select the number of delay elements utilized in delaying an input signal. In the second mode, an input signal is delayed by a second delay time that is approximately the first delay time multiplied by the multiplicand.

Abstract: Various embodiments of the present invention provide delay lock loop circuits. Such delay lock loop circuits include two or more delay stages that each include a plurality of selectable delay elements. A reference signal drives an input of the first delay stage, and the first delay stage provides a first output. The first output drives an input of the second delay stage, and the second delay stage provides a second output. The circuits further include a first selector register that is associated with the first delay stage. A value maintained in the first selector register determines a number of the selectable delay elements utilized in the first delay stage. Modification of the value maintained in the first selector register is synchronized to the first output. The circuits further include a second selector register associated with the second delay stage. A value maintained in the second selector register determines a number of the selectable delay elements utilized in the second delay stage.

Abstract: Various systems and methods for delaying one signal in relation to another are disclosed. As one example, a delay lock loop circuit is discussed that includes at least a first delay stage and a second delay stage, each including a plurality of selectable delay elements. The delay stages are configured such that a gated reference signal drives an input of the first delay stage, and a first output from the first delay stage drives an input of the second delay stage. The circuits further include a unified selector register that is associated with both the first delay stage and the second delay stage. A value maintained in the unified selector register determines a number of the selectable delay elements utilized in the first delay stage and a number of the selectable delay elements utilized in the second delay stage. In operation, modification of the value maintained in the unified selector register is synchronized to the reference signal.

Abstract: Various systems and methods for delaying a signal relative to another signal are disclosed. As one example, a delay lock loop circuit is disclosed that includes at least two delay stages. Each of the aforementioned delay stages include a plurality of selectable delay elements. Such selectable delay elements may be, but are not limited to, a plurality of single input buffers, and a plurality of multiple input logic gates. Further, a first of the delay stages is selectably driven by one of a first signal and a reference signal, and the stage provides a first stage output. A second of the delay stages is selectably driven by one of a second signal and the first stage output, and the stage provides a second stage output. The circuit further includes a mode signal that has at least two states.

Abstract: Embodiments of the present disclosure provide a power controller, a method of operating a power controller and a semiconductor memory system. In one embodiment, the power controller is for use with a memory and includes an access module configured to provide an active state of the memory to allow memory access. The power controller also includes a retain-till-access module configured to cycle a portion of the memory between the active state and a low leakage data retention state of the memory. The power controller further includes an expanded retain-till-access module configured to extend the active state of the memory for a specified period of time before returning the memory to the low leakage data retention state.

Abstract: The disclosed invention provides methods and systems for writing and reading data in systems using multiple FIFO buffer elements. For each buffer element, a determination is made of when the rising edge of the read clock occurs during the second half of the write clock cycle. Responsive to this determination, the data written into the FIFO buffer element is shifted in order to reduce skew.

Abstract: A circuit takes a reference strobe signal as a first input, and a strobe ready signal generated from a memory that is strobed by the reference strobe signal as a second input. The circuit generates a self-timed strobe signal along with other control signals that are used to perform a subsequent memory access in a single clock cycle, thereby doubling memory access bandwidth.

Abstract: A circuit takes a reference strobe signal as a first input, and a strobe ready signal generated from a memory that is strobed by the reference strobe signal as a second input. The circuit generates a self-timed strobe signal along with other control signals that are used to perform a subsequent memory access in a single clock cycle, thereby doubling memory access bandwidth.

Abstract: A method for generating charge sharing test vectors for a circuit generates a first test vector (120) and a second test vector (122). The method provides a test model (98) including a logic cell (10) and an auxiliary test circuit (100) where the auxiliary test circuit (100) includes a discharge AND gate (102) and a charge sharing AND gate (104). The method generates a first test vector (120) for the test model (98) having an input pattern to discharge nodes of the logic cell (10) and evaluate discharge AND gate (102) to a logic level 1. The method generates a second test vector (122) having an input pattern to evoke the worst charge sharing behavior for the logic cell (10) and evaluate charge sharing AND gate (104) to a logic level 1.