Abstract: A nonlinear load circuit, consisting of a transistor and a resistor in series, is provided for the photovoltaic array under test. Base bias for the transistor is supplied via the source-to-drain path of a field effect transistor (FET). A ramp signal is fed to the gate of the FET. As a result of the nonlinear relationship between the gate voltage and source-to-drain current of the FET, equal ramp steps result in a nonlinear effective load for the array under test. This produces a very gradual change in load impedance for each ramp step in the regions of high current output from the array ("current mode"), and relatively greater changes in load impedance for each ramp step at output levels of lower current and higher voltage from the array ("voltage mode").Advantageously, the array is illuminated by a pulsed flash lamp. A photosensor detects the light level incident on the array, and comparison circuitry provides a "sample" pulse each time that the incident light level is at a selected value.