Abstract: Example embodiments of the present disclosure relate to computing system management. A plurality of previous workloads of a computing system for a previous time duration are obtained. Workload estimation is determined for a future time duration based on the plurality of previous workloads. Based on the workload estimation, management profile is selected from a group of management profiles for managing the computing system for the future time duration. With the example embodiments, the computing system is managed in a flexible and effective way.

Abstract: Embodiments include an anechoic chamber lined with absorber to absorb electromagnetic energy incident upon the absorber and reflector edge interfaces. The chamber comprises a reflector to reflect waves from a source to form a substantially plane wave field in a test zone within the chamber. In some embodiments, the outer periphery of the reflector extends to the interior walls, floor and ceiling of the chamber. The outer periphery of the reflector is embedded in the absorber in some embodiments.

Abstract: Embodiments include an anechoic chamber lined with absorber to absorb electromagnetic energy incident upon the absorber and reflector edge interfaces. The chamber comprises a reflector to reflect waves from a source to form a substantially plane wave field in a test zone within the chamber. In some embodiments, the outer periphery of the reflector extends to the interior walls, floor and ceiling of the chamber. The outer periphery of the reflector is embedded in the absorber in some embodiments.

Abstract: A matching network hybrid electro-magnetic compatibility (EMC) absorber. A substrate of any number of materials serves as the frame on which partial coatings are placed. Design parameters governing the substrate and other parameters governing the coating control the electrical properties of the matching network hybrid EMC absorber. By performing partial and/or full coating, the physical shape and mechanical properties of the matching network hybrid EMC absorber may be de-coupled from the electrical properties. A designer modifies and controls the electrical performance of an electro-magnetic test system by special-tailoring a matching network hybrid EMC absorber. An electro-magnetic wave to ensure that a majority of the electro-magnetic wave is absorbed into a lossy, absorber material mounted on the walls of a test chamber in the frequency range from 20-500 MHz.

Abstract: A matching network hybrid electro-magnetic compatibility (EMC) absorber. A substrate of any number of materials serves as the frame on which partial coatings are placed. Design parameters governing the substrate and other parameters governing the coating control the electrical properties of the matching network hybrid EMC absorber. By performing partial and/or full coating, the physical shape and mechanical properties of the matching network hybrid EMC absorber may be de-coupled from the electrical properties. A designer modifies and controls the electrical performance of an electro-magnetic test system by special-tailoring a matching network hybrid EMC absorber. An electro-magnetic wave to ensure that a majority of the electro-magnetic wave is absorbed into a lossy, absorber material mounted on the walls of a test chamber in the frequency range from 20-500 MHz.

Abstract: A test system having a shielded enclosure and common air interface for testing the transmit and receive functionality of wireless communication devices such as mobile phones. A test system according to the present invention provides improved fault coverage by permitting robust testing of the entire signal path of a wireless device, including the antenna structure. In one embodiment of the invention, an RF-shielded enclosure having a test chamber is provided. The structure of the shielded enclosure blocks ambient RF energy from entering the test chamber and interfering with testing operations. The shielded enclosure may be lined with an RF absorbing material to improve test repeatability. A novel test antenna structure is disposed in the test chamber for wirelessly communicating test signals to a device under test.

Abstract: A diagonal dual-polarized broadband horn antenna. The unique use of diagonal line ridges placed in the corners of the aperture of the diagonal dual-polarized broadband horn antenna. The sides of the diagonal dual-polarized broadband horn antenna are made of any number of materials including dielectric material or metallic material. The operating frequency range of one embodiment of the present invention is approximately 100 MHz to 18 GHz in one embodiment. The present invention is scaleable to allow operation at even higher and lower frequencies. This ability of the present invention to adapt to a number of frequency ranges allows application for a wide variety of electromagnetic testing applications. The use of the diagonal line ridges allows for a broadband horn antenna that is significantly more manageable that conventional broadband horn antennas, while offering operation at common frequency ranges.

Abstract: A diagonal dual-polarized broadband horn antenna. The unique use of diagonal line ridges placed in the corners of the aperture of the diagonal dual-polarized broadband horn antenna. The sides of the diagonal dual-polarized broadband horn antenna are made of any number of materials including dielectric material or metallic material. The operating frequency range of one embodiment of the present invention is approximately 100 MHz to 18 GHz in one embodiment. The present invention is scaleable to allow operation at even higher and lower frequencies. This ability of the present invention to adapt to a number of frequency ranges allows application for a wide variety of electromagnetic testing applications. The use of the diagonal line ridges allows for a broadband horn antenna that is significantly more manageable that conventional broadband horn antennas, while offering operation at common frequency ranges.