Abstract: A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs an output voltage determined in accordance with the test signal, to an input/output pin connected to a signal input/output terminal of the device under test, a replica driving section that outputs a comparison voltage determined in accordance with the test signal, a resistance voltage dividing section that generates a divided voltage by resistance-dividing the comparison voltage, a comparing section that compares a voltage of the input/output pin with the divided voltage, a judging section that judges acceptability of the device under test based on a result of the comparison by the comparing section, and an adjusting section that adjusts a voltage dividing ratio of the resistance voltage dividing section so that the divided voltage becomes equal to a voltage obtained by adding together a predetermined threshold volt

Abstract: A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs an output voltage determined in accordance with the test signal, to an input/output pin connected to a signal input/output terminal of the device under test, a replica driving section that outputs a comparison voltage determined in accordance with the test signal, a resistance voltage dividing section that generates a divided voltage by resistance-dividing the comparison voltage, a comparing section that compares a voltage of the input/output pin with the divided voltage, a judging section that judges acceptability of the device under test based on a result of the comparison by the comparing section, and an adjusting section that adjusts a voltage dividing ratio of the resistance voltage dividing section so that the divided voltage becomes equal to a voltage obtained by adding together a predetermined threshold volt

Abstract: There is provided an amplitude varying driver circuit operable to output an output signal, which is an amplified input signal being supplied. The amplitude varying driver circuit includes: a plurality of differential amplifiers provided in parallel with one another, wherein a signal corresponding to the input signal is input into each base terminal thereof; a resistor section, which is provided in series with the plurality of differential amplifiers, operable to establish potential of the output signal according to total current flowing to the plurality of differential amplifiers; and an amplitude control transistor, which is provided in series with the plurality of differential amplifiers, operable to define total current flowing to the plurality of differential amplifiers.

Abstract: There is provided an amplitude varying driver circuit operable to output an output signal, which is an amplified input signal being supplied. The amplitude varying driver circuit includes: a plurality of differential amplifiers provided in parallel with one another, wherein a signal corresponding to the input signal is input into each base terminal thereof; a resistor section, which is provided in series with the plurality of differential amplifiers, operable to establish potential of the output signal according to total current flowing to the plurality of differential amplifiers; and an amplitude control transistor, which is provided in series with the plurality of differential amplifiers, operable to define total current flowing to the plurality of differential amplifiers.