Patents by Inventor Keiichi Hamano

Keiichi Hamano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6856915
    Abstract: A method for identifying a microorganism, wherein the method comprises the steps of: 1) preparing one or more kind(s) of double-stranded DNA fragments by the random PCR using at least a part of a genome of an organism of interest, 2) applying the double-stranded DNA fragments which were prepared in step 1 to temperature gradient gel electrophoresis (TGGE) or denaturant gradient gel electrophoresis (DGGE), 3) extracting identification dots of each DNA fragment from the electrophoresis pattern which was obtained in step 2, 4) determining PaSS and/or genome semi-distance from the identification dots which were obtained in step 3, and 5) analyzing the PaSS and/or genome semi-distance which were/was obtained in step 4, wherein pseudo-absolute position of identification dots is determined by the locational relation to standard DNA in the presence of standard DNA as the starting dots in TGGE or DGGE.
    Type: Grant
    Filed: April 25, 2001
    Date of Patent: February 15, 2005
    Assignee: Taitec Corporation
    Inventors: Koichi Nishigaki, Tsutomu Takasawa, Keiichi Hamano
  • Publication number: 20020192648
    Abstract: A method for identifying a microorganism, wherein the method comprises the steps of: 1) preparing one or more kind(s) of double-stranded DNA fragments by the random PCR using at least a part of a genome of an organism of interest, 2) applying the double-stranded DNA fragments which were prepared in step 1 to temperature gradient gel electrophoresis (TGGE) or denaturant gradient gel electrophoresis (DGGE), 3) extracting identification dots of each DNA fragment from the electrophoresis pattern which was obtained in step 2, 4) determining PaSS and/or genome semi-distance from the identification dots which were obtained in step 3, and 5) analyzing the PaSS and/or genome semi-distance which were/was obtained in step 4, wherein pseudo-absolute position of identification dots is determined by the locational relation to standard DNA in the presence of standard DNA as the starting dots in TGGE or DGGE.
    Type: Application
    Filed: April 25, 2001
    Publication date: December 19, 2002
    Inventors: Koichi Nishigaki, Tsutomu Takasawa, Keiichi Hamano